a225 - R AMP A225 TEK ULTRA LOW NOISE <280 electrons RMS...

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ULTRA LOW NOISE: <280 electrons RMS Model A225 is a high performance thin film hybrid charge sensitive preamplifier and shaping amplifier developed especially for high resolution systems employing solid state detectors, proportional counters, photomultiplier tubes and other charge producing detectors in the pulse height analysis or A/D mode of operation. While these units were specifically designed for satellite instrumenta- tion, the following unique characteristics make them equally useful for space, laboratory and commercial applications: Applications Aerospace Portable instrumentation Nuclear monitoring Particle, x-ray, and gamma detection Imaging Research experiments Medical and nuclear electronics Electro-optical systems Features Operates from -55 to +125 ºC. Small size (14 pin hybrid DIP) allows mounting close to the detector. Ultra low power (as low as 10 mW) Wide range single supply voltage (+4 to +25 VDC) Pole-zero cancellation (internal) Two outputs available (timing pulse and shaped unipolar) High reliability screening One year warranty Amptek High Reliability Screening Precap Visual: MIL-STD-883, Method 2017, low magnification, high magnification Sealing: Welded, Hermetic Seal Stamping: Date Code and Serial Number Stabilization Bake: MIL-STD-883, Method 1008, Condition C. +150 °C, 24 hours minimum Temperature Cycle: MIL-STD-883, Method 1010, Condition C. Min. T=-65 °C to +150 °C, 10 minutes each extreme, 5 minutes maximum transfer time Centrifuge: MIL-STD-883, Method 2001, condition B. YI axis; 10,000 G’s Electrical Test: As per Specifications Burn-In Test: MIL-STD-883, Method 1015, 160 hours at +125 °C Fine Leak Test: MIL-STD-883, Method 1014, Condition A. Rejection if leak rate in excess of 5x10 -7 cc/sec. Gross Leak Test: MIL-STD-883, Method 1014, Condition C. Perflourocarbon Electrical Test: As per Specification External Visual: MIL-STD-883, Method 2009 TYPICAL APPLICATION AMPTEK INC. 6 De Angelo Drive, Bedford, MA 01730-2204 U.S.A. Tel: +1 (781) 275-2242 Fax: +1 (781) 275-3470 e-mail: [email protected] www.amptek.com DETECTOR A225 Discriminator and Gating Logic Multichannel Analyzer or ADC A225 AMP TEK R
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(Vs = +5 V, T = 25 ºC, R LOAD = 10 K) Input Characteristics Sensitivity: 240 mV/Mev (Si) 300 mV/Mev (Ge) 195 mV/Mev (CdTe) 206 mV/Mev (HgI2) 5.2 V/pC 0.83 μV/electron Noise: 2.5 keV FWHM (Si) 2.0 keV FWHM (Ge) 3.1 keV FWHM (CdTe) 2.9 keV FWHM (HgI2) 4.5 x 10 -17 C rms 280 electrons rms Noise Slope: 50 eV/pF (Si) 40 eV/pF (Ge) 62 eV/pF (CdTe) 58 eV/pF (HgI2) 9 x 10 -19 C/pF 5.6 electrons/pF Dynamic Input Capacitance: > 7,000 pF Polarity: Negative Detector Capacitance: Up to 1,000 pF Output Characteristics 1) Shaping Amplifier (Pin 8) Polarity: Positive Peaking Time: 2.4 μs Integral Nonlinearity: < 0.04% for 0 to 10V output pulse Pole-Zero Compensation: Internal Dynamic Range: (Vs - 1.25) Volt DC Level: 0.8 V nominal 2) Timing Pulse (Pin 12) Polarity: Positive Sensitivity: 44 mV/Mev (Si) 55 mV/Mev (Ge) 1.0 V/pC Risetime: 18 ns (unloaded) General Weight: .14 oz, 4 g Operating Voltage: Vs = +4 to +25 VDC Operating Current: 2.3 mA independent of Vs
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