Statistics Homework Solutions 218

Statistics Homework Solutions 218 - 218 Interactions ¡...

Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
This is the end of the preview. Sign up to access the rest of the document.

Unformatted text preview: 218 Interactions ¡ Full 0 51633 0 51633 P 0.000 0.000 0.090 57 773, P 0. ¨ ¡ ¡ ¨ ¨ ¡ ¡ ¡ (d) Yes, the attachment method does affect the critical buckling load: F1 54 0 090). 0 10 (P ¨ P ¡ ¡ ¨ ¨ 2 5223, 0 05 ¨ ¨ (c) The additive model is barely plausible: F2 54 F 57.773 759.94 2.5223 ¨ MS 114.79 1509.9 5.0115 1.9869 ¡ ¡ SS 114.79 3019.8 10.023 107.29 3251.9 ¨ ¡ ¨ DF 1 2 2 54 59 ¨ (b) Source Attachment Length Interaction Error Total Length Half 0 33167 0 33167 ¨ ¨ Nail Adhesive Quarter 0 48317 0 48317 ¨ Main Effects of Length Quarter 7 1165 Half 2 5665 Full 9 683 ¡ Main Effects of Attachment Nail 1 3832 Adhesive 1 3832 ¨ 15. (a) CHAPTER 9 ¡ (e) Yes, the side member length does affect the critical buckling load: F2 54 759 94, P 0. To determine which effects differ at the 5% level, we should use q3 54 05. This value is not found in Table A.8, so we approximate it with q3 40 05 3 44. We compute 3 44 1 9869 20 1 08. We conclude that the effects of quarter, half and full all differ from each other. ¡ ¡ ¡ ¡ ¨ ¨ F 8.2424 108.31 5.2567 P P 0.003 0.000 0.006 0 001 (P ¨ 13 53, 0 01 P 0.000 0.002 0.855 ¡ ¨ ¡ ¨ ¨ ¡ ¡ ¡ ¡ MS 62.704 823.94 39.990 7.6075 F 11340.1 13.53 0.32 0 002). ¨ ¡ SS 125.41 1647.9 159.96 136.94 2070.2 ¡ DF 2 2 4 18 26 £ MS 57330.7 68.389 1.6389 5.0556 (b) There are differences among the operators. F2 9 19. (a) Source PVAL DCM Interaction Error Total ¡ SS 114661.4 136.78 6.5556 45.500 114850.3 ¨ DF 2 2 4 9 17 ¨ 17. (a) Source Wafer Operator Interaction Error Total ...
View Full Document

This note was uploaded on 12/20/2011 for the course STA 3163 taught by Professor Mattgilg during the Fall '11 term at UNF.

Ask a homework question - tutors are online