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EE 330 Lect 5 Fall 2011

EE 330 Lect 5 Fall 2011 - EE 330 Lecture 5 Digital Systems...

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EE 330 Lecture 5 Digital Systems A preview Static CMOS Gates Other Logic Styles Improved Device Models
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Statistics Review y f N x f 1 N y f y dy  0 1 μ μ+ σ   1 x f x dx  x y , x N   0,1 y N If the random variable x in Normally distributed with mean μ and standard deviation σ , then is also a random variable that is Normally distributed with mean 0 and standard deviation of 1. x y Review from Last Time
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Statistics Review x y x f μ μ+ σ , x N   The random part of many parameters of microelectronic circuits is often assumed to be Normally distributed and experimental observations confirm that this assumption provides close agreement between theoretical and experimental results The mapping is often used simplify the statistical characterization of the random parameters in microelectronic circuits Review from Last Time
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