scm hw #3

scm hw #3 - C 601 0.47 0.47 G 212 0.64 0.17 D 146 0.75 0.11...

Info iconThis preview shows pages 1–2. Sign up to view the full content.

View Full Document Right Arrow Icon
Adam Bottorff 10/14/10 SCM Bittner Chapter 6 3. Defects Occurance Cum % % Difficulty Understanding Material 25 0.37 0.37 Insufficient time to complete 15 0.59 0.22 Distractions in exam room 9 0.72 0.13 Late Arrival to exam 7 0.82 0.1 Felt ill during exam 4 0.88 0.06 Forgot exam was scheduled 3 0.93 0.04 Insufficient preparation time 2 0.96 0.03 Studied wrong material 2 0.99 0.03 Calculator batteries died during exam 1 100 0.01 68 0 13. Defects Occurance Cum %
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Background image of page 2
This is the end of the preview. Sign up to access the rest of the document.

Unformatted text preview: % C 601 0.47 0.47 G 212 0.64 0.17 D 146 0.75 0.11 A 143 0.86 0.11 F 90 0.93 0.07 B 71 0.99 0.06 E 12 1.00 0.01 1275 1 1 B. Conclusions I reached from the Pareto graph is that 49% of the defects came from misplaced transistors. Seeing that this is about ½ of the problems, if the business would fix some of those problems, the defects would be a lot smaller....
View Full Document

Page1 / 2

scm hw #3 - C 601 0.47 0.47 G 212 0.64 0.17 D 146 0.75 0.11...

This preview shows document pages 1 - 2. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online