sunwoo-msbist_rev

sunwoo-msbist_rev - High Fault Coverage Built-In Self-Test...

Info iconThis preview shows pages 1–2. Sign up to view the full content.

View Full Document Right Arrow Icon
High Fault Coverage Built-In Self-Test for 3 rd Generation Mobile Phone User John Sunwoo and Vishwani D. Agrawal Dept. of Electrical and Computer Engineering Auburn University, Alabama [email protected], [email protected] ABSTRACT – On-chip Built-In Self-Test (BIST) based implementation on RF devices especially on cellular mobile phone has been proposed. In this ap- proach, high-level functional test can be done with one complete test path. Central baseband processor roles as Test Pattern Generator (TPG) as well as Out- put Response Analyzer so that it can generate test patterns through the complete path over the trans- ceiver components and read the output back. In order to compensate the fact that a component level diag- nosis is impossible with functional test if there are multiple components cascaded, we adopted the solu- tion from one of the recent study which utilized em- bedded sensors to observe the each component be- havior. Finally combining it with the functional test through the transceiver path brings a high fault cov- erage rate as well as an efficient test strategy for the mobile phone user. 1 1. INTRODUCTION Extensive data usage in 3 rd -Generation (3G) technology leads us to the situations that mobile phone can be a critical device. Most users will demand a reliable phone which has no faulty because of the activity they would do with the mobile device. For example, in the near future, having a multimedia mobile phone will let us download and listen to mp3 music files. Due to the characteristic of the mp3 file, if there were errors in the downloaded mp3 file the music would not play properly or sometimes it would not even be opened. The mobile phone manufacturer as well as the consumer needs to be ensured that every transmittion of multimedia data is reliable. Most of the testing and verification process is being done in the manufacturing process or before it comes out to the market. However, due to frequent use of the mobile device there should be a test function built in to the mobile phone itself so that the users can easily test the mobile phone device to make sure the device is always capable of extensive data service without having any errors or performance weakness. 1 This work was advised by Dr. Vishwani Agrawal through the class project of ELEC6970 in Auburn University, AL. Experimental supplies such as RF-evaluation boards and its accessories were provided by Dr. Richard Jaeger from Auburn University, AL The standard test requirements for present mixed- signal chips are complex and it needs of measurements considering specific specifications[2], however, the objective to this project is to invent and develop a easy test method and add-in the functionality which could be built into the mobile device so that user can easily test their phone themselves. Built-In Self-Test (BIST) approach has been choice because of the characteristic that it does not need external hardware to test the device. Thus user can always make sure the phone works as it
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Image of page 2
This is the end of the preview. Sign up to access the rest of the document.

This note was uploaded on 09/17/2011 for the course ELEC 6970 taught by Professor Staff during the Spring '08 term at Auburn University.

Page1 / 6

sunwoo-msbist_rev - High Fault Coverage Built-In Self-Test...

This preview shows document pages 1 - 2. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online