ECE-567-07

ECE-567-07 - state diagram first (refer to Week 6 slides)...

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SU 2005 ECE 567 Microprocessor Labs 2 5- State Diagram (Corrected) State Diagram (Corrected) SCAN A / $FF DISP TEMP /TEMP for 5-10 seconds continuous update SCAN 1 or 2 / $0A SCAN P / 02 SCAN R / 0P DISP PATTERN /PATT (display once) A 1 2 p r
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SU 2005 ECE 567 Microprocessor Labs 3 5- Lab 4.2 Additional Suggestions Lab 4.2 Additional Suggestions Again, try the $0F, $F0 output test of the
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Unformatted text preview: state diagram first (refer to Week 6 slides) To test switch debouncing, write a short program that increments an outputed count each time a key is pressed. If it counts more or less than once per key press adjust debounce delay/code SU 2005 ECE 567 Microprocessor Labs 4 5-Thank You !...
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ECE-567-07 - state diagram first (refer to Week 6 slides)...

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