EXPERIMENT 4 - Vefa Kksal zmen 1394378 CRYSTALLOGRAPHY AND X-RAY DIFFRACTION OBJECTIVE Is to determine the sample from the X-Ray Diffraction test

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1394378 CRYSTALLOGRAPHY AND X-RAY DIFFRACTION OBJECTIVE Is to determine the sample from the X-Ray Diffraction test by determining the interatomic spacings and crystal structure. 2 ϑ vs. Intensity graph Calculator Unknown Sample X-Ray Diffractometer SUMMARY In order to determine the atomic structure and properties of an unknown sample X-Ray Diffraction method is used. In this method X-Ray waves are sent to the sample at different angles and reflection angles are recorded. Diffraction occurs when a wave encounters a series of regularly spaced obstacles that are capable of scattering the wave and have spacing that are comparable in magnitude to the wavelengths. Then we record the data on graph paper. These angle vs. intensity graph enables us to calculate the atomic orientation. From the graph we look at the peak angles that are given by 2 ϑ . After determining the peak angles we calculate sin 2 ϑ . Then we use sin 2 ϑ / (h
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This note was uploaded on 12/27/2011 for the course MATH 286 taught by Professor Adad during the Spring '11 term at Middle East Technical University.

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EXPERIMENT 4 - Vefa Kksal zmen 1394378 CRYSTALLOGRAPHY AND X-RAY DIFFRACTION OBJECTIVE Is to determine the sample from the X-Ray Diffraction test

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