f33-book-depend-pres-pt3

f33-book-depend-pres-pt3 - Oct. 2009 Part III Faults:...

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Unformatted text preview: Oct. 2009 Part III Faults: Logical DeviationsSlide 1 Oct. 2009 Part III Faults: Logical DeviationsSlide 2 About This Presentation This presentation is intended to support the use of the textbook Dependable Computing: A Multilevel Approach (traditional print or on-line open publication, TBD). It is updated regularly by the author as part of his teaching of the graduate course ECE 257A, Fault-Tolerant Computing, at Univ. of California, Santa Barbara. Instructors can use these slides freely in classroom teaching or for other educational purposes. Unauthorized uses, including distribution for profit, are strictly prohibited. Behrooz Parhami Edition Released Revised Revised Revised Revised First Sep. 2006 Oct. 2007 Oct. 2009 Oct. 2009 Part III Faults: Logical DeviationsSlide 3 9 Fault Testing Oct. 2009 Part III Faults: Logical DeviationsSlide 4 The good news is that the tests dont show any other problems Oct. 2009 Part III Faults: Logical DeviationsSlide 5 Oct. 2009 Part III Faults: Logical DeviationsSlide 6 9.1 Overview and Fault Models The faulty state and transitions into and out of it Defect-induced fault Burn-in testing Fault testing Fault removal Fault masking Oct. 2009 Part III Faults: Logical DeviationsSlide 7 A Taxonomy of Fault Testing T E S T G E N E R A T IO N (P res et/A daptiv e) T E S T V A LID A T IO N T E S T A P P LIC AT IO N F U N C T IO N A L (E x haus t iv e/ H euris t ic ) S T R U C T U R A L (A naly tic / H euris tic ) T H E O R E T IC A L E X P E R IM E N T A L E X T E R N A LLY C O N T R O LLE D IN T E R N A LLY C O N T R O LLE D F A U LT M O D E L s w itc h- or gate- lev el (s ingle/ m ultiple s tuc k -at, bridging, etc .) F A U LT C O V E R - A G E D IA G - N O S IS E X T E N T none (c hec k - out, go/ no-go) t o full res olu- t ion A LG O - R IT H M D -algo- rithm , boolean differ- enc e, etc . S IM U LA - T IO N s oftw are (parallel, deduc tiv e, c onc ur- rent) or hardw are (s im ulation engine) F A U LT IN J E C - T I O N M AN U A L A U T O - M A T IC (A T E ) T E ST M O D E (B IST ) C O N C U R - R E N T on-line tes ting (s elf- c hec k ed des ign) FA UL T TE S TIN G (E ngineering, M anufac turing, M aint enanc e) off-line tes ting FAULT TESTING (Engineering, Manufacturing, Maintenance) Correct design? Correct implementation? Correct Operation? Oct. 2009 Part III Faults: Logical DeviationsSlide 8 Requirements and Setup for Testing Reference value Test pattern source Circuit under test (CUT) Comparator Pass/Fail Testability requires controllability and observability (redundancy may reduce testability if we are not careful; e.g., TMR) Reference value can come from a gold version or from a table Test patterns may be randomly generated, come from a preset list, or be selected according to previous test outcomes Test results may be compressed into a signature before comparing...
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f33-book-depend-pres-pt3 - Oct. 2009 Part III Faults:...

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