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Chapt 2 Analysis

# Chapt 2 Analysis - EMA4120 Physical Metallurgy I Chapt 2...

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering EMA4120 Physical Metallurgy I Chapter 2: Analysis of Metals Paul Holloway 202 Rhines Hall 846-3330 [email protected]

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Analysis of Metals Crystal structure X-ray diffraction Electron diffraction Microstructure Optical microscopy Scanning electron microscopy Scanning probe microscopies Composition X-ray spectroscopy Electron spectroscopy Mass spectrometry Emission/absorption spectroscopy
EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Bragg Law n λ = 2d hkl sin θ where n = order of diffraction

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Bragg’s Law Cubic crystal: d hkl = a/(h 2 + k 2 + l 2 ) 1/2 Iron-bcc, a = 0.28663 nm = d 100 d 110 = 0.28663/[2] 1/2 = 0.2027 nm sin θ = n λ /2(0.2027) n = 1, λ = 0.1541 (Cu K α 1 ) sin θ = 0.3801 2200 θ = 22.34 o n = 1, λ = 0.0209 (W K α 1 ) 2200 θ = 2.955 o n = 5, θ = 14.94 o for λ = 0.0209 (W K α 1 ) 2200 θ is f( λ , n, d hkl )
EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Order of Diffraction d 110 = 0.1181 nm W K α 1 ; λ = 0.02090 nm

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Characteristic X-rays Electron bombard metal target knocks electron out of K level Electron relax out of L 2,3 and emit K α 1,2 , out of M levels emit K β Electrons forbidden to emit X-rays by relax from L 1 to K
EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Characteristic X-rays from Molybdenum (Z = 42) 1s 2 , 2s 2 , 2p 6 , 3s 2 , 3p 6 , 4s 2 , 3d 10 , 4p 6 , 5s 2 , 4d 4 K=1, L=2, M=3, N=4 E K = 20 keV Bremsstrahlung Characteristic λ∼ 0.07093 nm (x 10 -2 ) Filter with Z-1

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Debye-Scherrer or Powder Method λ = fixed, characteristic K α sin θ = n λ /2d hkl Polycrystalline-random, texture Diffractometer Rule: fcc—all even or odd: (111), (200), --- bcc—sum is even: (110), (200),--- S=2θR
EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Laue Technique: White X-rays, Single Crystal Strain Mg single crystal along [001] of hcp; 3-fold symmetry Symmetry of [111] fcc same as [0001] hcp

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EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Back Reflection or Transmission Laue Rule: fcc—all even or odd: (111), (200), --- bcc—sum is even: (110), (200),---
EMA4120 Physical Metallurgy I, Chapt 2 Analysis of Metals University of Florida, Dept. of Materials Science and Engineering Transmission Electron Microscopy Electrons and photons have a duality of nature-particles and waves

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Chapt 2 Analysis - EMA4120 Physical Metallurgy I Chapt 2...

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