VLSI_Class_Notes_14_2010

VLSI_Class_Notes_14_2010 - EEE 5322 W.R Eisenstadt-1 VLSI...

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EEE 5322 W.R. Eisenstadt - 1 - VLSI Class Notes Fall 2010, Class 14 Reading Today: Jaeger Chapter 8.7, Rabaey, 1.3.1 Homework #12, Problems due Monday October 5, 2009, 8.4, 8.5 (use Fig 8.16 not 8.11), and 8.6, Lecture discussion : Yield Yield is one of the most critical aspects of semiconductor processing. It determines whether or not the investment in the IC manufacturing is viable. IC fabrication companies who cannot achieve competitive yield go out of business. Before any design project proceeds into IC production a complete business case includes a yield calculation/estimation. Yield is defined as the number of working circuits divided and by the number of possible manufacturable circuits. Why do integrated circuits fail? 1 ) Random defects : Particles introduced during processing and handling. People are an incredible source of dust, dirt, skin flakes, hair, etc. Processing system introduce particles, can scratch wafers Implantations, etches, etc can introduce contamination
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VLSI_Class_Notes_14_2010 - EEE 5322 W.R Eisenstadt-1 VLSI...

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