f33-book-depend-pres-pt5

f33-book-depend-pres-pt5 - Robust Parallel Processing...

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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 1 Robust Parallel Processing Resilient Algorithms
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 2 About This Presentation This presentation is intended to support the use of the textbook Dependable Computing: A Multilevel Approach (traditional print or on-line open publication, TBD). It is updated regularly by the author as part of his teaching of the graduate course ECE 257A, Fault-Tolerant Computing, at Univ. of California, Santa Barbara. Instructors can use these slides freely in classroom teaching or for other educational purposes. Unauthorized uses, including distribution for profit, are strictly prohibited. © Behrooz Parhami Edition Released Revised Revised Revised Revised First Sep. 2006 Oct. 2007 Nov. 2009
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 3 17 Malfunction Diagnosis
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 4
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 5 Robust Parallel Processing Resilient Algorithms
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 6 17.1 Self-Diagnosis in Subsystems Layered approach: A small part of a unit is tested, which then forms a trusted core The trusted core is used to test the next layer of subsystems Region of trust is gradually extended, until it covers the entire unit One approach to go/no-go testing based on self-diagnosis Tester supplies a random seed to the built-in test routine The test routine steps through a long computation that exercises nearly all parts of the system, producing a final result The tester compares the final result to the expected result Ideally, if a properly designed self-test routine returns a 32-bit value, the value will match the expected result despite the presence of faults with probability 2 –32 10 –9.6 test coverage = 1 – 10 –9.6 Core Self-diagnosis initiation Unit A Unit B Unit C
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 7 17.2 Malfunction Diagnosis Model Diagnosis of one unit by another The tester sends a self-diagnosis request, expecting a response The unit under test eventually sends some results to the tester The tester interprets the results received and issues a verdict Testing capabilities among units is represented by a directed graph i Tester j Testee Test capability I think j is okay (passed test) 0 i Tester j Testee Test capability I think j is bad (failed test} 1 The verdict of unit i about unit j is denoted by D ij {0, 1} All the diagnosis verdicts constitute the n × n diagnosis matrix D The diagnosis matrix D is usually quite sparse M 0 M 1 M 3 M 2
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Nov. 2009 Part V – Malfunctions: Architectural Anomalies Slide 8 More on Terminology and Assumptions Malfunction diagnosis in our terminology corresponds to “system-level fault diagnosis” in the literature The qualification “system-level” implies that the diagnosable units are subsystems with significant computational capabilities (as opposed to gates or other low-level components)
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This note was uploaded on 12/29/2011 for the course ECE 257a taught by Professor Parhami,b during the Fall '08 term at UCSB.

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f33-book-depend-pres-pt5 - Robust Parallel Processing...

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