ECE216-Lecture-01-Introduction

19 15 semiconductor device reliability 1 introduction

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Unformatted text preview: Characterization 15. Chemical Characterization ECE 216 Chapter 1 – Introduction to Semiconductor Devices Lecture 01.19 15. SEMICONDUCTOR DEVICE RELIABILITY 1. Introduction (Wear -out, Degradation, and Breakdown Mechanisms) 2. Channel Hot Electrons (CHE) 3. Drain -Avalanche Hot Carriers (DAHC) 4. Fowler -Nordheim Tunneling (FNT) and Direct Tunneling (DT) 5. Band -to -Band Tunneling (BBT) 6. Characterization of Hot -Electron Degradation 7. Determination of MOSFET Lifetime 8. Substrate Current due to Hot Carriers 9. Gate Current due to Hot Carriers 10. Gate Current due to Carrier Tunneling 11. Physical and Chemical Models of Degradation 12. HED -Resistant MOSFET Device Design 13. Screening Tests for Breakdown (TZDB, TDDB) ECE 216 Chapter 1 – Introduction to Semiconductor Devices Lecture 01.20 16. NOISE IN SEMICONDUCTOR DEVICES 1. Introduction 2. Thermal Noise 3. Shot Noise 4. Burst Noise in BJTs 5. Flicker or 1/f Noise 6. Random -Telegraph Signal Noise 7. Interface Noise Processes 8. Noise in CMOS Circuits 9. Noise in NMOS Circuits with Depletion Loads 10. Noise in NMOS Circuits with Enhancement Loads 11. Noise in ECL Circuits 11. Crosstalk Noise 12. Alpha -Particle and Cosmic -Ray -Induced Soft Errors in VLSI Circuits ECE 216 Chapter 1 – Introduction to Semiconductor Devices Lecture 01.21 17. FUNDAMENTAL LIMITS / FUTURE TRENDS 1. Introduction 2. International Technology Roadmap for Semiconductors 3. Thermodynamic Limits 4. Materials Limits 5. Device Limits 6. Circuit and System Limits 7. Future Trends in Semiconductor Devices ECE 216 Chapter 1 – Introduction to Semiconductor Devices Lecture 01.22 18. SEMICONDUCTOR DEVICE SPICE MODELS 1. Introduction 2. Schottky -Barrier SPICE Model 3. PN Junction SPICE Model 4. Bipolar Junction Transistor SPICE Model 5. MOSFET SPICE Models (Level 1, Level 2, Level 3, BSIM, HSPICE Level 28, BSIM2, BSIM3, MOS Model 9, BSIM4) 6. SOI -MOSFET SPICE Model ECE 216 Chapter 1 – Introduction to Semiconductor Devices Lecture 01.23 19. SUBMICRO...
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This note was uploaded on 10/06/2011 for the course ECE 216 taught by Professor Hishamz.massoud during the Fall '09 term at Duke.

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