f33-book-depend-pres-pt3

f33-book-depend-pres-pt3 - Oct. 2009 Part III Faults:...

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Oct. 2009 Part III – Faults: Logical Deviations Slide 1
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Oct. 2009 Part III – Faults: Logical Deviations Slide 2 About This Presentation This presentation is intended to support the use of the textbook Dependable Computing: A Multilevel Approach (traditional print or on-line open publication, TBD). It is updated regularly by the author as part of his teaching of the graduate course ECE 257A, Fault-Tolerant Computing, at Univ. of California, Santa Barbara. Instructors can use these slides freely in classroom teaching or for other educational purposes. Unauthorized uses, including distribution for profit, are strictly prohibited. © Behrooz Parhami Edition Released Revised Revised Revised Revised First Sep. 2006 Oct. 2007 Oct. 2009
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Oct. 2009 Part III – Faults: Logical Deviations Slide 3 9 Fault Testing
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Oct. 2009 Part III – Faults: Logical Deviations Slide 4 The good news is that the tests don’t show any other problems
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Oct. 2009 Part III – Faults: Logical Deviations Slide 5
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Oct. 2009 Part III – Faults: Logical Deviations Slide 6 9.1 Overview and Fault Models The faulty state and transitions into and out of it Defect-induced fault Burn-in testing Fault testing Fault removal Fault masking
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Oct. 2009 Part III – Faults: Logical Deviations Slide 7 A Taxonomy of Fault Testing TEST GENERATION (Preset/Adaptive) TEST VALIDATION TEST APPLICATION FUNCTIONAL (Exhaustive/ Heuristic) STRUCTURAL (Analytic/ Heuristic) THEORETICAL EXPERIMENTAL EXTERNALLY CONTROLLED INTERNALLY CONTROLLED FAULT MODEL switch- or gate- level (single/ multiple stuck-at, bridging, etc.) FAULT COVER- AGE DIAG- NOSIS EXTENT none (check- out, go/ no-go) to full resolu- tion ALGO- RITHM D-algo- rithm, boolean differ- ence, etc. SIMULA- TION software (parallel, deductive, concur- rent) or hardware (simulation engine) FAULT INJEC- TION MANUAL AUTO- MATIC (ATE) TEST MODE (BIST) CONCUR- RENT on-line testing (self- checked design) FAULT TESTING (Engineering, Manufacturing, Maint enance) off-line testing FAULT TESTING (Engineering, Manufacturing, Maintenance) Correct design? Correct implementation? Correct Operation?
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Oct. 2009 Part III – Faults: Logical Deviations Slide 8 Requirements and Setup for Testing Reference value Test pattern source Circuit under test (CUT) Comparator Pass/Fail Testability requires controllability and observability (redundancy may reduce testability if we are not careful; e.g., TMR) Reference value can come from a “gold” version or from a table Test patterns may be randomly generated, come from a preset list, or be selected according to previous test outcomes Test results may be compressed into a “signature” before comparing Test application may be off-line or on-line (concurrent) Easier to test if direct access to some inner points is possible
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Oct. 2009 Part III – Faults: Logical Deviations Slide 9 Importance and Limitations of Testing “Trying to improve software quality by increasing the amount of testing is like trying to lose weight by weighing yourself more often.” Steve C. McConnell “Program testing can be used to show the presence of bugs, but never to show their absence!” Edsger W. Dijkstra
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f33-book-depend-pres-pt3 - Oct. 2009 Part III Faults:...

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