syllabus - ECE 631: Digital System Testing and Testable...

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ECE 631: Digital System Testing and Testable Design Spring 2009 Instructor: Dr. Jennifer A. Smith E-mail: [email protected] Office hours: Mondays, Wednesdays, and Fridays 1:30 - 2:30 Office location: MEC 202L Class meeting time: Mondays and Wednesdays 5:00 - 6:15 Class location: MEC 206 Class web site: https://sites.google.com/a/boisestate.edu/jennifersmith/Home/teaching/ece631 Textbook: Niraj Jha and Sandeep Gupta, Testing of Digital Systems , Cambridge University Press, 2003, ISBN 0-521-77356-3. Useful Journals and Conference Proceedings: IEEE Design and Test of Computers IEEE Transactions on Computers Proceedings of the International Test Conference Proceedings of the ACM/IEEE Design Automation Conference IEEE Transactions on Computer Aided Design Grading: Three Exams 20% each Four Homeworks 20% total Three Projects 20% total HW #1 Fault simulation (Chapter 3) HW #2 Combinational test generation (Chapter 4) HW #3 Sequential test generation (Chapter 5) HW #4 Review of paper from test literature
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This document was uploaded on 11/01/2011 for the course ECE 631 at Boise State.

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syllabus - ECE 631: Digital System Testing and Testable...

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