EE 330 Lect 4 Fall 2011

EE 330 Lect 4 Fall 2011 - EE 330 Lecture 4 Statistical...

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EE 330 Lecture 4 Statistical Concepts Historical Background, Feature Sizes and Yield Digital Systems – A preview
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Defects in a Wafer Defect Dust particles and other undesirable processes cause defects Defects in manufacturing cause yield loss Review from Last Time
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Hard Fault Model Ad H e Y Y H is the probability that the die does not have a hard fault A is the die area d is the defect density (typically 1cm -2 < d < 2cm -2 ) Industry often closely guards the value of d for their process Other models, which may be better, have the same general functional form Review from Last Time
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Soft Fault Model Soft fault models often dependent upon design and application k A ρ σ Often the standard deviation of a parameter is dependent upon the reciprocal of the square root of the parameter sensitive area ρ is a constant dependent upon the architecture and the process A k is the area of the parameter sensitive area Review from Last Time
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Soft Fault Model   MAX MIN X X SOFT dx x f P P SOFT is the soft fault yield f(x) is the probability density function of the parameter of interest X MIN and X MAX define the acceptable range of the parameter of interest Some circuits may have several parameters that must meet performance requirements X MIN X MAX Review from Last Time
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Overall Yield If both hard and soft faults affect the yield of a circuit, the overall yield is given by the expression S H Y Y Y Review from Last Time
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Cost Per Good Die The manufacturing costs per good die is given by Y C C FabDie Good where C FabDie is the manufacturing costs of a fab die and Y is the yield There are other costs that must ultimately be included such as testing costs, engineering costs, etc. Review from Last Time
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Meeting the Real Six-Sigma Challenge Six-Sigma or Else !! Introduced by Bill Smith of Motorola in 1984 2/3 of Fortune 500 Companies adopted/adopting 6-sigma concepts Review from Last Time
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Meeting the Real Six-Sigma Challenge How has Motorola fared with the 6-sigma approach? Sold military activities to General Dynamics 2000/2001 Sold automotive products in 2006 Spun of discrete components as ON semiconductor in 1999 Spun of SPS as Freescale in 2003 Sold Motorola Mobility to Google in 2011 Review from Last Time
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Meeting the Real Six-Sigma Challenge Six-Sigma or Else !! Six-sigma capability has almost nothing to do with optimizing profits and, if taken seriously, will likely guarantee a financial fiasco in most manufacturing processes
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Meeting the Real Six-Sigma Challenge
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Meeting the real Six-Sigma Challenge Six-Sigma or Else !! Actually optimizing a process to six-sigma performance will almost always guarantee financial disaster!
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Meeting the real Six-Sigma Challenge Six-Sigma or Else !! I got the message
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Meeting the real Six-Sigma Challenge Six-Sigma or Else !!
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EE 330 Lect 4 Fall 2011 - EE 330 Lecture 4 Statistical...

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