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Unformatted text preview: ray photoelectron spectroscopy, and etc. Prerequisites: Graduate students in Engineering College of Chang Gung University. Credit hour 3(3,0) Text and references Textbook: none. Reference books (subject to change) (1) Fundamentals of Nanoscale Film Analysis, by Terry L. Alford, Leonard C. Feldman, James W. Mayer, Springer, (2007). (2) Material Science with Ion Beam, By Harry Bernas, Springer (2009). (3) Fundamental of surface and thin field analysis, by L. C. Feldman and J. W. Mayer. Elsevier (1986). (4) Backscattering Spectroscopy, By W. K. Chu, J W mayer, and M. A. Nicolet, Academic Press (1978). Course outlines: TBA Grading Homework Assignment 25% Mid term 25% Final 35% In class Quiz 15% Important dates: Mid term Nov. 10, 2011 Final January 12, 2012 Disclaimer: Instructor reserves the right to modify the syllabus to meet the objectives of the course....
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This note was uploaded on 12/30/2011 for the course OEM 154 taught by Professor Chow during the Fall '11 term at University of Central Florida.
- Fall '11