EE 330 Lect 4 Fall 2011

EE 330 Lect 4 Fall 2011 - EE 330 Lecture 4 Statistical...

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EE 330 Lecture 4 Statistical Concepts Historical Background, Feature Sizes and Yield Digital Systems A preview
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Defects in a Wafer Defect Dust particles and other undesirable processes cause defects Defects in manufacturing cause yield loss Review from Last Time
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Hard Fault Model Ad H e Y Y H is the probability that the die does not have a hard fault A is the die area d is the defect density (typically 1cm -2 < d < 2cm -2 ) Industry often closely guards the value of d for their process Other models, which may be better, have the same general functional form Review from Last Time
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