labreport 1 (june 14)

labreport 1 (june 14) - The procedures for this experiment...

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EE 3221 Electronics II Laboratory Suhas Patel Evan Trapani (Partner) 437-93-4360 June 21, 2004 Lab 3 (Experiment 15) Test Circuits for BJT’s & FET’s
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EE 3221 Suhas Patel June 21, 2004 Objective: To design circuits which compare the response of enhancement-mode FET’s with that of bipolar transistors, to study the performance of CMOS circuits, and to apply ring oscillators to evaluate the high-frequency response of CMOS inverter. Circuit Diagrams:
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Procedures:
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Unformatted text preview: The procedures for this experiment were the same as given in the lab manual. Observations: Below are the waveforms we observed for the circuits in figures 1 – 6. The waveforms at points A and B were identical for all six circuits. There was no apparent voltage drop across the base and gate resistors. Figure 1, @ C Figure 2, @ C Figure 3, @ C Figure 4, @ C Figure 5, @ C Figure 6, @ C Figure 1, @ C Figure 1, @ C Figure 1, @ C...
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