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Unformatted text preview: Fourier transform spectroscopy and the study of the optical quantities by far-infrared Reflectivity measurements Pradeep Bajracharya Department of Physics University of Cincinnati Cincinnati, Ohio 45221 30 Nov 2001 Abstract The infrared reflectivity measurement was studied with fourier transform spectroscopy for different frequency range at various temperature and calulated the conductivity with kramers kroning analysis.The results are analysed as changed of metallic phase and in- sulator phase of Si:B. 1 Introduction Fourier transform spectroscopy is well recognized method for analytic spec- troscopic measurement in uv,visible and infrared region .It can scan the entire spectral region between10- 1000 cm- 1 .The FTIR spectrometer Digilab FTS-14 has been the first commercially available fast scanning FTIR instrument operating in the frequency range 15- 10000 cm- 1 .Its application in science and industry are extensive .In an attempt to study the nature of the metal-insulator transition ,we carried out far-infrared reflectivity measurementWe will here study the heavily doped silicon considered as a random system model described by a Fermi liquid Model of non-interacting system .The temperature de- pendent behaviors of this system (Si:B) were studied mainly through the analysis of optical conductivity 1 ( ) in the far-infrared range. BASIC PRINCIPLE AND INSTRUMENTATION FTS obtains spectral information in the entire frequency region by measuring the interfer- ogram collected through the interference of two equally divided beams .The beam of light emitted from the source (so) is directed to the beam splitter (BS) which is designed to allow half of the beam pass through and reflect the other half.The reflected half travels to the fixed mirror (FM) and travels back to the beam splitter (BS) with total path length 2L ,while the trasmitted half travels to the movable mirror (MM) and travels back with total path length2 L + x .Thus when two beams are recombined within the beam splitter, the recombined beam exhibits an interference pattern depending on the path difference x.After the recombined beam is directed to the sample (Sa) ,the reflected or transmitted beam is calculated in the detector (De) as shown in fig(1)....
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This note was uploaded on 01/08/2012 for the course PHYSICS 707 taught by Professor Electrodynamics during the Fall '11 term at LSU.
- Fall '11