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Unformatted text preview: R AMP A225 TEK ULTRA LOW NOISE: <280 electrons RMS Model A225 is a high performance thin film hybrid charge sensitive preamplifier and shaping amplifier developed especially for high resolution systems employing solid state detectors, proportional counters, photomultiplier tubes and other charge producing detectors in the pulse height analysis or A/D mode of operation. While these units were specifically designed for satellite instrumentation, the following unique characteristics make them equally useful for space, laboratory and commercial applications: Features Applications • Operates from -55 to +125 ºC. • Small size (14 pin hybrid DIP) allows mounting close to the detector. • Ultra low power (as low as 10 mW) • Wide range single supply voltage (+4 to +25 VDC) • Pole-zero cancellation (internal) • Two outputs available (timing pulse and shaped unipolar) • High reliability screening • One year warranty • • • • • • • • Aerospace Portable instrumentation Nuclear monitoring Particle, x-ray, and gamma detection Imaging Research experiments Medical and nuclear electronics Electro-optical systems TYPICAL APPLICATION Discriminator and Gating Logic DETECTOR A225 Multichannel Analyzer or ADC Amptek High Reliability Screening • • • • • • • • • • • • Precap Visual: MIL-STD-883, Method 2017, low magnification, high magnification Sealing: Welded, Hermetic Seal Stamping: Date Code and Serial Number Stabilization Bake: MIL-STD-883, Method 1008, Condition C. +150 °C, 24 hours minimum Temperature Cycle: MIL-STD-883, Method 1010, Condition C. Min. T=-65 °C to +150 °C, 10 minutes each extreme, 5 minutes maximum transfer time Centrifuge: MIL-STD-883, Method 2001, condition B. YI axis; 10,000 G’s Electrical Test: As per Specifications Burn-In Test: MIL-STD-883, Method 1015, 160 hours at +125 °C Fine Leak Test: MIL-STD-883, Method 1014, Condition A. Rejection if leak rate in excess of 5x10-7 cc/sec. Gross Leak Test: MIL-STD-883, Method 1014, Condition C. Perflourocarbon Electrical Test: As per Specification External Visua...
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This note was uploaded on 01/15/2012 for the course AAE 490 taught by Professor Andrisani during the Fall '09 term at Purdue.

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