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Lecture23_MOS_SH_2up - EECS240 Spring 2009 Lecture 23 MOS...

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EECS240 – Spring 2009 Lecture 23: MOS Sample and Hold Elad Alon Dept. of EECS EECS240 Lecture 23 2 MOS Sample & Hold Ideal Sampling Practical Sampling v IN v OUT C S1 φ 1 v IN v OUT C M1 φ 1 Grab exact value of V in when switch opens kT/C noise Limited bandwidth R sw = f(V in ) Æ distortion Switch charge injection Clock jitter
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