This preview shows pages 1–2. Sign up to view the full content.
Minimizing Leakage Power in DualThreshold CMOS Circuits
Using Integer Linear Programming
Yuanlin Lu and Vishwani D. Agrawal
Auburn University, Department of ECE, Auburn, AL 36849
luyuanl@auburn.edu
,
vagrawal@eng.auburn.edu
ABSTRACT
This paper presents a novel technique, which uses integer
linear programming (ILP) to significantly reduce the
leakage power without sacrificing circuit performance.
For each gate in the design library low and high threshold
versions are characterized for leakage in various input
states using Spice simulation. An ILP model first finds the
shortest critical path delay corresponding to all low
threshold gates. A second ILP model then minimizes the
total leakage power by optimally placing highthreshold
devices for a userspecified critical path delay. The
constraint set sizes for both ILP models are linear in the
circuit size. Experimental results show a 96% reduction of
leakage power with no delay increase for the benchmark
circuit C7522 implemented in the 70nm BPTM CMOS
technology. Some other ISCAS’85 benchmarks had lower
power savings, but when a 25% increase in the critical
path delay was allowed all had at least 90% leakage
reduction. Using an example, we outline a possible
extension of the dualthreshold method to simultaneously
minimize the leakage power and the dynamic glitch
power, which is under investigation.
1. INTRODUCTION
In the past, the dynamic power has dominated total
power dissipation of a CMOS device. Since dynamic
power is proportional to the square of the power supply
voltage, lowering the voltage reduces the power
dissipation. However, to maintain or increase the
performance of a circuit, its threshold voltage should be
decreased by the same factor, which increases the
subthreshold (leakage) current of transistors exponentially
[1]. Therefore, with the trend of CMOS technology
scaling, leakage power is becoming a dominant
contributor to the total power consumption. To reduce
leakage power, a large number of techniques have been
proposed, including transistor sizing [34], multi
V
th
[13
15], dual
V
th
[36,12],
optimal standby input vector
selection [89], stacking transistors [11], etc.
Dual
V
th
assignment is an efficient technique to decrease
leakage power. To maintain the circuit performance,
transistors in the gates on the critical path and a very small
number of gates on noncritical paths should have low
V
th
assignment, while all the other gates can be reassigned
high
V
th
. This leads to significant leakage reduction. Wei
et al
. [5] describe an algorithm to find an optimal
assignment of
V
th
that makes the number of
high
V
th
gates
as large as possible. However, in reality, the two threshold
voltages in a process are predetermined and the designer
does not have the choice of arbitrary
V
th
. Therefore, the
algorithm is impractical.
References [36, 12] propose various algorithms for
This preview has intentionally blurred sections. Sign up to view the full version.
View Full Document
This is the end of the preview. Sign up
to
access the rest of the document.
 Spring '08
 Staff
 Frequency

Click to edit the document details