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Statistics Homework Solutions 218

# Statistics Homework Solutions 218 - 218 Interactions Â Full...

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Unformatted text preview: 218 Interactions Â¡ Full 0 51633 0 51633 P 0.000 0.000 0.090 57 773, P 0. Â¨ Â¡ Â¡ Â¨ Â¨ Â¡ Â¡ Â¡ (d) Yes, the attachment method does affect the critical buckling load: F1 54 0 090). 0 10 (P Â¨ P Â¡ Â¡ Â¨ Â¨ 2 5223, 0 05 Â¨ Â¨ (c) The additive model is barely plausible: F2 54 F 57.773 759.94 2.5223 Â¨ MS 114.79 1509.9 5.0115 1.9869 Â¡ Â¡ SS 114.79 3019.8 10.023 107.29 3251.9 Â¨ Â¡ Â¨ DF 1 2 2 54 59 Â¨ (b) Source Attachment Length Interaction Error Total Length Half 0 33167 0 33167 Â¨ Â¨ Nail Adhesive Quarter 0 48317 0 48317 Â¨ Main Effects of Length Quarter 7 1165 Half 2 5665 Full 9 683 Â¡ Main Effects of Attachment Nail 1 3832 Adhesive 1 3832 Â¨ 15. (a) CHAPTER 9 Â¡ (e) Yes, the side member length does affect the critical buckling load: F2 54 759 94, P 0. To determine which effects differ at the 5% level, we should use q3 54 05. This value is not found in Table A.8, so we approximate it with q3 40 05 3 44. We compute 3 44 1 9869 20 1 08. We conclude that the effects of quarter, half and full all differ from each other. Â¡ Â¡ Â¡ Â¡ Â¨ Â¨ F 8.2424 108.31 5.2567 P P 0.003 0.000 0.006 0 001 (P Â¨ 13 53, 0 01 P 0.000 0.002 0.855 Â¡ Â¨ Â¡ Â¨ Â¨ Â¡ Â¡ Â¡ Â¡ MS 62.704 823.94 39.990 7.6075 F 11340.1 13.53 0.32 0 002). Â¨ Â¡ SS 125.41 1647.9 159.96 136.94 2070.2 Â¡ DF 2 2 4 18 26 Â£ MS 57330.7 68.389 1.6389 5.0556 (b) There are differences among the operators. F2 9 19. (a) Source PVAL DCM Interaction Error Total Â¡ SS 114661.4 136.78 6.5556 45.500 114850.3 Â¨ DF 2 2 4 9 17 Â¨ 17. (a) Source Wafer Operator Interaction Error Total ...
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