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rd_context - Context of Robust Design Don Clausing Fig. 1...

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Context of Robust Design Don Clausing Fig. 1 © Don Clausing 1998
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Case study An automatic document handler (ADH) was developed at the SS level. When integrated into the total system there were many new problems. The TQM Problem Solving Process was used, and many problems were solved. However, at the Field Readiness Test (FRT) before entering production the reliability was 15X worse than acceptable. Fig. 2 © Don Clausing 1998
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Case study questions What should they do next? What should be done in the future to avoid the same dysfunctional path? What is the fundamental problem? Fig. 3 © Don Clausing 1998
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Bomb alert! Technology Stream Concept Design Ready Produce FRT Too much dependence on reactive improvement Fig. 4 © Don Clausing 1998
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Improvement to avoid bombs RC I RC I RC I RC I IMPROVE MENT TECHNOLOGY TS SS PP I – PROACTIVE IMPROVEMENT REACTIVE IMPROVEMENT R: requirements C: concept TS: total system SS: subsystem PP: piece parts Fig. 5 © Don Clausing 1998
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Proactive improvement Yea, we think that proactive is good! Fig. 6 © Don Clausing 1998
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What is wrong here? Technology Stream Concept Design Ready Produce FRT Fig. 7 © Don Clausing 1998
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Rework – how much is enough? Design Complete Ready for Production Produce Build/Test/Fix Build/Test/Fix Build/Test/Fix Build/Test/Fix Fig. 8 © Don Clausing 1998
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Build/test/fix – why? Reactive problem solving Too little – limited scope of solutions Too late Design contains many unsolved problems Biggest problem is lack of robustness System works well in favorable conditions But is sensitive to noises – unfavorable conditions that inevitably occur Fig. 9 © Don Clausing 1998
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Proactive problem solving Must shift from emphasis on build/test/fix Must address effects of noises Erratic performance Leads to delusionary problem solving; chases problem from one failure mode to another Fig. 10 © Don Clausing 1998
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Noises Affect performance – adversely IPDT cannot control – examples: Ambient temperature Power-company voltage Customer-supplied consumables Noises lead to erratic performance IPDT: Integrated product development team Fig. 11 © Don Clausing 1998
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Failure modes Noises lead to failure modes (FM) One set of noise values leads to FM 1 Opposite set of noise values leads to FM 2 Simple problem solving chases the problem from FM 1 to FM 2 and back again, but does not avoid both FMs with the same set of design values – endless cycles of build/test/fix (B/T/F) Fig. 12 © Don Clausing 1998
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Performance; favorable conditions Variation during Lab conditions No No Fig. 13 FM 1 problem problem FM 2 © Don Clausing 1998
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Simple problem solving Variation during Lab conditions Initial problem No Fig. 14 FM 1 problem FM 2 © Don Clausing 1998
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Simple problem solving Variation during Lab conditions No Fig. 15 FM 1 problem FM 2 © Don Clausing 1998
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