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Unformatted text preview: VLSI Devices: MOS Transistors, Caps, Diodes, etc. Device Variability: (sea of devices and moment reduction) High Voltage: ESD, Driver, Guard Rings, Noise Mitigation, Rad Hardness Analysis Transient (Spice, couping, noise modeling, jitter) Logical (Verilog, Static Timing, Power Analysis) Transaction Level (C, system-C, Bluespec) Data-Path and Memory Circuits Static/Dynamic Memories Ancillary Memory Analog Circuits Analog Layout Noise Issues: Substrate, Coupling, Power Variability and Matching Analog Device Layout...
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This note was uploaded on 12/29/2011 for the course ECE 224a taught by Professor Brewer,f during the Fall '08 term at UCSB.
- Fall '08