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Unformatted text preview: USB On-The-Go and Embedded Host Automated Compliance Plan for the On-The-Go & Embedded Host Supplement Revision2.0 Revision 1.0 July 14, 2011 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Revision History Revision 1.0 Issue Date July 14, 2011 First release. Comment Copyright 2011, USB Implementers Forum, Inc. All rights reserved. A LICENSE IS HEREBY GRANTED TO REPRODUCE THIS SPECIFICATION FOR INTERNAL USE ONLY. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, IS GRANTED OR INTENDED HEREBY. USB-IF AND THE AUTHORS OF THIS SPECIFICATION EXPRESSLY DISCLAIM ALL LIABILITY FOR INFRINGEMENT OF INTELLECTUAL PROPERTY RIGHTS, RELATING TO IMPLEMENTATION OF INFORMATION IN THIS SPECIFICATION. USB-IF AND THE AUTHORS OF THIS SPECIFICATION ALSO DO NOT WARRANT OR REPRESENT THAT SUCH IMPLEMENTATION(S) WILL NOT INFRINGE THE INTELLECTUAL PROPERTY RIGHTS OF OTHERS. THIS SPECIFICATION IS PROVIDED "AS IS" AND WITH NO WARRANTIES, EXPRESS OR IMPLIED, STATUTORY OR OTHERWISE. ALL WARRANTIES ARE EXPRESSLY DISCLAIMED. NO WARRANTY OF MERCHANTABILITY, NO WARRANTY OF NONINFRINGEMENT, NO WARRANTY OF FITNESS FOR ANY PARTICULAR PURPOSE, AND NO WARRANTY ARISING OUT OF ANY PROPOSAL, SPECIFICATION, OR SAMPLE. IN NO EVENT WILL USB-IF OR USB-IF MEMBERS BE LIABLE TO ANOTHER FOR THE COST OF PROCURING SUBSTITUTE GOODS OR SERVICES, LOST PROFITS, LOSS OF USE, LOSS OF DATA OR ANY INCIDENTAL, CONSEQUENTIAL, INDIRECT, OR SPECIAL DAMAGES, WHETHER UNDER CONTRACT, TORT, WARRANTY, OR OTHERWISE, ARISING IN ANY WAY OUT OF THE USE OF THIS SPECIFICATION, WHETHER OR NOT SUCH PARTY HAD ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES. All product names are trademarks, registered trademarks, or servicemarks of their respective owners. 1 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Contributors David Wulcan Salyl Bhagwat Paul Berg John Garney Pat Crowe Sten Carlsen Maarit Harkonen Yauheni Kaliuta Richard Petrie David Wu Roshan Jhalani Yuva Kumar Srihari Sahyanarayana Paras Agarwal Premnath Babu Nathalie Ballot Nicolas Florenchie Adam Burns Pascal Berten Broadcom Corp. Broadcom Corp. MCCI Corporation MCCI Corporation MQP Electronics Ltd. Nokia Corporation Nokia Corporation Nokia Corporation Nokia Corporation (Chair) Nokia Corporation Sasken Communication Tech. Ltd. Sasken Communication Tech. Ltd. Sasken Communication Tech. Ltd. ST-Ericsson ST-Ericsson ST-Ericsson ST-Ericsson Synopsys Inc. Testronic Labs 2 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Table of Contents 1 Introduction 1.1 USB On-The-Go and Embedded Hosts 1.2 Objective of the Compliance Program 1.3 Scope of the Document 1.4 Intended Audience 1.5 Reference Document(s) Acronyms and Terms Executive Summary Submission Materials 4.1 Checklists 4.2 Targeted Peripheral Lists 4.3 Device Specific Procedures 4.4 Interoperability Testing 4.4.1 Functional definition 4.4.2 TPL device(s) 4.4.3 Suspend support OTG device support for the automated tester 5.1 Automated Testability Requirements PET Automated Tests 6.1 PET Protocol and Electrical Tester 6.1.1 Serial Interface Engine (SIE) 6.1.2 Electrical Test Board (ETB) 6.1.3 Script Processor 6.1.4 USB Analyzer 6.2 Test Cables Required 6.2.1 Special Test Cable A 6.2.2 Special Test Cable B 6.3 Test Set Ups 6.3.1 OTG device as Unit-Under-Test (Setup no. 1) 6.3.2 Embedded Host as Unit-Under-Test (Setup no. 2) 6.3.3 Peripheral Only as Unit-Under-Test (Setup no. 3) 6.4 Pass Criterion 6.5 Parameter v Test Identifier 6.6 A-UUT Tests 6.6.1 ,,Get VBUS Turned On Sequence used in A-UUT Test Sequences 6.6.2 A-UUT Initial Power-up Test 6.6.3 Following Tests 6.6.4 A-UUT VBUS Voltage and Current Measurements 6.6.5 A-UUT Bypass Capacitance 6.6.6 A-UUT SRP 6.6.7 A-UUT HNP 6.6.8 A-UUT ADP 6.6.9 A-UUT Leakage 6.6.10 ADP-Capable OTG A-device State Transition Test 6.6.11 Non ADP-Capable OTG A-device State Transition Test 6.6.12 ADP-Capable EH State Transition Test 6.6.13 Non ADP-Capable EH State Transition Test 6.6.14 Test Procedure 6.6.15 A-UUT "Device No Response" for connection timeout 6.6.16 A-UUT "Unsupported Device" Message 6.6.17 A-UUT "Device No Response" for HNP enable 6 6 6 6 6 7 8 11 12 12 12 12 12 12 12 12 14 14 15 15 15 15 15 15 16 16 16 17 17 17 18 19 20 24 24 26 28 29 31 32 34 36 38 40 45 50 52 52 54 55 56 2 3 4 5 6 3 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7 B-UUT Tests 6.7.1 B-UUT Initial Power-up Test 6.7.2 B-UUT VBUS Voltage and Current Measurements 6.7.3 B-UUT Bypass Capacitance 6.7.4 B-UUT SRP 6.7.5 B-UUT HNP 6.7.6 B-UUT ADP 6.7.7 B-UUT Leakage 6.7.8 ADP-Capable OTG B-device State Transition Test 6.7.9 Non ADP-Capable OTG B-device State Transition Test 6.7.10 ADP-Capable Peripheral Only B-device State Transition Test 6.7.11 SRP Only Capable Peripheral Only B-device State Transition Test 6.7.12 B-UUT "Device no response" for SRP 6.7.13 B-UUT "Unsupported Device" 6.7.14 B-UUT "Device No Response" for HNP Manual Interoperability Tests 7.1 Introduction 7.1.1 What does "Category" mean? 7.1.2 What does "Prove Functionality" mean? 7.2 Interoperability Requirements 7.2.1 Targeted Peripheral List 7.2.2 Error messages 7.2.3 Hub support 7.3 Interoperability test definitions 7.3.1 A-UUT Functionality B-device 7.3.2 A-UUT Category Functionality B-device 7.3.3 A-UUT Boot test 7.3.4 A-UUT Legacy Speed test 7.3.5 A-UUT Concurrent and Independently test 7.3.6 A-UUT Unsupported device Message test 7.3.7 A-UUT Hub Error message test 7.3.8 A-UUT Hub Functionality test 7.3.9 A-UUT Hub maximum tier test 7.3.10 A-UUT Hub Concurrent and Independent test 7.3.11 A-UUT Bus powered hub power exceeded test 7.3.12 A-UUT Maximum concurrently device exceed message test 7.3.13 A-UUT Suspend/Resume test 7.3.14 A-UUT Suspend Disconnect test 7.3.15 A-UUT Suspend Attach test 7.3.16 A-UUT Suspend Topology Change test 7.3.17 A-UUT Suspend Remote Wakeup test 7.3.18 OTG to OTG test USB-IF Required Tests 8.1 Description of required tests 8.1.1 IOP Goldtree 8.1.2 Avg Current 8.1.3 USBCV 8.1.4 Back-Voltage 8.1.5 US HS Electrical 8.1.6 US FS SQT 8.1.7 Inrush 8.1.8 DS HS Electrical 8.1.9 DS FS SQT 8.1.10 DS LS SQT 57 57 59 60 61 63 65 67 68 73 77 79 80 82 84 85 85 85 85 85 85 85 86 86 86 87 88 88 89 90 91 91 92 93 94 95 96 96 97 98 99 99 101 102 102 102 102 102 102 102 102 103 103 103 7 8 4 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 8.1.11 Droop 8.1.12 Automated Test Ch6 8.1.13 Manual Test Ch7 Test procedures and tools 103 103 103 103 8.2 Table Listings Table 6-1 Special Test Cable A..................................................................................................16 Table 6-2 Special Test Cable B..................................................................................................16 Table 6-3: Which test procedures test which parameters............................................................20 Table 6-4: Guide to abbreviations used in Table 6-3 ..................................................................23 Table 8-1: Embedded Host test requirements .......................................................................... 101 Table 8-2: OTG device test requirements................................................................................. 101 Table 8-3: Peripheral-only B-device test requirements ............................................................. 102 Figure Listings Figure 6-1 Setup No 1 OTG device .........................................................................................17 Figure 6-2 Setup No 2 Embedded Host...................................................................................18 Figure 6-3 Setup No 3 Peripheral Only....................................................................................19 5 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 1 Introduction 1.1 USB On-The-Go and Embedded Hosts USB has become a popular interface for exchanging data between a host PC and its peripherals. As computing resources have become less expensive, the line between PCs and other products has blurred. Today many devices that are not PCs in the classic sense have a need to connect directly to peripherals: Printers connect directly with cameras, for example, or mobile phones may need to connect to USB headsets. These non-PCs have the computing resources to manage a USB host function, but they need to function in ways that differ from standard PC hosts. Although they will provide host capability for some devices, it's unreasonable to require them to support the full range of USB peripherals. For example, connecting a camera to a printer makes a lot of sense, but the printer manufacturers may not think it is quite as important for the printer to support a USB GPS dongle. Because this is new territory for USB, developers need a way to understand what USB functionality they need to provide and what functionality is not required. [USBOTG&EHv2.0] defines these non-PC hosts as Targeted Hosts. A Targeted Host is a USB host that supports a specific, targeted set of peripherals. The developer of each Targeted Host product defines the set of supported peripherals on a Targeted Peripheral List (TPL). A Targeted Host needs to provide only the power, bus speeds, data flow types, etc., that the peripherals on its TPL require. There are two categories of Targeted Hosts: 1. Embedded Hosts: An Embedded Host (EH) product provides Targeted Host functionality over one or more Standard-A receptacles. Embedded Host products may also offer USB peripheral capability, delivered separately via one or more Type-B receptacles. 2. On-The-Go: An OTG product is a portable device that uses a single Micro-AB receptacle (and no other USB receptacles) to operate at times as a USB Targeted Host and at times as a USB peripheral. OTG devices must always operate as a standard peripheral when connected to a standard USB host. The "USB On-The-Go and Embedded Host Automated Compliance Plan" ensures compliance with the added requirements of Targeted Hosts and peripherals which use protocols such as SRP and ADP. 1.2 Objective of the Compliance Program The benefits of a compliance program have been proven by the USB initiative: the proliferation of knowledge, more stringent testing, and a higher standard of quality. The purpose of the "USB On-The-Go and Embedded Host Automated Compliance Plan" is to utilize the effectiveness of the USB-IF compliance program. 1.3 Scope of the Document This document tests and/or checks for compliance with requirements specified in [USBOTG&EHv2.0]. 1.4 Intended Audience This specification is intended for developers of: Embedded Hosts OTG Devices Peripherals which support SRP or ADP 6 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 1.5 Reference Document(s) The following referenced documents can be found on the USB-IF website www.usb.org: [BatteryCharging1.2] [Micro-USB1.01] [USB2.0] [USB 3.0] [USBOTG&EHv2.0] [USBOTG&EHChecklist] [USBCables2.0] [USBSystemsChecklist] [USBPeripheralChecklist] [USBPeripheralSilicon] [PET] Universal Serial Bus Battery Charging Specification, revision 1.2 Universal Serial Bus Micro-USB Cables and Connectors Supplement to the USB 2.0 Specification, revision 1.01. Universal Serial Bus Revision 2.0 Specification including ECNs and errata Universal Serial Bus Revision 3.0 Specification including ECNs and errata USB On-The-Go and Embedded Host Supplement, revision 2.0 USB On-The-Go and Embedded Host Checklist. USB Cables and Connectors Class Document, revision 2.0 USB Compliance Checklist, Systems USB Compliance Checklist, Peripheral (Excluding Hubs) USB Compliance Checklist, Peripheral Silicon (Excluding Hub Silicon) Protocol and Electrical Tester (PET) specification 7 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 2 Acronyms and Terms This chapter lists and defines terms and abbreviations used throughout this specification. Other terms and abbreviations are provided in [USBOTG&EHv2.0]. A-Device Device with a Standard-A receptacle or a device with a Micro-A plug inserted into its receptacle. The A-device supplies power to VBUS and is host at the start of a session. If the A-device is On-The-Go (equipped with a Micro-AB receptacle), it may relinquish the role of host to an On-The-Go B-device under certain conditions (see [USBOTG&EHv2.0]). A-device acting in host role A-device acting in peripheral role USB port with an A plug inserted into its receptacle. This port acts as an A-device. Attach Detection Protocol. A protocol which enables an OTG device or EH to detect when a remote device has been attached or detached (see [USBOTG&EHv2.0]). Device which is able to perform ADP probing and ADP sensing 1. 0F P0F P A-Host A-Peripheral A-Port ADP ADP-capable ADP probing ADP sensing Application Attach This enables the local A-device or B-device to probe VBUS and detect a change in attachment status. This enables the local B-device to detect ADP probing generated by an attached device. ADP sensing is not a requirement for A-devices. A generic term referring to any software that is running on a device that can control the behavior or actions of the USB port(s) on a device. This specification makes a distinction between the words "attach" and "connect". A downstream device is considered to be attached to an upstream port when there is a physical cable between the two. Unit Under Test with a Micro-A plug attached. Device with: a Standard-B receptacle or, Mini-B receptacle, or Micro-B receptacle, or Micro-AB receptacle with either a Micro-B plug or no plug inserted into its receptacle, or a captive cable ending in a Standard-A or Micro-A plug. The B-device is a peripheral at the start of a session. If the B-device is On-The-Go (equipped with a Micro-AB receptacle), it may be granted the role of host from an On-The-Go A-device (see [USBOTG&EHv2.0]). B-device acting in host role B-device acting in peripheral role A-UUT B-Device B-Host B-Peripheral 1 An ADP-capable EH is not required to do ADP sensing since it is not able to operate in the B-device position. 8 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 B-Port B-UUT Connect USB port with a B plug inserted into its receptacle. This port acts as a B-device. Unit Under Test with a Micro-B plug attached. This specification makes a distinction between the words "attach" and "connect". A downstream device is considered to be connected to an upstream port when it is attached to the upstream port, and when the downstream device has pulled either the D+ or D- data line high through a 1.5 k resistor, in order to enter low-speed, full-speed or high-speed signaling. Embedded Host. A product that has a Standard-A receptacle supported by a USB Host Controller. Embedded Hosts have a particular set of targeted peripherals, as described in their TPL. Full Speed (as defined in [USB2.0]). High Speed (as defined in [USB2.0]). A physical entity that is attached to a USB cable and is acting in the role of the USB host as defined in [USB2.0]. This entity initiates all data transactions and provides periodic Start of Frames (SOFs). Host Negotiation Protocol (see [USBOTG&EHv2.0]). Identification. Denotes the pin on the Micro connectors that is used to differentiate a Micro-A plug (ID pin is FALSE) from a Micro-B plug (ID pin is TRUE). See [Micro-USB1.01] for details. Link Power Management (as defined in [USB2.0]). Low Speed (as defined in [USB2.0]). On-The-Go. Device that provides both host and peripheral capabilities over a single Micro-AB receptacle, as outlined in [USBOTG&EHv2.0]. A physical entity that is attached to a USB cable and is currently operating as a "device" as defined in [USB2.0]. The peripheral responds to low level bus requests from the host. A device with a compliant B-side connector which can act only in peripheral mode. Protocol and Electrical Tester. A test unit which is capable of performing the tests specified in Section 6. ADP probe measurement taken when a pre-session measurement is not available. In this case, a measurement is taken, and a new session is initiated (or requested) to determine whether a remote device is attached. Single Ended Zero (as defined in [USB2.0]). The period of time that V BUS is powered (see [USBOTG&EHv2.0]). Start of Frame (as defined in [USB2.0]). Session Request Protocol (see Section [USBOTG&EHv2.0]). Device which is able to generate or respond to SRP signaling. A host that is only required to support the peripherals on its Targeted EH Embedded Host FS HS Host HNP ID LPM LS OTG OTG device Peripheral Peripheral-only B-device PET Pre-session Calibration SE0 Session SOF SRP SRP-capable Targeted Host 9 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Peripheral List. OTG devices and Embedded Hosts both have Targeted Host functionality. Targeted Peripheral List TPL USB USB-IF UUT A list of USB peripherals that a particular Targeted Host can support (see [USBOTG&EHv2.0]). Targeted Peripheral List. Universal Serial Bus. USB Implementers Forum (See www.usb.org). Unit Under Test 10 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 3 Executive Summary The "USB On-The-Go and Embedded Host Automated Compliance Plan" does not overlap the USB 2.0 peripheral compliance plan. Any parameter/feature specified in the USB 2.0 Specification will not be tested here. The "USB On-The-Go and Embedded Host Automated Compliance Plan" will test only "New" parameters/features that are specified in [USBOTG&EHv2.0]. The significant features tested from [USBOTG&EHv2.0] are: A Targeted Host capability Session Request Protocol Attach Detection Protocol Host Negotiation Protocol The ability to source at least 8 mA on VBUS A means of communicating with the user No Silent failures i.e. there must be a method of alerting the user that an unsupported device has been attached, or that the attached device violates one of the conditions required to interface to the OTG device, e.g. it requires more current than the OTG device can provide. Interoperability with devices on the Targeted Peripheral List defined for the UUT. The details of these and other compliance tests are covered in subsequent sections of this document. Many tests are based on the use of the Protocol and Electrical Tester (PET) as specified in [PET]. The USB-IF Board reserves the right to re-certify products if, after USB-IF certification, the TPL is updated such that this adds new capability to the device which has not previously been tested. 11 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 4 Submission Materials 4.1 Checklists The manufacturer of an Embedded Host, OTG device or SRP capable peripheral shall provide a completed [USBOTG&EHChecklist] checklist plus any required additional USB Checklists depending on the type of product to be tested, The [USBSystemsChecklist] (product and/or silicon) is required for an OTG device or EH. EHs with B-ports, OTG devices and peripherals supporting SRP/ADP (product and/or silicon) must also pass all standard USB-IF peripheral testing and so are required to supply a [USBPeripheralChecklist] and also a [USBPeripheralSilicon] when silicon is not yet certified. 4.2 Targeted Peripheral Lists Targeted Hosts (both OTG devices and EHs) must provide Targeted Peripheral Lists before submitting the device for OTG and EH testing (see [USBOTG&EHChecklist]). The TPL shall include the list of supported products and hubs. 4.3 Device Specific Procedures Testing in the absence of support for the automated test mechanisms specified in Section 5.1 is out of the scope of this compliance plan. The recommended approach to testing is to support these test mechanisms and to use the PET. 4.4 Interoperability Testing The following sections detail the submissions which are required in order to complete Interoperability testing as defined in Section 7. 4.4.1 Functional definition The A-UUT vendor is responsible for providing details of the expected functionality of the A-UUT. 4.4.2 TPL device(s) The A-UUT vendor is responsible for providing the following TPL devices. Each device listed on the TPL shall be provided. When product is an EH with multiple ports 2 identical devices shall be provided. When the product is an OTG device which supports hubs then 2 identical devices shall be provided as well as the hub or hubs listed on the TPL. When the product is an OTG device which lists itself on the TPL2 identical products shall be provided. All the listed TPL devices should be retail and USB-IF certified 4.4.3 Suspend support The A-UUT vendor is responsible for providing the following details relating to suspend: When the A-UUT supports USB suspend features (including LPM) there shall be an option to force the A-UUT in suspend during normal function in order to prove the suspend tests. When remote wakeup is supported the A-UUT shall provide an option to enable this feature during suspend. 12 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 In case more types of suspend are supported the A-UUT shall be able to enter each suspend mode manually. 13 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 5 OTG device support for the automated tester 5.1 Automated Testability Requirements An OTG A-device or B-device needs to behave in certain ways to assist with testing. [USBOTG&EHv2.0] allows immense freedom of behavior to devices which are covered by the specification, which could be a major barrier to automated testing, or even any testing at all of some particular parts of the specification. In order for an OTG device or EH to be testable by automated equipment, a number of behavioral items must be satisfied. These can each be guaranteed by one of two approaches. 1) The behavior required is a normal part of device operation 2) The behavior required is forced by a special test mode Details of the required automated test features are given in [USBOTG&EHv2.0]. These behavioral requirements also apply to retail products obtained "off the shelf" since USB-IF retains the right to re-test any USB-IF certified shipping products at their point of sale. 14 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6 PET Automated Tests The tests in this section test only a partial list of all the possible parameters and compliant behavior. The tests should not be considered as a full validation test plan. It is the responsibility of the manufacturer of a device to verify compliance of their products according to [USBOTG&EHv2.0]. 6.1 PET Protocol and Electrical Tester The PET is a unit, designed to perform compliance testing or assist with development work leading towards compliance testing on On-the-Go, Battery Charging and other general USB applications. It is described in detail in [PET]. A brief breakdown of its functional blocks follows. 6.1.1 Serial Interface Engine (SIE) A fully functional SIE, with both host and peripheral capabilities, connected via a PHY to the PET socket labeled UUT (Micro-AB receptacle on the front panel). This is under the control of the Script Processor. 6.1.2 Electrical Test Board (ETB) This contains circuitry to allow control and measurement of the electrical parameters for [USB2.0], [USBOTG&EHv2.0] and [BatteryCharging1.2]. It includes VBUS Generator, ID pin circuitry, data line test mode circuitry, VBUS current and voltage loads, and a variety of voltage and current measuring blocks. Extra connections are provided to enable the testing of Accessory Charger Adapters (ACAs). 6.1.3 Script Processor Scripts are downloaded to this processor to control the sequence of operations required for a particular test. The processor controls the SIE and ETB as required by the operator. Scripts for all the [USBOTG&EHv2.0] and [BatteryCharging1.2] compliance tests would be provided by the application accompanying the PET. 6.1.4 USB Analyzer The PET could also provide full USB analyzer functionality. By designing the analyzer into the PET circuitry the analyzer could be designed to have zero impact on the data line transmission quality. 15 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.2 Test Cables Required The cables required by the PET tester are described below. Each cable should be labeled, and specify the lead loop resistance value, required to be entered into the test dialog, if the cable is replaced. The tester application contains a check box to specify whether the UUT has a captive cable, as in this case the captive test cable is deemed to be part of the unit under test. 6.2.1 Special Test Cable A Table 6-1 Special Test Cable A Micro-B plug to Micro-B plug Micro-B plug (PET) 1 2 3 4 5 Micro-B plug (UUT) 1 2 3 4 5 Purpose VBUS DD+ ID GND This cable has been specified to allow control of the ID pin of the unit-under-test. It is important to use this cable when the test specifies it. The particular resistance of the cable has also been allowed for in the test suite. 6.2.2 Special Test Cable B Table 6-2 Special Test Cable B Micro-B plug to Standard-A plug Micro-B plug (PET) 1 2 3 nc 5 4 GND Standard-A plug (UUT) 1 2 3 Purpose VBUS DD+ Although this is a standard cable configuration, it is important to use the specified cable, as its particular resistance has been allowed for in the test suite. 16 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.3 Test Set Ups When running a test-suite relating to an OTG device, the first test will prompt you to attach it to the PET using ,,Special Cable A. This Micro-B plug to Micro-B plug cable is provided with the PET unit and it is essential that this particular cable is used, for the following reasons: It has 5 cores, instead of the usual 4. This allows the PET to control the ID pin of the UUT. The resistance of this cable has been allowed for in tests involving large VBUS currents with measurements on VBUS current and voltage. 6.3.1 OTG device as Unit-Under-Test (Setup no. 1) PC Host for PET High Speed USB Link PET Special Test Cable A OTG Unit-Under-Test Figure 6-1 Setup No 1 OTG device 6.3.2 Embedded Host as Unit-Under-Test (Setup no. 2) When running a test-suite relating to an Embedded Host, the first test will prompt you to attach it to the PET using ,,Special Cable B. This Micro-B plug to Standard-A plug cable is provided with the PET unit and it is essential that this particular cable is used, for the following reason: The resistance of this cable has been allowed for in tests involving large VBUS currents with measurements on VBUS current and voltage. 17 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 PC Host for PET High Speed USB Link PET Special Test Cable B Embedded Host Unit-Under-Test Figure 6-2 Setup No 2 Embedded Host 6.3.3 Peripheral Only as Unit-Under-Test (Setup no. 3) When running a test-suite relating to a Peripheral-Only OTG device, the first test will prompt you to attach it to the PET using ,,Special Cable A. This Micro-B plug to Micro-B plug cable is provided with the PET unit and it is essential that this particular cable is used, for the following reason: The resistance of this cable has been allowed for in tests involving large VBUS currents with measurements on VBUS current and voltage. Another possibility is that the device has a captive cable with a Micro-A plug. In this case use this, and check the 'Captive Cable' check box, in the 'PET Test Suites' Dialog. Finally, the device may have a captive cable with a Standard-A plug. In this case, use a suitable adapter to attach the Standard-A plug to the Micro-AB receptacle of the PET, and check the 'Captive Cable' check box, in the 'PET Test Suites' Dialog. 18 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 PC Host for PET High Speed USB Link PET Captive Cable, or Special Test Cable A OTG PeripheralOnly Device Unit-Under-Test Figure 6-3 Setup No 3 Peripheral Only 6.4 Pass Criterion In the some of the test sequences which follow, a particular form of wording has been used, to ensure that the pass criterion are clear. Wherever the word 'check' is used, this defines a timing or behavior requirement that must be satisfied for the overall test sequence to be deemed to have been passed. The failure to satisfy any one of these 'checks' results in a failure for the test sequence in question. For example, in the following test sequence fragment, two pass criterion are implicitly defined by use of the word 'check'. Failure of either one results in a failure for the complete test sequence. ... 7. Check for VBUS on within TPWRUP_RDY (30s) 8. Check it remains on for TA_WAIT_BCON min (1.1s) ... In tests where there is some interaction required from the operator in order to validate a test pass then a specific pass criteria is listed at the start of the test. In the example: ... 7. Display Message "Click OK if 'Unsupported Device indication displayed on UUT". 8. If operator clicks OK before 30s timer expires, then UUT passes test. ... The pass criteria would be "Message "Unsupported Device" or similar is displayed on UUT". 19 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.5 Parameter v Test Identifier Table 6-3 identifies which test procedure(s) result in each of the parameters specified in [USBOTG&EHv2.0] being tested. Not all parameters can be directly measured. Table 6-3: Which test procedures test which parameters Parameter VBUS Voltage: VBUS Average Voltage (low power) VBUS Average Voltage (high power) VBUS transient voltage (low power) VBUS transient voltage (high power) B-device operating voltage OTG device or EH Leakage Voltage ADP discharge voltage VBUS noise requirement for ADP VBUS Current: A-device Output Current Symbol Tested In Comments VA_VBUS_AVG_LO VA_VBUS_AVG_HI VA_VBUS_TRNS_LO VA_VBUS_TRNS_HI VB_VBUS VOTG_VBUS_LKG VADP_DSCHG VADP_NOISE A-UUT VBUS A-UUT VBUS A-UUT VBUS A-UUT VBUS B-UUT VBUS A-UUT SRP B-UUT SRP A-UUT ADP B-UUT ADP - Both min and max tested. Both min and max tested. Both min and max tested. Both min and max tested. Both min and max tested. Only has a max. This is tested. Only has a max. This is tested. Not Tested. (Checked by confirmation of correct operation.) IA_VBUS_OUT IA_VBUS_RATED A-UUT VBUS The value which is actually tested is I A_VBUS_RATED which is specified by the vendor to be less than or equal to IA_VBUS_OUT max, and greater than or equal to the larger of IA_VBUS_OUT min and bMaxPower (part of the bmAttributes field of the Standard Configuration Descriptor as defined in [USB2.0] or [USB 3.0]) of any peripheral on the TPL of the UUT. The PET limits the maximum value of IA_VBUS_RATED to 1.8A to avoid damage to USB connectors. Only has a max. This is tested. B-device (OTG device or SRPcapable peripheralonly) Unconfigured Average Current VBUS leakage source current ADP source current ADP sink current Terminations: VBUS resistance Thresholds: OTG device Session Valid IB_UNCFG B-UUT VBUS IVBUS_LKG_SRC IADP_SRC IADP_SINK A-UUT LKG A-UUT ADP B-UUT ADP - Only has a max. This is tested. Both min and max tested. Not measured. However its effect is proved by the measurement of VADP_DSCHG ROTG_VBUS A-UUT LKG B-UUT LKG Only has a min. This is tested. VOTG_SESS_VLD B-UUT VBUS Both min and max tested 20 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Parameter ADP probing voltage ADP sensing voltage Capacitance: OTG A-device or EH VBUS bypass capacitance VBUS bypass capacitance for ADP capable devices ADP threshold capacitance VBUS bypass capacitance for nonADP capable devices DC Electrical Timing: Period of measurement for Symbol Tested In A-UUT ADP B-UUT ADP Comments Both min and max tested Not directly measurable. VADP_PRB VADP_SNS CA_VBUS A-UUT CAP Min is tested. CADP_VBUS A-UUT CAP B-UUT CAP A-UUT ADP B-UUT ADP B-UUT CAP Both min and max tested CADP_THR CRPB Both min and max tested Both min and max tested TAVG_VBUS - Not a parameter to measure, but a specification for performing a measurement. Used in A-UUT VBUS Used in B-UUT VBUS VA_VBUS_AVG_LO and VA_VBUS_AVG_HI VBUS Rise Time TA_VBUS_RISE A-UUT VBUS (in A-UUT GVBO) A-UUT LKG B-UUT SRP Only has a max. This is tested. Session end to TSSEND_LKG TA_VBUS_ATT Only has a max. This is tested. Only has a max. VOTG_VBUS_LKG Time to detect device attachment and turn on VBUS A-UUT ADP (in A-UUT GVBO) A-UUT ADP - Case 1: Non ADP ID pin goes FALSE. VBUS turn on within T A_VBUS_ATT Case 2: ADP capable capacitance change. VBUS turn on within T A_VBUS_ATT Case 3: ADP Startup. VBUS on after an initial ADP probe. Not testable as ADP probe cannot be detected when immediately followed by VBUS on. Common: Local Disconnect to Data Line Discharge ADP cycle to cycle jitter Power on until ready for USB (not mandatory see reference) A-device: SRP Response Time B-Connect Long Debounce B-connect to A-reset Wait for B-Connect TLDIS_DSCHG TADP_PRB_JTR TPWRUP_RDY A-UUT ADP B-UUT ADP A-UUT PUT B-UUT PUT Not directly measurable Only has a max. This is tested. Only has a max. This is tested. TA_SRP_RSPNS TA_BCON_LDB TA_BCON_ARST TA_WAIT_BCON A-UUT SRP A-UUT SRP A-UUT HNP A-UUT VBUS Only has a max. This is tested. Only has a min. This is tested. Only has a max. This is tested. Max value used in many places to infer when a test has failed. Min value tested in test indicated 21 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Parameter A-Idle to BDisconnect B-Disconnect to AConnect B-Idle to ADisconnect B-Connect Short Debounce B-Connect Short Debounce Window A-device ADP probing period, (Typical = 1.75s) Session end to ADP probing B-device: Session end to SRP init SE0 Time Before SRP Data-Line Pulse Time SRP Fail Time Symbol Tested In A-UUT HNP A-UUT HNP A-UUT HNP A-UUT ADP Comments Only has a min. This is tested. Only has a max. This is tested. Also used in B-UUT. Both min and max tested. Internal to A-device. Cannot be measured. Internal to A-device. Cannot be measured. Both min and max tested. TA_AIDL_BDIS TA_BDIS_ACON TA_BIDL_ADIS TA_BCON_SDB TA_BCON_SDB_WIN TA_ADP_PRB TA_SSEND_PRB A-UUT PUT A-UUT ADP Only has a max. This is tested. TB_SSEND_SRP TB_SE0_SRP TB_DATA_PLS TB_SRP_FAIL B-UUT SRP B-UUT SRP A-UUT SRP B-UUT SRP B-UUT PUT B-UUT SRP B-UUT DNR B-UUT SRP B-UUT HNP B-UUT HNP Only has a min. This is tested. Only has a min. This is tested. Both min and max tested. Min tested in B-UUT PUT and B-UUT SRP. Max functionally tested in B-UUT DNR. Only has a max. This is tested. Both min and max tested. Both min and max tested. Session Valid to BConnect A-Idle to BDisconnect Time between Bdevice HS to FS transition during suspend, and Bdevice disconnect A-SE0 to B-Reset A-Connect Debounce A-Connect to B-SE0 B-device ADP probing period (Typical = 2.0s) Time from stopping ADP probing to SRP generation B-device ADP detach time, sensing mode Sensing end to first ADP probe TB_SVLD_BCON TB_AIDL_BDIS TB_FS_BDIS TB_ASE0_BRST TB_ACON_DBNC TB_ACON_BSE0 TB_ADP_PRB B-UUT HNP B-UUT PUT B-UUT ADP B-UUT ADP Time to optional event not tested. Not a practical test check by vendor declaration. Only has a max. This is tested. Both min and max tested. This is tested. TB_ADP_PRB_SRP Only has a max. This is tested. TB_ADP_DETACH TB_SNSEND_PRB B-UUT ADP B-UUT ADP Both min and max tested. Only has a max. Not independently testable, but tested in conjunction with TB_ADP_DETACH max. Testability 22 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Parameter Bus reset to configuring test device Maintaining configured session on test device B-device as host, SetConfiguration() to suspend of test device Session end to SRP from unit under test otg_hnp_reqd flag set to Host Request Flag set Reconnect after handing back control from HNP caused by ,,otg_hnp_reqd Time to switch off VBUS after tester disconnects with ,,otg_vbus_off set VBUS off with no ADP after session which sets ,,otg_vbus_off HNP Polling Polling period for the event flags Time from detection of host flag until suspend Symbol Tested In A-UUT VBUS A-UUT SRP Comments Only has a max. This is tested. TTST_CONFIG TTST_MAINT Used to allow testing in A-UUT VBUS. TTST_SUSP B-UUT HNP Only has a max. This is tested. TTST_SRP TTST_HNP B-UUT SRP B-UUT HNP Only has a max. This is tested. Only has a max. This is tested. TTST_HNPEND B-UUT HNP Only has a max. This is tested. TTST_VBOFF A-UUT CAP Only has a max. This is tested. TTST_NOADP - Min used to allow testing in A-UUT CAP. THOST_REQ_POLL THOST_REQ_SUSP A-UUT HNP A-UUT HNP Both min and max tested. Both min and max tested. Table 6-4: Guide to abbreviations used in Table 6-3 Abbreviated Name A-UUT GVBO A-UUT PUT A-UUT VBUS A-UUT CAP A-UUT SRP A-UUT HNP A-UUT ADP A-UUT LKG B-UUT PUT B-UUT VBUS B-UUT CAP B-UUT SRP B-UUT HNP Full Name Get VBUS On Function A-UUT Initial Power Up Tests A-UUT VBUS Voltage and Current Measurements A-UUT Bypass Capacitance A-UUT Session Request Protocol A-UUT Host Negotiation Protocol A-UUT Attach Detection Protocol A-UUT Leakage B-UUT Initial Power Up Tests B-UUT VBUS Voltage and Current Measurements B-UUT Bypass Capacitance B-UUT Session Request Protocol B-UUT Host Negotiation Protocol 23 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 B-UUT ADP B-UUT LKG B-UUT DNR B-UUT Attach Detection Protocol B-UUT Leakage B-UUT "Device No Response" 6.6 A-UUT Tests 6.6.1 ,,Get V BUS Turned On Sequence used in A-UUT Test Sequences The following sequences are used in most of the A-UUT tests, to bring the UUT to the point of applying VBUS. As the test sequences themselves are tests of functions which can be required on more than one UUT type, it is necessary to use different procedures, depending on the capabilities of the UUT in question. The procedure depends on whether the UUT is: OTG A-device capable of ADP OTG A-device not capable of ADP EH which supports sessions and is capable of ADP EH which supports sessions and is not capable of ADP (but must support SRP) EH which does not support sessions In the actual tests, these sequences are indicated by: ,,Get VBUS Turned On At the start of most A-UUT tests, the main aim is to get VBUS on as soon as possible. One of the main potential delays in performing A-UUT tests originates with TA_WAIT_BCON max, which can mean waiting 30s or more between tests for VBUS to go off, so that we can turn it on, knowing that it will then stay on for at least TA_WAIT_BCON min (1.1 Sec). The alternative approach we use in the following A-UUT test sequences, is to observe at the start of a test whether VBUS is already on (still on from the previous test). If not, we invoke the ,,Get VBUS Turned On sequence. Otherwise, we proceed with the next step, which is to connect. After connecting we check whether VBUS is still on. If it is we proceed with the test, otherwise we disconnect D+, invoke the ,,Get V BUS Turned On sequence, and then connect again. To avoid an infinite loop, we restrict the use of ,,Get V BUS Turned On to one attempt. Note that for simplicity, this procedure is not described in detail in the A-UUT tests. In general, the tests can now proceed without delay in between tests. An important point to note is that VBUS may stay on for two different possible times. If the test device 0x1A0A/0x0200 is enumerated then it will stay on for TTST_MAINT from being configured. If another device, is enumerated, or the device disconnects before enumeration, then VBUS stays on for TA_WAIT_BCON. In all cases where TTST_MAINT is relevant then we must wait for this time to expire before ending the test, as behavior resulting from disconnecting and reconnecting during TTST_MAINT is undefined. 6.6.1.1 For OTG A-device UUT capable of ADP For EH UUT which supports sessions, and is capable of ADP GVbO1. UUT is powered up. The PET puts CRPB max (10F), and a pull-down resistor of ROTG_VBUS min (10k) on VBUS, in order to represent a typical device, with the data lines not pulled up. If OTG A-device UUT, then ID pin is connected to ground. GVbO2. Check that VBUS is below VOTG_SESS_VLD min within TA_WAIT_BCON max (30s, or as specified by vendor). Wait only until it has stayed below VOTG_SESS_VLD min, for 5s. This 24 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 ensures that there will be no further session resulting from an unexpected VBUS capacitance change, and also that we meet TB_SSEND_SRP min (1.5s). Wait for a further ADP probe to be completed. This is to minimize the possibility of the turning on of VBUS corrupting an ADP probe value. PET applies SRP pulse on D+, of TB_DATA_PLS (5ms to 10ms use mid-range value 7.5ms). Check that VBUS rises above VOTG_SESS_VLD min within TA_SRP_RSPNS max (4.9s). Check that VBUS rises to at least VA_VBUS_AVG_LO min (4.4V) within TA_VBUS_RISE (100ms) of VBUS rising above VOTG_SESS_VLD min. GVbO3. GVbO4. GVbO5. GVbO6. 6.6.1.2 For OTG A-device UUT which is not capable of ADP (therefore must support SRP) GVbO1. UUT is powered up. The PET puts CRPB max (10F), and a pull-down resistor of ROTG_VBUS min (10k) on VBUS, in order to represent a typical device, with the data lines not pulled up. ID pin is connected to ground. GVbO2. Disconnect ID pin from ground. GVbO3. Wait 5s. GVbO4. Check VBUS is below VOTG_SESS_VLD min. GVbO5. Connect ID pin to ground. GVbO6. Check that VBUS rises above VOTG_SESS_VLD min within TA_VBUS_ATT max (200ms). GVbO7. Check that VBUS rises to at least VA_VBUS_AVG_LO min (4.4V) within TA_VBUS_RISE (100ms) of VBUS rising above VOTG_SESS_VLD min. 6.6.1.3 For EH UUT which supports sessions and is not capable of ADP (therefore must support SRP) GVbO1. UUT is powered. The PET puts CRPB max (10F), and a pull-down resistor of ROTG_VBUS min (10k) on VBUS, in order to represent a typical device, with the data lines not pulled up. GVbO2. Check that VBUS is below VOTG_SESS_VLD min within TA_WAIT_BCON max (30s, or as specified by vendor). Wait only until it has stayed below VOTG_SESS_VLD min, for 5s. This ensures that there will be no further session resulting from an unexpected VBUS capacitance change, and also that we meet TB_SSEND_SRP min (1.5s). GVbO3. PET applies SRP pulse on D+, of TB_DATA_PLS (5ms to 10ms use mid-range value 7.5ms). GVbO4. Check that VBUS rises above VOTG_SESS_VLD min within TA_SRP_RSPNS max (4.9s). GVbO5. Check that VBUS rises to at least VA_VBUS_AVG_LO min (4.4V) within TA_VBUS_RISE (100ms) of VBUS rising above VOTG_SESS_VLD min. 6.6.1.4 For EH UUT which does not support sessions GVbO1. UUT is powered up. The PET puts CRPB max (10F), and a pull-down resistor of ROTG_VBUS min (10k) on VBUS, in order to represent a typical device, with the data lines not pulled up. GVbO2. Check that VBUS is above VA_VBUS_AVG_LO min (4.4V). 25 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.2 A-UUT Initial Power-up Test Purpose To ensure that the OTG A-device or EH has been powered up and is ready for the subsequent tests. All following tests assume that this test has been run first. In the case of an ADP capable host, this test also confirms functional startup sequence. All Targeted Hosts. This test will confirm that the correct cable has been attached, and arrange for the test operator to switch the UUT on. In the case of an ADP capable device, it will first get the UUT switched off. It will also confirm the commencement of ADP probing. Test setup 1 or 2 (see Section 0). Applies to Description Test setup Preconditions None. Checklist ADP4, M4, SRP4, T18. 6.6.2.1 Test procedure 6.6.2.1.1 Common to All A-UUT Types 1. The user enters into the PET: whether the UUT is an OTG A-device or an EH. whether the UUT supports sessions. whether the UUT is capable of ADP. whether the UUT is capable of SRP. The test sequence then followed depends on the UUT type OTG A-device or EH capable of ADP. OTG A-device not capable of ADP. EH which supports sessions and is not capable of ADP (but must support SRP). EH which does not support sessions. 6.6.2.1.2 For OTG A-device UUT capable of ADP 2. Operator: Ensure UUT attached using Special Test Cable A (Test setup 1 Section 6.3.1). 3. UUT is either powered or is not powered, no capacitive or current loading on VBUS and data lines not pulled up, ID pin not connected to ground. 4. Operator: Turn UUT off, if not already off. 5. Connect ID pin to ground. 6. Apply 10F bypass capacitor, and 10k pull-down resistor, to VBUS. 7. Operator: Turn UUT on. Note: There should be an ADP probe first within TPWRUP_RDY but it is not possible to rigorously detect this if VBUS is turned on immediately after. So we will not require detection of the probe. 8. Check for VBUS on within TPWRUP_RDY (30s). 9. Check it remains on for TA_WAIT_BCON min (1.1s). 26 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 10. Check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). 11. Check ADP probe occurs within TA_SSEND_PRB of VBUS going below VOTG_SESS_VLD min (0.8V). 12. Check for 2 further ADP probes within 2 x TA_ADP_PRB max (2 x 1.85s + margin = 4s) of the previous probe. 13. Now ready for any other A-UUT test. 6.6.2.1.3 For EH UUT which supports sessions, and is capable of ADP 2. Operator: Ensure UUT attached using Special Test Cable B (Test Setup 2 Section 6.3.2). 3. UUT is either powered or is not powered, no capacitive or current loading on VBUS and data lines not pulled up. 4. Operator: Turn UUT off, if not already off. 5. Apply 10F bypass capacitor, and 10k pull-down resistor, to VBUS. 6. Operator: Turn UUT on. Note: There should be an ADP probe first within TPWRUP_RDY but it is not possible to rigorously detect this if VBUS is turned on immediately after. So we will not require detection of the probe. 7. 8. 9. 10. Check for VBUS on within TPWRUP_RDY (30s). Check it remains on for TA_WAIT_BCON min (1.1s). Check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). Check ADP probe occurs within TA_SSEND_PRB of VBUS going below VOTG_SESS_VLD min (0.8V). 11. Check for 2 further ADP probes within 2 x TA_ADP_PRB max (2 x 1.85s + margin = 4s) of the previous probe. 12. Now ready for any other A-UUT test. 6.6.2.1.4 For OTG A-device UUT which is not capable of ADP 2. Operator: Ensure UUT attached using UUT-OTG plug of Special Test Cable A (Test Setup 1 Section 6.3.1). 3. UUT is either powered or is not powered, no capacitive or current loading on VBUS and data lines not pulled up, ID pin not connected to ground. 4. Operator: Turn UUT off, if not already off. 5. Connect ID pin to ground. 6. Apply 10F bypass capacitor, and 10k pull-down resistor, to VBUS. 7. Operator: Turn UUT on. 8. Check for VBUS on within TPWRUP_RDY (30s). 9. Check it remains on for TA_WAIT_BCON min (1.1s). 10. Check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). 11. Now ready for any other A-UUT test. 6.6.2.1.5 For EH UUT which supports sessions and is not capable of ADP (therefore must support SRP) 2. Operator: Ensure UUT attached using Special Test Cable B (Test Setup 2 Section 6.3.2). 27 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 3. UUT is either powered or is not powered, no capacitive or current loading on VBUS and data lines not pulled up. 4. Apply 10F bypass capacitor, and 10k pull-down resistor, to VBUS. 5. Operator: Turn UUT on, if not already on. 6. If VBUS is on, go to step 9. 7. Perform SRP pulse. 8. Check if VBUS is on within TA_SRP_RSPNS max (4.9s) from rising edge of SRP pulse plus TB_DATA_PLS plus TA_VBUS_RISE (100ms) plus margin = 6s). 9. If not, repeat last two steps, for up to TPWRUP_RDY, until VBUS is on. 10. Connect using D+ pull-up. 11. Check for reset within TPWRUP_RDY from step 4. 12. Disconnect D+ pull-up. 13. Wait 2s to allow disconnection to be detected. 14. Now ready for any other A-UUT test. 6.6.2.1.6 For EH UUT which does not support sessions 2. Operator: Ensure UUT attached using Special Test Cable B (Test Setup 2 Section 6.3.2). 3. UUT is either powered or is not powered, no capacitive or current loading on VBUS and data lines not pulled up. 4. Apply 10F bypass capacitor, and 10k pull-down resistor, to VBUS. 5. Operator: Turn UUT on (if not already on). 6. Check for VBUS on within TPWRUP_RDY. 7. Connect using D+ pull-up. 8. Check for reset within TA_BCON_ARST (30s) of D+ pull-up. 9. Disconnect D+ pull-up. 10. Now ready for any other A-UUT test. 6.6.3 Following Tests From now on all test sequences must start and finish with the PET having 10F capacitance and 10k pull-down resistance connected to VBUS, no termination on Data Lines, and holding the ID pin connected to ground for OTG A-devices, but not for EHs. This allows the tests to be performed in any sequence. 28 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.4 A-UUT VBUS Voltage and Current Measurements Purpose Applies to Description To verify that the OTG A-device or EH can maintain voltage VA_VBUS_OUT while supplying its maximum rated output current. All Targeted Hosts This test will measure VA_VBUS_AVG_LO or V A_VBUS_AVG_HI as appropriate, using TAVG_VBUS, both off load and at IA_VBUS_RATED. It will ensure that VA_VBUS_OUT does not go outside the limits VA_VBUS_TRNS_LO or VA_VBUS_TRNS_HI. Test setup 1 or 2 (see Section 0) Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. It is expected that the value of I A_VBUS_RATED is known from [USBOTG&EHChecklist]. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist E3, E4, E5, E6, T1, T2, E19 6.6.4.1 Test procedure 1. The user enters into the PET: whether the UUT is an OTG A-device or an EH. whether the UUT supports sessions. whether the UUT is capable of ADP. whether the UUT is capable of SRP. the value for I A_VBUS_RATED, which can be from 8mA to 5000mA, but must be greater than the bMaxPower (part of the bmAttributes field of the Standard Configuration Descriptor as defined in [USB2.0] or [USB 3.0]) of any peripheral on the TPL of the UUT. Important: if IA_VBUS_RATED is over 1.8A, use the value 1.8A for IA_VBUS_RATED in the following tests, in order that the test does not damage the USB connectors. If IA_VBUS_RATED is over 100mA, use VA_VBUS_AVG_HI and VA_VBUS_TRNS_HI where required below, else use VA_VBUS_AVG_LO and VA_VBUS_TRNS_LO. 2. Get VBUS turned on, using the method described in Section 6.6.1. 3. Wait for slightly less than TA_WAIT_BCON min. (1.1sec - 0.05 = 1.05sec) from point in time when VBUS reached VA_VBUS_AVG_LO min (4.4V). 4. Connect PET by using D+ pull-up. 5. From now on, continuously check that VBUS remains above VA_VBUS_AVG_LO. 6. Check that a bus reset (SE0) occurs within TA_BCON_ARST max (30s). 7. Check that UUT enumerates the PET successfully (up to setting configuration 1) within TTST_CONFIG max (30s) from end of reset. The PET responds as the test device (VID=0x1A0A, PID=0x0200), declaring its load current as the lower of I A_VBUS_RATED and 500mA. 8. According to the definition of the test device, the UUT is obliged to set configuration 1. The configured device (the PET) is now allowed to draw I A_VBUS_RATED current. The UUT must maintain a session for TTST_MAINT min (10s) after setting the configuration. 9. Without any applied current load, check that VBUS average is within appropriate range (VA_VBUS_AVG_LO or VA_VBUS_AVG_HI ) over the next TAVG_VBUS (1s). 29 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 10. Now apply a load of I A_VBUS_RATED as a step increase, checking that VBUS does not go outside the limits VA_VBUS_TRNS_LO or VA_VBUS_TRNS_HI as appropriate and that VBUS average is within appropriate spec (VA_VBUS_AVG_LO or VA_VBUS_AVG_HI) over the next TAVG_VBUS (1s). 11. Now remove the load of I A_VBUS_RATED as a step decrease, checking that VBUS does not go outside the limits VA_VBUS_TRNS_LO or VA_VBUS_TRNS_HI as appropriate, over the next TAVG_VBUS (1s). 12. PET detaches (no capacitive, resistive or current loading on VBUS and data lines not pulled up). 13. Wait TTST_MAINT (10s) to allow maintained session to finish, and to allow disconnection to be recognized. End of Test. 30 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.5 A-UUT Bypass Capacitance Purpose Applies to Description Test setup To verify OTG A-device or EH VBUS bypass capacitance (CA_VBUS and/or CADP_VBUS) OTG A-device, EH A-ports Uses ADP to measure the A-UUT capacitance. Test setup 1 or 2 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist E9, ADP19, T6 6.6.5.1 Test procedure 1. The user enters into the PET: whether the UUT supports sessions (no test required if not). whether the UUT is an OTG A-device or an EH. whether the UUT is ADP capable on downstream facing port. whether the UUT is capable of SRP. 2. Get VBUS turned on, using the method described in Section 6.6.1. 3. Wait for almost TB_SVLD_BCON max (1s 0.1sec = 0.9sec), then connect PET by using D+ pull-up. 4. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). 5. Check that UUT enumerates PET successfully (up to setting configuration 1) within TTST_CONFIG (30s) of end of reset. The PET responds as the test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 1, to indicate that otg_vbus_off shall be set. If the UUT does not support HNP Polling, the PET will not set its HNP support bit. 6. 1s after being configured, the PET detaches (no capacitive, resistive or current loading on VBUS and data lines not pulled up). 7. Check that VBUS goes below VOTG_SESS_VLD min within TTST_VBOFF (5s) (ADP was also required to be disabled by the otg_vbus_off flag). 8. Use ADP circuit to evaluate capacitance using rise time. Do this within 1s of VBUS going below VOTG_SESS_VLD min. 9. Check that no ADP probe is received for the next 2s. If it is the test is invalidated. 10. Reattach10F capacitor and 10k pull-down resistor to VBUS. 11. Less than TTST_NOADP min (5s 1s = 4s) after VBUS went below VOTG_SESS_VLD min, check that it is still below VOTG_SESS_VLD min. 12. Check the A-UUTs capacitance is greater than CA_VBUS/CADP_VBUS min (1F). Where the AUUT is ADP-capable check that the capacitance is less than or equal to CADP_VBUS max (6.5F). 13. Wait TTST_NOADP max (6s) from VBUS going off in step 7 to allow otg_vbus_off to be cancelled. End of Test. 31 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.6 A-UUT SRP Purpose Applies to Description This test will check that the A-device responds to SRP requests, both before and after a session. SRP-capable OTG A-devices and EH A-ports Plug in the A-plug, wait for VBUS to rise and then fall check that this occurs within the correct times. Generate SRP and check the response from the AUUT is within limits. Note: As we are testing SRP functionality, it is not necessary to enumerate at more than one speed. For simplicity the PET will behave as a FS device during this test. Test setup 1 or 2 (see Section 0) Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist T1, T2, SRP3, SRP5, T4 6.6.6.1 Test procedure 1. The user enters into the PET: whether the UUT supports sessions (no test required if not). whether the UUT is an OTG A-device or an EH. whether the UUT is ADP capable on downstream facing port. whether the UUT is capable of SRP. Get VBUS turned on, using the method described in Section 6.6.1. Wait for almost TB_SVLD_BCON max (1s 0.1sec = 0.9sec) from VBUS reaching VOTG_SESS_VLD max, then connect PET by using D+ pull-up. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). Check that UUT enumerates PET successfully (up to setting configuration 1) within TTST_CONFIG (30s) of end of reset. The PET responds as the test device (VID=0x1A0A, PID=0x0200). If the UUT does not support HNP Polling, the PET will not set its HNP support bit. Check that session is ended, (i.e. VBUS goes below VOTG_SESS_VLD max (4V)) within TTST_MAINT max (10.1s). Immediately turn off D+ pull-up. Check that VBUS goes below VOTG_VBUS_LKG max (0.7V) within TSSEND_LKG max (1s, but allow 2s here as this is not the definitive test for this value) of going below VOTG_SESS_VLD max. (Note that accurate measurement of TSSEND_LKG is performed by a separate dedicated test). Wait TB_SSEND_SRP (1.5s). Check that VBUS is not turned on before end of SRP pulse. PET applies minimum width SRP pulse on D+, of TB_DATA_PLS min (5ms). Check that VBUS reaches VOTG_SESS_VLD min (0.8V) within TA_SRP_RSPNS max (4.9s) from rising edge of SRP pulse, and then reaches VA_VBUS_AVG_LO (4.4V) within a further TA_VBUS_RISE (100ms). Report actual times and comment on them, as the Supplement recommends better response time than specified. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 32 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 12. Take D+ high after almost TB_SVLD_BCON max (1s 0.1sec = 0.9sec). 13. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). 14. Check that UUT enumerates PET successfully (up to setting configuration 1) within TTST_CONFIG (30s). The PET responds as the test device (VID=0x1A0A, PID=0x0200). If the UUT does not support HNP Polling, the PET will not set its HNP support bit. 15. Remove any termination on data lines. 16. Wait TTST_MAINT max (10.1s) to allow A-UUT to turn off VBUS. 17. Repeat test steps 9-15 using value for SRP pulse length in step 10 of TB_DATA_PLS max (10ms). End of Test. 33 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.7 A-UUT HNP Purpose Applies to Description This test will check that the OTG A-device responds to HNP requests, and hands back control after a session. OTG A-device This test confirms the correct operation of the UUT during HNP. The test is performed in five passes: Full Speed with min TA_AIDL_BDIS High Speed with min TA_AIDL_BDIS Full Speed with max TA_AIDL_BDIS High Speed with max TA_AIDL_BDIS Full Speed with PET simulating OTG V1.3 The same parameters are checked in each case. Test setup 1 (see Section 0) Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist M6, DF5, DF9, DF11, DF14, HNP1-10, T12-T15 6.6.7.1 Test Procedure 1. Get VBUS turned on, using the method described in Section 6.6.1. 2. Wait for almost TB_SVLD_BCON max (1s 0.1sec = 0.9sec), then connect PET by using D+ pull-up. 3. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). 4. Check that UUT enumerates PET successfully (up to setting configuration 1), as a Full Speed device, within TTST_CONFIG (30s) of end of reset. The PET responds as the test device (VID=0x1A0A, PID=0x0200). Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. For A-UUT which supports HNP Polling (Steps 5 and 6): 5. Check during the first period of the configured state that the PET (B-device) is HNP-polled at every THOST_REQ_POLL (1-2s). Both too fast and too slow will be flagged as an error. After two polls with host request flag set to 0, the flag is set to 1, so that on the third poll, the OTG Adevice under test sees the flag as a 1. 6. Check that the PET is suspended within THOST_REQ_SUSP (2s) of the host request flag having been detected as a 1, and that its b_hnp_enable has been set to 1. For A-UUT which does not support HNP Polling (Step 7): 7. Check that the PET is suspended within THOST_REQ_POLL max plus THOST_REQ_SUSP max (4s total) of being configured, and that its b_hnp_enable has been set to 1. 8. After 4ms remove D+ pull-up. [In a further run of this test, TA_AIDL_BDIS is tested by waiting almost TA_AIDL_BDIS (200ms minus 2ms = 198ms) to ensure that the A-device under test does not end the session prematurely. 9. Wait TLDIS_DSCHG x 4 (25s x 4 = 100s). 10. Check that UUT turns on D+ within TA_BDIS_ACON max (150ms). 34 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 11. Validate D+ high for continuous TB_ACON_DBNC (2.5s). 12. After slightly less than TB_ACON_BSE0 (150ms 10ms = 140ms), reset and enumerate the UUT. Check the content of OTG descriptor (both in configuration descriptor and separately) but dont configure. 13. Stop all bus activity. 14. Check that UUT removes D+ TA_BIDL_ADIS (155-200ms) later. 15. Turn on D+ pull-up after slightly less than TB_SVLD_BCON max (1s 0.1s = 0.9s). 16. Check that UUT applies reset after TA_BCON_LDB min (100ms) and within TA_BCON_ARST (30s). 17. PET disconnects D+ pull-up resistor. 18. Wait 2s to allow disconnection to be detected. 19. Repeat 1-18 at High Speed, with wait time in step 8 at 4ms. 20. Repeat 1-18 at Full Speed, with wait time in step 8 at 199.5ms. 21. Repeat 1-18 at High Speed, with wait time in step 8 at 199.5ms. 22. Repeat 1-18 at Full Speed, with wait time in step 8 at 4ms, but declaring the test device as OTG V1.3. Check that we get SetFeature(a_hnp_support) during enumeration. End of Test. 35 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.8 A-UUT ADP Purpose Applies to Description This test will check that the ADP-capable A-device generates ADP probes correctly. ADP-capable A-device This test shows that the A-device is performing ADP probing and that it can successfully recognize a B-device with minimum VBUS capacitance being plugged in, and also that it will ignore a change in capacitance below C ADP_THR min. As we are testing ADP functionality, it is not necessary to enumerate at more than one speed. For simplicity the PET will behave as a FS device during this test. Test setup 1 or 2 (see Section 0) Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist ADP1-3, ADP6, ADP22-25, ADP27-29 6.6.8.1 Test Procedure 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. Disconnect 10F capacitance and 10k resistance from VBUS. 3. Check that VBUS comes on within 5s. 4. Check that VBUS is below VOTG_SESS_VLD min within TA_WAIT_BCON max (30s, or as specified by vendor) plus TA_SSEND_PRB max (100ms), i.e. within a total of 30.1s. Wait only until it is below VOTG_SESS_VLD min. In practice, this fall in VBUS may result from the start of the discharge phase of the first ADP probe. 5. Examine the next 11 ADP probes, as follows in steps 6-8, collecting data for validation. 6. Check VBUS goes to VADP_DSCHG (0.15V) or below, for each probe. 7. Detect VBUS rising through 0.25V and then through 0.5V, record time in between, and also record point in time it passes 0.5V, for each probe. This gives an estimate of the size of TADP_RISE. 8. Check that VBUS reaches at least VADP_PRB min (0.6V) and check that it does not exceed VADP_PRB max (0.75V), for each probe. 9. Validate each of the 10 periods TA_ADP_PRB (1.35 - 1.85s) or (0.675 0.925s), and check that the cycle to cycle jitter TADP_PRB_JTR (5%) is within limits. 10. On first test pass, connect CADP_VBUS max (6.5F) across VBUS. On second test pass, connect CADP_THR max (900nF) across VBUS. Ensure that this is connected between probes. (This should cause PET to be detected by next ADP probe). 11. Check that VBUS goes to VADP_DSCHG (0.15V) or below within 2s. 12. Detect VBUS rising through 0.25V and then through 0.5V, record time in between. 13. On the first test pass, from the previous and the new values of rise time we can estimate IADP_SRC (1.1 - 1.65mA). Check that the difference in ramp time lies between 885s and 1626s. On second test pass, just report times. 14. Check that VBUS reaches VOTG_SESS_VLD (0.8V) within TA_VBUS_ATT (200ms) from the end of the probe. 15. Wait for VBUS to reach 4.4V. (Don't validate TA_VBUS_RISE here this is done in VBUS tests). 36 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 16. Connect D+ resistor. 17. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). 18. Check that UUT enumerates PET (up to setting configuration 1) successfully within TTST_CONFIG (30s). The PET responds as test device (VID=0x1A0A, PID=0x0200). If the UUT does not support HNP Polling, the PET will not set its HNP support bit. 19. After 1s of configured state, turn off D+, and (on first pass only) disconnect V BUS capacitance. 20. Check that VBUS is turned off within TA_WAIT_BCON max (30s, or as specified by vendor). 21. In pass 1 only, wait for VBUS to remain off for 5s (in pass 1 it should come on again and remain on for TA_WAIT_BCON). 22. Repeat steps 5 to 21 using capacitance value of CADP_THR max (900nF) in step 10. 23. Check that an ADP probe is performed within TA_SSEND_PRB (100ms) of VBUS going off. 24. Wait for a further ADP probe to be performed. 25. Connect a further 150nF across V BUS (in addition to the 900nF already connected). 26. Check that VBUS is not turned on. This checks CADP_THR min. 27. Change capacitance on VBUS back to 10F, with 10k pull-down resistance. 28. Wait 5s to allow the capacitance change to switch on V BUS ready for next test. End of Test. 37 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.9 A-UUT Leakage Purpose Applies to Description Test setup This test will measure IVBUS_LKG_SRC max and TSSEND_LKG. All Targeted Hosts This test performs SetFeature(otg_vbus_off) to create the conditions required to check the values of TSSEND_LKG, IVBUS_LKG_SRC and ROTG_VBUS. Test setup 1 or 2 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist SRP1, SRP2, ADP18, T5 6.6.9.1 Test Procedure 1. The user enters into the PET: whether the UUT supports sessions (no test required if not). whether the UUT is an OTG A-device or an EH. 2. 3. 4. 5. 6. 7. 8. whether the UUT is ADP capable on downstream facing port. whether the UUT is capable of SRP. Wait for VBUS to go off and remain off for 5s. Disconnect bypass capacitance from VBUS. Get VBUS turned on, using the method described in Section 6.6.1. Wait for almost TB_SVLD_BCON max (1s 0.1s = 0.9s). Connect PET by using D+ pull-up. Check that a bus reset (SE0) occurs after TA_BCON_LDB min (100ms), but within TA_BCON_ARST max (30s). Check that UUT enumerates PET successfully (up to setting configuration 1) within TTST_CONFIG (30s). The PET responds as test device (VID=0x1A0A, PID=0x0200), with bcdDevice in the Device Descriptor set to 0x0001. Bit 0 represents the requirement to turn VBUS off if we disconnect during the configured period. If the UUT does not support HNP Polling, the PET will not set its HNP support bit. Wait 1s in the configured state, responding to any requests, then take D+ low and simultaneously disconnect the pull-down resistance, from VBUS. Check that VBUS goes below VOTG_SESS_VLD max (4V) within TTST_VBOFF (5s - required by test device and feature bit specification). Monitor decay and measure time from VOTG_SESS_VLD max (4V) to VOTG_VBUS_LKG (0.7V). Check that this occurs within TSSEND_LKG max (1s). Wait 1s, then connect 2k pull-down resistor to VBUS. Wait 1s. Check that voltage on VBUS is below 140mV. This confirms that IVBUS_LKG_SRC is no more than 70A. Disconnect 2k pull-down resistor. Connect 2k2 pull-up resistor, sourced from 0.8V, to V BUS. Wait 1s. Check that voltage on VBUS is greater than or equal to 0.656V. This proves that ROTG_VBUS is greater than or equal to 10k. 9. 10. 11. 12. 13. 14. 15. 16. 17. 18. 38 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 19. Disconnect 2k2 pull-up resistor, and reconnect 10F capacitor and 10k pull-down resistor to VBUS. 20. Wait TTST_NOADP max (6s) to allow feature bit and special V BUS condition to be cleared. End of Test. 39 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.10 ADP-Capable OTG A-device State Transition Test Purpose Applies to Description Test setup This test verifies the UUT follows the correct transitions in the specified state diagrams. ADP-capable OTG A-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 1 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist ST3 6.6.10.1 Test Procedure START -> a_idle resulting from id/. (This was done in Power-Up Test). First perform following test at Full Speed. 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up; ID pin is connected to ground. 2. If VBUS is on, check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). a_idle -> a_wait_vrise resulting from a_srp_det. 3. PET checks for ADP probe within TA_ADP_PRB (1.85s). 4. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_vfall resulting from id, OR a_wait_vrise -> a_wait_bcon -> a_wait_vfall resulting from id. 5. Immediately VBUS reaches 0.8V during the ADP PET disconnects ID from ground. a_wait_vfall -> a_idle -> b_idle resulting from a_wait_vfall_tmout. 6. Wait TSSEND_LKG max (1s). 7. Check that VBUS is below VOTG_SESS_VLD min (0.8V). b_idle -> a_idle resulting from id/. 8. Connect ID pin to ground. a_idle -> a_wait_vrise resulting from adp_change. 9. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. 40 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 10. PET checks for ADP probe within TA_ADP_PRB max (1.85s). 11. PET changes the VBUS connected capacitance to 1F, leaving the pull-down resistor of ROTG_VBUS min (10k) connected to VBUS, to allow detection by ADP probe from UUT. 12. PET checks for further ADP probe within TA_ADP_PRB max (1.85s). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 13. Check VBUS reaches VOTG_SESS_VLD max (4V) within TA_VBUS_ATT max (200ms) of end of last ADP probe. a_wait_bcon -> a_wait_vfall -> a_idle resulting from a_wait_bcon_tmout and a_wait_vfall_tmout. 14. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TA_WAIT_BCON max (30s or as redefined by vendor) plus TSSEND_LKG max (1s) of VBUS reaching VOTG_SESS_VLD max. 15. Check that UUT performs an ADP probe within TA_ADP_PRB of VBUS going below VOTG_SESS_VLD min. a_idle -> a_wait_vrise resulting from adp_change. 16. PET changes the VBUS connected capacitance to 10F, leaving the pull-down resistor of ROTG_VBUS min (10k) connected, to allow detection by ADP probe from UUT. 17. Check that UUT performs a further ADP probe within TA_ADP_PRB max (1.85s). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 18. Check VBUS reaches VOTG_SESS_VLD max (4V) within TA_VBUS_ATT max (200ms) of end of last ADP probe. a_wait_bcon -> a_host resulting from b_conn. 19. PET connects using D+. 20. Check that UUT performs bus reset within TA_BCON_ARST max (30s) 21. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0). If the UUT does not support HNP Polling, the PET will not set its HNP support bit. a_host -> a_wait_bcon -> a_host resulting from b_conn/ followed by b_conn. 22. 23. 24. 25. 26. PET disconnects D+ PET waits less than TA_WAIT_BCON min (1.1s minus 0.1s = 1s). PET connects D+. Check that UUT performs bus reset within TA_BCON_ARST max (30s) Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. ). If the UUT does not support HNP Polling, the PET will not set its HNP support bit. a_host -> a_wait_vfall -> a_idle -> b_idle resulting from id and a_wait_vfall_tmout. 27. PET disconnects D+ and ID. 41 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 28. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 29. Connect ID pin. 30. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. a_idle -> a_wait_vrise resulting from a_srp_det. 31. Check that UUT performs an ADP probe within TA_ADP_PRB. 32. PET raises D+, waits 7.5ms (typ. TB_DATA_PLS), then lowers D+. a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 33. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 34. PET connects D+. 35. Check that UUT performs bus reset within TA_BCON_ARST max (30s) 36. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. a_host -> a_suspend resulting from a_bus_reqd/. 37. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set, and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET). a_suspend -> a_wait_vfall -> a_idle resulting from a_aidl_bdis_tmr. (Nothing to test as no maximum time specified (transition is optional) a_suspend -> a_wait_vfall -> a_idle -> b_idle resulting from id. 38. PET disconnects D+ and ID. 39. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 40. Connect ID pin. 41. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. a_idle -> a_wait_vrise resulting from a_srp_det. 42. Check that UUT performs an ADP probe within TA_ADP_PRB. 42 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 43. PET raises D+, waits 7.5ms (typ. TB_DATA_PLS), then lowers D+. a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 44. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 45. PET connects D+. 46. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 47. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. a_host -> a_suspend resulting from a_bus_reqd/. 48. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set, and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET. a_suspend -> a_peripheral resulting from b_conn/. 49. PET disconnects D+. 50. Check that UUT connects D+ within TA_BDIS_ACON max (150ms). 51. Check that PET can reset and enumerate the UUT. a_peripheral -> a_wait_bcon resulting from a_bidl_adis_tmout. 52. PET suspends bus activity. 53. Check that UUT disconnects D+ within TA_BIDL_ADIS max (200ms). a_wait_bcon -> a_host resulting from b_conn. 54. PET connects D+. 55. Check that UUT performs bus reset within TA_BCON_ARST max (30s) 56. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. a_host -> a_suspend resulting from a_bus_reqd/. 57. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set, and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET. a_suspend -> a_peripheral resulting from b_conn/. 58. PET disconnects D+. 59. Check that UUT connects D+ within TA_BDIS_ACON max (150ms) 43 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 60. Check that PET can reset and enumerate the UUT. a_peripheral -> a_wait_vfall -> a_idle -> b_idle resulting from id. 61. PET disconnects ID. 62. D+ should go low at this point. Impractical to test. 63. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 64. Connect ID pin. 65. Wait 5s to allow the ID pin change to be detected. Repeat complete test at High Speed. 6.6.10.2 Paths not tested: Any path resulting from a_bus_drop or a_bus_drop/ (not practical). Any path resulting from a_wait_vrise_tmout (not practical). Any path resulting from a_vbus_vld/ (not practical). Any path resulting from a_bus_req/ (not practical). a_suspend -> a_wait_bcon. a_suspend -> a_wait_vfall -> a_idle resulting from a_aidl_bdis_tmr (Nothing to test as no maximum time specified (transition is optional). 44 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.11 Non ADP-Capable OTG A-device State Transition Test Purpose Applies to Description Test setup This test verifies the UUT follows the correct transitions in the specified state diagrams. Non ADP-capable OTG A-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 1 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist ST3 6.6.11.1 Test Procedure START -> a_idle resulting from id/. (This was done in Power-Up Test). First perform following test at Full Speed. 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up; ID pin is connected to ground. 2. If VBUS is on, check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). a_idle -> a_wait_vrise resulting from a_srp_det. 3. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_vfall resulting from id, OR a_wait_vrise -> a_wait_bcon -> a_wait_vfall resulting from id. 4. PET disconnects ID from ground. a_wait_vfall -> a_idle -> b_idle resulting from a_wait_vfall_tmout. 5. Wait TSSEND_LKG max (1s). 6. Check that VBUS is below VOTG_SESS_VLD min (0.8V). b_idle -> a_idle resulting from id/. 7. Connect ID pin to ground. a_idle -> a_wait_vrise resulting from a_srp_det. 8. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. 9. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 45 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 10. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s) of SRP pulse. a_wait_bcon -> a_wait_vfall -> a_idle resulting from a_wait_bcon_tmout and a_wait_vfall_tmout. 11. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TA_WAIT_BCON max (30s or as redefined by vendor) plus TSSEND_LKG max (1s) of VBUS reaching VOTG_SESS_VLD max. 12. Wait TB_SSEND_SRP min (1.5s). a_idle -> a_wait_vrise resulting from a_srp_det. 13. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 14. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s) of SRP pulse. a_wait_bcon -> a_host resulting from b_conn. 15. PET connects using D+. 16. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 17. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. If the UUT does not support HNP Polling, the PET will not set its HNP support bit. a_host -> a_wait_bcon -> a_host resulting from b_conn/ followed by b_conn. 18. 19. 20. 21. 22. PET disconnects D+. PET waits less than TA_WAIT_BCON min (1.1s minus 0.1s = 1s). PET connects D+. Check that UUT performs bus reset within TA_BCON_ARST max (30s). Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. If the UUT does not support HNP Polling, the PET will not set its HNP support bit. a_host -> a_wait_vfall -> a_idle -> b_idle resulting from id and a_wait_vfall_tmout. 23. PET disconnects D+ and ID. 24. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 25. Connect ID pin to ground. 26. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. a_idle -> a_wait_vrise resulting from a_srp_det. 46 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 27. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 28. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 29. PET connects D+. 30. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 31. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. a_host -> a_suspend resulting from a_bus_reqd/. 32. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET. a_suspend -> a_wait_vfall -> a_idle resulting from a_aidl_bdis_tmr. (Nothing to test as no maximum time specified (transition is optional)). a_suspend -> a_wait_vfall -> a_idle -> b_idle resulting from id. 33. PET disconnects D+ and ID. 34. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 35. Connect ID pin to ground. 36. Wait for VBUS to remain off for 5s, as behavior after changing state of ID pin is not well defined. a_idle -> a_wait_vrise resulting from a_srp_det. 37. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 38. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 39. PET connects D+. 40. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 41. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. 47 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 a_host -> a_suspend resulting from a_bus_reqd/. 42. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set, and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET. a_suspend -> a_peripheral resulting from b_conn/. 43. PET disconnects D+. 44. Check that UUT connects D+ within TA_BDIS_ACON max (150ms) 45. Check that PET can reset and enumerate the UUT. a_peripheral -> a_wait_bcon resulting from a_bidl_adis_tmout. 46. PET suspends bus activity. 47. Check that UUT disconnects D+ within TA_BIDL_ADIS max (200ms). a_wait_bcon -> a_host resulting from b_conn. 48. PET connects D+. 49. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 50. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. a_host -> a_suspend resulting from a_bus_reqd/. 51. After being configured, PET responds to any HNP-Poll with Host Request flag = 1. It checks that its b_hnp_enable flag is set, and that the UUT suspends the PET within THOST_REQ_POLL max (2s) plus THOST_REQ_SUSP max (2s), a total of 4s, of configuring the PET. a_suspend -> a_peripheral resulting from b_conn/. 52. PET disconnects D+. 53. Check that UUT connects D+ within TA_BDIS_ACON max (150ms). 54. Check that PET can reset and enumerate the UUT. . a_peripheral -> a_wait_vfall -> a_idle -> b_idle resulting from id. 55. PET disconnects ID from ground. 56. D+ should go low at this point. Impractical to test. 57. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TSSEND_LKG max (1s). b_idle -> a_idle resulting from id/. 58. Connect ID pin to ground. 59. Wait 5s to allow the ID pin change to be detected. Repeat complete test at High Speed. 48 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.11.2 Paths not tested: Any path resulting from a_bus_drop or a_bus_drop/ (not practical). Any path resulting from a_wait_vrise_tmout (not practical). Any path resulting from a_vbus_vld/ (not practical). Any path resulting from a_bus_req/ (not practical). a_suspend -> a_wait_bcon. a_suspend -> a_wait_vfall -> a_idle resulting from a_aidl_bdis_tmr (Nothing to test as no maximum time specified (transition is optional)). 49 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.12 ADP-Capable EH State Transition Test Purpose Applies to Description Test setup This test verifies the UUT follows the correct transitions in the specified state diagrams. ADP-capable EHs PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 2 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist ST2 6.6.12.1 Test Procedure START -> a_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. If VBUS is on, check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). a_idle -> a_wait_vrise resulting from adp_change. 3. PET checks for ADP probe. 4. PET changes capacitance across VBUS to 1F, leaving the pull-down resistor of ROTG_VBUS min (10k) connected, to allow detection by ADP probe from UUT. 5. PET checks for further ADP probe. a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 6. Check VBUS reaches VOTG_SESS_VLD max (4V) within TA_VBUS_ATT max (200ms) of end of last ADP probe. a_wait_bcon -> a_wait_vfall -> a_idle resulting from a_wait_bcon_tmout and a_wait_vfall_tmout. 7. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TA_WAIT_BCON max (30s or as re-defined by vendor) plus TSSEND_LKG max (1s). 8. Check that UUT performs an ADP probe within TA_ADP_PRB. a_idle -> a_wait_vrise resulting from adp_change. 9. PET checks for ADP probe. 50 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 10. PET changes capacitance across VBUS back to 10F, leaving the pull-down resistor of ROTG_VBUS min (10k) connected, to VBUS to allow detection by ADP probe from UUT. 11. PET checks for further ADP probe. a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 12. Check VBUS reaches VOTG_SESS_VLD max (4V) within TA_VBUS_ATT max (200ms) of end of last ADP probe. a_wait_bcon -> a_wait_vfall -> a_idle resulting from a_wait_bcon_tmout and a_wait_vfall_tmout. 13. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TA_WAIT_BCON max (30s or as re-defined by vendor) plus TSSEND_LKG max (1s). 14. Check that UUT performs an ADP probe within TA_ADP_PRB. a_idle -> a_wait_vrise resulting from a_srp_det. 15. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 16. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 17. PET connects D+. 18. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 19. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. a_host -> a_wait_bcon -> a_wait_vfall -> a_idle resulting from b_conn/, a_wait_bcon_tmout and a_wait_vfall_tmout. 20. PET disconnects D+. 21. Wait 2s for this disconnection to be detected. Repeat complete test at High Speed. 6.6.12.2 Paths not tested: Any path resulting from a_bus_drop or a_bus_drop/ (not practical). Any path resulting from a_wait_vrise_tmout (not practical). Any path resulting from a_vbus_vld/ (not practical). Any path resulting from a_bus_req or a_bus_req/ (not practical). a_suspend -> a_wait_bcon. 51 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.13 Non ADP-Capable EH State Transition Test Purpose Applies to Description Test setup This test verifies the UUT follows the correct transitions in the specified state diagrams. Non ADP-capable EHs. PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 2 (see Section 0) Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist ST2 6.6.14 Test Procedure START -> a_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. If VBUS is on, check for VBUS off within TA_WAIT_BCON max (30s, or as specified by vendor). a_idle -> a_wait_vrise resulting from a_srp_det. 3. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 4. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_wait_vfall -> a_idle resulting from a_wait_bcon_tmout and a_wait_vfall_tmout. 5. Check that VBUS goes below VOTG_SESS_VLD min (0.8V) within TA_WAIT_BCON max (30s or as re-defined by vendor) plus TSSEND_LKG max (1s). 6. Wait TB_SSEND_SRP min (1.5s). a_idle -> a_wait_vrise resulting from a_srp_det. 7. PET generates SRP pulse of 7.5ms (typ. TB_DATA_PLS). a_wait_vrise -> a_wait_bcon resulting from a_vbus_vld. 8. Check VBUS reaches VOTG_SESS_VLD max (4V) within TB_SRP_FAIL max (6s). a_wait_bcon -> a_host resulting from b_conn. 52 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 9. PET connects D+. 10. Check that UUT performs bus reset within TA_BCON_ARST max (30s). 11. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG max (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200), with bcdDevice bit 0 set to a 0. a_host -> a_wait_bcon -> a_wait_vfall -> a_idle resulting from b_conn/, a_wait_bcon_tmout and a_wait_vfall_tmout. 12. PET disconnects D+. 13. Wait 2s to allow disconnection to be detected. Repeat complete test at High Speed. 6.6.14.1.1 Paths not tested: Any path resulting from a_bus_drop or a_bus_drop/ (not practical). Any path resulting from a_wait_vrise_tmout (not practical). Any path resulting from a_vbus_vld/ (not practical). Any path resulting from a_bus_req or a_bus_req/ (not practical). a_suspend -> a_wait_bcon. 53 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.15 A-UUT "Device No Response" for connection timeout Purpose This test verifies that an A-UUT produces a device not connected or not responding error message when an A-UUT bus request occurs and it is connected to an PET programmed to act like a non-responsive device. All Targeted Hosts. Generate an SRP pulse, but then fail to connect to the A-UUT. Check that a suitable error message is generated. Test setup 1 or 2 (see Section 0) Applies to Description Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist Pass Criteria MSG1, MSG2, MSG3, MSG4 Message "Device no response" or similar is displayed on UUT 6.6.15.1 Test Procedure 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. Check that VBUS is below VOTG_SESS_VLD min within TA_WAIT_BCON max (30s, or as specified by vendor) of start of test. Wait only until it is below VOTG_SESS_VLD min. 3. Wait TB_SSEND_SRP min (1.5s) after VBUS is below VOTG_SESS_VLD min. 4. PET generates 7.5ms SRP pulse. 5. Wait for VBUS to reach VA_VBUS_AVG_LO min (4.4V). This should occur within TA_SRP_RSPNS max (4.9s) plus TA_VBUS_RISE max (100ms) from rising edge of SRP pulse, so consider the test to have failed if the voltage is not reached after 6s. 6. Wait 5s. 7. Display Message "Click OK when 'Device No Response' indication displayed on UUT". 8. If operator clicks OK before 30s elapses since VBUS went on, then UUT passes test. 9. If 30s elapses first, then UUT fails test. 10. PET leaves 10F capacitance and 10k pull-down resistance across VBUS. 11. Wait 2s. to allow disconnection to be recognized. End of Test. 54 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.16 A-UUT "Unsupported Device" Message Purpose This test verifies that an A-UUT produces a device non-supported error message when a device it doesnt recognize, and does not support HNP, connects to it. All Targeted Hosts Get VBUS turned on, and connect to the A-UUT. Get enumerated and respond as an unknown device not supporting HNP. Check that a suitable error message is generated. Test setup 1 (see Section 0) Applies to Description Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist Pass Criteria TPL5, MSG1, MSG2, MSG3, T3, T10 Message "Unsupported Device"or similar is displayed on UUT 6.6.16.1 Test Procedure 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. Get VBUS turned on, using the method described in Section 6.6.1. 3. Wait for almost TB_SVLD_BCON max (1s - 0.1s = 0.9s) from VBUS reaching VOTG_SESS_VLD max. 4. Connect PET using D+ pull-up. 5. Allow A-UUT to enumerate PET, responding with a VID / PID combination not on the TPL of the UUT and also with the OTG descriptor stating that it does not support HNP. 6. Start 30s timer when Device Descriptor is read. 7. Display Message "Click OK if 'Unsupported Device indication displayed on UUT". 8. If operator clicks OK before 30s timer expires, then UUT passes test. 9. If 30s elapses first, then UUT fails test. 10. PET disconnects by removing any termination on the data lines, but leaves a capacitance of 10F and a pull-down resistance of 10k connected across VBUS. 11. Wait 2s to allow disconnection to be detected. End of Test. 55 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.6.17 A-UUT "Device No Response" for HNP enable Purpose This test verifies that an A-UUT offers the opportunity to an unsupported OTG device having HNP-capability, to become host. It also verifies that it produces a 'Device not Responding' error message when such a device connects, indicates HNP support, but STALLs the SetFeature(b_hnp_enable) request. All Targeted Hosts Connect to the A-UUT, get enumerated and indicate that HNP is supported. Stall the SetFeature(b_hnp_enable) request. Check that a suitable error message is generated. Test setup 1 (see Section 0) Applies to Description Test setup Preconditions ,,A-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. A capacitance of 10F and a pull-down resistance of 10k are connected across VBUS. Checklist Pass Criteria MSG1-4, T11 Message "Device no response" or similar is displayed on UUT 6.6.17.1 Test Procedure 1. Start with cable still attached, PET applying 10F capacitance and 10k pull-down resistance between VBUS and ground, data lines not pulled up. 2. Get VBUS turned on, using the method described in Section 6.6.1. 3. Wait for almost TB_SVLD_BCON max (1s - 0.1s = 0.9s) from VBUS reaching VOTG_SESS_VLD max. 4. Connect using D+ pull-up. 5. Allow A-UUT to enumerate PET, responding with a VID/PID combination not on the TPL of the UUT, and also with the OTG descriptor stating that it supports HNP. 6. Respond to GetStatus(OTG) requests with Host Request Flag Set to a 1. 7. Check that A-UUT sends SetFeature(b_hnp_enable), but respond to it with a STALL, and start 30s timer. 8. Display Message "Click OK if 'Device No Response' indication displayed on UUT". 9. If operator clicks OK before 30s timer expires, then UUT passes test. 10. If 30s elapses first, then UUT fails test. 11. PET disconnects by removing any termination on the data lines, but leaves a capacitance of 10F and a pull-down resistance of 10k connected across VBUS. 12. Wait 2s to allow disconnection to be detected. End of Test. 56 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7 B-UUT Tests The electrical tests in this section test only a partial list of all the possible electrical parameters. The tests should not be considered as a full validation test plan. It is the responsibility of the manufacturer of a device to verify compliance of all relevant electrical parameters specified in [USB2.0], [USBCables2.0], [USB 3.0] and [USBOTG&EHv2.0]. 6.7.1 B-UUT Initial Power-up Test Purpose To ensure that the OTG B-device or Peripheral-only B-device has been powered up and is ready for the subsequent tests. All following B-device tests assume that this test has been run first. In the case of an ADP capable device, this test also confirms functional startup sequence. EH B-port, OTG B-device, Peripheral-only B-device This test will confirm that the correct cable has been attached, and arrange for the test operator to switch the UUT on. In the case of an ADP capable device, it will first get the UUT switched off. It will also confirm the commencement of ADP probing. Test setup 1 or 3 (see Section 0) Applies to Description Test Setup Preconditions None Checklist ADP13 6.7.1.1 Test Procedure 6.7.1.1.1 Part 1 Common to All B-UUT Types 1. The user enters into the PET: whether the UUT is capable of ADP. The test sequence followed depends on the UUT type: OTG B-device or peripheral-only B-device capable of ADP. OTG B-device or peripheral-only B-device not capable of ADP. 6.7.1.1.2 Part 2 For OTG B-device or peripheral-only B-device UUT capable of ADP 2. Operator: Ensure UUT attached using Special Test Cable A (Test Setup 1 Section 6.3.1 for an OTG B-device, Test Setup 3 Section 6.3.3 for a Peripheral-only B-device/EH B-port) or, where the device does not have a Micro-AB or Micro-B receptacle, a suitable alternative. 3. UUT is either powered or is not powered. PET is not applying V BUS, and not applying capacitance between VBUS and ground, ID pin is not connected to ground. 4. Operator: Turn UUT off, if not already off. 5. Operator: Turn UUT on. 6. Check that UUT performs an ADP probe within TPWRUP_RDY (30s or as specified by vendor). 7. To check probe, check that V BUS goes below 0.3V and then rises above 0.5V within 10ms. 8. After the first probe check that either a further probe (or probes) is performed, or that D+ goes high. Wait here till D+ goes high or TPWRUP_RDY times out. 57 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 9. 10. 11. 12. Check that D+ stays high for at least 5ms. Check that D+ goes low within 10ms of start of pulse. Check ADP probe is not performed for TB_SRP_FAIL min (5s) after start of D+ (SRP) pulse. Check that ADP probe is performed within TB_SRP_FAIL max plus TB_ADP_PRB max (6.0 + 2.6 = 8.6s) after start of D+ (SRP) pulse. 13. Now ready for any other B-UUT test. 6.7.1.1.3 Part 2 For OTG B-device or Peripheral-only B-device UUT not capable of ADP 2. Operator: Ensure UUT attached using Special Test Cable A ((Test Setup 1 Section 6.3.1 for an OTG B-device, Test Setup 3 Section 6.3.3 for a Peripheral-only B-device/EH B-port) or, where the device does not have a Micro-AB or Micro-B receptacle, a suitable alternative. 3. UUT is either powered or is not powered. PET is not applying VBUS, and not applying capacitance between VBUS and ground, ID pin is not connected to ground. 4. Operator: Turn UUT on, if not already on. 5. PET applies CADP_VBUS max (6.5F) and a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS. 6. Check that D+ goes high within TPWRUP_RDY (30s). 7. Turn off VBUS and disconnect capacitance and pull-down resistance from VBUS. 8. Wait 5s to allow disconnection to be detected. 9. Now ready for any other B-UUT test. 6.7.1.1.4 Following Tests From now on all test sequences must start and finish with the PET holding VBUS off, and no capacitance or pull-down resistance connected to VBUS. This allows the tests to be performed in any sequence. As the tests are all on B-UUTs, the ID pin is not connected to ground in any test (except as appropriate in state transition tests). 58 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.2 B-UUT VBUS Voltage and Current Measurements Purpose Applies to Description To verify VB_VBUS min and max, IB_UNCFG and the declared value of bMaxPower. EH B-port, OTG B-device, Peripheral-only B-device Test measures the unconfigured and configured current at VB_VBUS min and VB_VBUS max. It also tests to ensure that the configured current is less than bMaxPower (part of the bmAttributes field of the Standard Configuration Descriptor as defined in [USB2.0] or [USB 3.0]). Test setup 1 or 3 (see Section 0) Test Setup Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. It is expected that the value of bMaxPower is known from [USBOTG&EHChecklist]. Checklist E11, E12, M5 6.7.2.1 Test procedure 1. The user enters the value for bMaxPower into the PET, which can be from 0mA to 500mA. 2. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 3. Check that UUT is not sourcing VBUS. 4. PET applies CADP_VBUS max (6.5F) and a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to VB_VBUS min (4.0V) (this is also VOTG_SESS_VLD max), plus an allowance for special cable resistance at a current of bMaxPower declared by the vendor. 5. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 6. Wait 100ms then apply a bus reset to the B-UUT. 7. Check current drawn <= IB_UNCFG (2.5mA) averaged over 1s (TAVG_VBUS). 8. Enumerate, checking for valid responses, check that the declared bMaxPower matches that specified on checklist. SetConfiguration(1). 9. Check VBUS current <= bMaxPower. 10. Change VBUS voltage to VB_VBUS max (6.0V). 11. Wait TA_BCON_LDB (100ms) then issue a bus reset to the B-UUT. 12. Check IB_UNCFG <= 2.5mA. 13. Enumerate, checking for valid responses, then SetConfiguration(1). 14. Check VBUS current <= bMaxPower. 15. Turn off VBUS and disconnect capacitance and pull-down resistance from VBUS. 16. Wait 5s to allow disconnection to be detected. 17. PET applies CADP_VBUS max (6.5F) and a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to slightly less than VOTG_SESS_VLD min (0.8V minus .02V = 0.78V). 18. Check that neither D+ nor D- goes high within the next TB_SVLD_BCON max (1s). If D+ does goes high (owing to ADP interpreting VBUS as a capacitance change and performing SRP), then check that it goes off within 10ms. 19. Turn off VBUS and disconnect capacitance and pull-down resistance from VBUS. 20. Wait 5s to allow disconnection to be detected. End of test. 59 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.3 B-UUT Bypass Capacitance Purpose Applies to Description Test Setup To verify OTG B-device , EH B-port or peripheral-only B-device VBUS bypass capacitance (CRPB and/or C ADP_VBUS ) EH B-port, OTG B-device, Peripheral-only B-device Uses a technique similar to ADP to measure the B-UUT bypass capacitance. Test setup 1 or 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist E14, ADP19 6.7.3.1 Test procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. PET applies CADP_VBUS max (6.5F) and a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to 5V. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait 100ms then issue a bus reset to the B-UUT. 6. Enumerate, checking for valid responses, check that the declared bMaxPower matches that specified on checklist. SetConfiguration(1). 7. Turn off VBUS and disconnect capacitance from VBUS. 8. Wait 1s for VBUS to decay. 9. Disconnect pull-down resistance from VBUS. Use ADP circuit to evaluate capacitance using rise time. Note: The UUT should not perform any ADP probes within TB_ADP_DETACH min (3s) of VBUS going off, and should hold off doing any while the PET carries out simulated ADP probes. A check after the PET test ensures that this is the case, confirming that the PET measurements are valid. 10. If the B-UUT is ADP capable, check the B-UUTs capacitance is greater than or equal to CADP_VBUS min (1F), and less than or equal to CADP_VBUS max (6.5F). If the B-UUT is not ADP capable, check that the capacitance is greater than or equal to CRPB min (1F), and less than or equal to CRPB max (10F). 11. Check that no ADP probe occurs within a TB_ADP_DETACH min (3s) of the last simulated ADP probe from the PET. 12. Wait 2s to allow disconnection to be detected. End of Test. 60 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.4 B-UUT SRP Purpose Applies to Description Test Setup This test will check that the B-device generates SRP requests, after a session. EH B-ports, OTG B-devices, Peripheral-only B-devices Uses SetFeature(otg_srp_reqd) to trigger the B-UUT to perform SRP. Verifies that all SRP related parameters are within limits. Test setup 1 or 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist DF1-4, SRP9, SRP10, SRP11, SRP12, T9 6.7.4.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. PET applies a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to 5V. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait TA_BCON_LDB min (100ms) then issue a bus reset to the B-UUT. 6. Enumerate, checking: a. Valid response to GetStatus(OTG) in default, addressed and configured states. b. Valid response to GetDescriptor(Device). c. Valid response to GetDescriptor(Configuration). d. OTG descriptor in configuration descriptor has valid fields. e. OTG descriptor in configuration descriptor declares SRP capability. f. Valid response to GetDescriptor(String) for declared strings. g. Valid response to GetDescriptor(OTG). h. Separate OTG descriptor has valid fields. i. Separate OTG descriptor declares SRP capability. 7. SetConfiguration(1). 8. SetFeature(otg_srp_reqd). This test mode feature bit requires the UUT to perform an SRP request within TTST_SRP (5s) of VBUS going off. 9. Wait 1s. 10. Disconnect VBUS pull-down resistor, then turn off VBUS. 11. Check that VBUS goes below VOTG_VBUS_LKG max (0.7V), and that the fall in VBUS from VOTG_SESS_VLD max (4V) to VOTG_VBUS_LKG (0.7V) occurs within TSSEND_LKG (1s). Note: The fall time is now governed by the B-UUT using its own pull-down resistor to discharge its own capacitance, as the PET has disconnected its pull-down resistor. 12. When VBUS is at 0.7V, check that SE0 is presented on data bus. Note time when it is. 13. Check that D+ is not asserted within TB_SE0_SRP (1s) of this time, or within TB_SSEND_SRP (1.5s) of VBUS having gone below VOTG_SESS_VLD max (4V). 14. Check that D+ is asserted within TTST_SRP (5s) of VBUS going below VOTG_SESS_VLD min (0.8V). [This is a testability requirement initiated by otg_srp_reqd]. 61 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 15. Check that D+ remains high for TB_DATA_PLS (5 to 10ms) (Pass 1 only). 16. Depending whether this is first or second pass through test PET applies a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to 5V: a. slightly less than TB_SRP_FAIL max (5s minus 0.1s = 4.9s) after start of D+ pulse. b. immediately after start of D+ pulse. 17. Check that D+ goes high within TB_SVLD_BCON (1s) of VBUS reaching VOTG_SESS_VLD max. 18. Issue a bus reset, and enumerate the B-UUT. Check normal response. 19. Turn off VBUS and disconnect the pull-down resistance from VBUS. 20. Wait 5s to allow disconnection to be detected. 21. Repeat steps 1-20 using alternative timing in step 16. End of Test. 62 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.5 B-UUT HNP Purpose Applies to Description Test Setup This test will check that the B-device generates an HNP request, assumes the host role, and hands back control after a session. OTG B-devices Uses SetFeature(otg_hnp_reqd) to trigger an HNP role transfer. Verifies that all HNP related parameters are within limits. Test setup 1 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist DF1, DF2, DF15, DF17-19, DF22, DF23, HNP12-14, HNP16, HNP17, T16-18 6.7.5.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. PET applies CADP_VBUS max (6.5F) and a pull-down resistor of ROTG_VBUS min (10k) to VBUS and turns on VBUS to 5V. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait 100ms then issue a bus reset to the B-UUT. 6. Enumerate at speed depending on pass number (first two passes at Full Speed, last two passes at High Speed), checking: a. Valid response to GetStatus(OTG) in default and addressed states. b. Valid response to GetDescriptor(Device). c. Valid response to GetDescriptor(Configuration). d. OTG descriptor in configuration descriptor has valid fields. e. OTG descriptor in configuration descriptor declares HNP and SRP capability. f. Valid response to GetDescriptor(String) for declared strings. g. Valid response to GetDescriptor(OTG). h. Separate OTG descriptor has valid fields. i. Separate OTG descriptor declares HNP and SRP capability. 7. SetConfiguration(1). 8. GetStatus(OTG) Check valid response. 9. SetFeature(otg_hnp_reqd). Check valid response. This test mode feature bit requires the UUT to set its Host Request Flag and to perform an HNP request within TTST_HNP (5s) of VBUS going off. 10. Wait 1s. 11. GetStatus(OTG). Check valid response. Check that Host Request Flag is set. 12. SetFeature(b_hnp_enable). Check valid response. 13. Attempt to ClearFeature(b_hnp_enable). Check valid STALL response. 14. SetFeature(b_hnp_enable). Check valid ACK response. 15. Wait 1s. 16. Stop sending SOFs. 63 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 17. If HS check when D+ goes high is within TWTREV (3 to 3.125ms). Allow margin for D+ risetime. If FS skip this check. 18. Check that B-device under test turns off D+ pull-up within TB_AIDL_BDIS max (150ms) of start of idle, but more than TB_FS_BDIS min (1ms). This also tests TB_FS_BDIS max. 19. Depending on which pass of the test: a. Wait for a notional very small value of TA_BDIS_ACON (1ms) from D+ going low [pass 1 and 3]. b. Wait for slightly less than TA_BDIS_ACON max (150ms minus 1ms = 149ms) from D+ going low. [pass 2 and 4]. 20. Turn on D+. 21. Check that we see start of a bus reset (SE0) within TB_ACON_BSE0 (150ms) of D+ going high. 22. Allow PET to be enumerated by B-device under test (the PET identifying itself as PID=0x1A0A VID=0x0200). Even if the UUT does not support HNP Polling, the PET sets its HNP support bit. Check that enumeration was successful. If HNP polled, respond with Host Request Flag cleared. 23. Check that we are suspended within TTST_SUSP (100ms) of the SetConfiguration(0) request. (if we are in HS this involves us in reverting to full speed). 24. Depending on which pass of the test: a. Wait for TA_BIDL_ADIS min (155ms), checking that D+ remains high (and D- low). [primary timing]. b. Wait for slightly less than TA_BIDL_ADIS max (200ms minus 1ms = 199ms), checking that D+ remains high (and D- low). [alternative timing]. 25. Remove D+ pull-up. 26. Wait TLDIS_DSCHG min (25s). 27. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 28. Apply a bus reset (SE0), and check that we can enumerate the UUT successfully. 29. Suspend UUT. 30. Turn off VBUS and disconnect capacitance and pull-down resistance from VBUS. 31. Wait 5s to allow disconnection to be detected. 32. Repeat steps 1-30 with alternative timings in steps 18 and 23. 33. Repeat steps 1-30 at High Speed with primary timings in steps 18 and 23. 34. Repeat steps 1-30 at High Speed with alternative timings in steps 18 and 23. End of Test. 64 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.6 B-UUT ADP Purpose Applies to Description Test Setup This test will check that the B-device performs ADP probing and sensing. ADP-capable: EH B-ports, OTG B-devices, and Peripheral-only B-devices Exercises the B-UUT in order to verify all ADP-related parameters. Test setup 1 or 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist ADP7-10, ADP12, ADP14-16, ADP18, ADP19, ADP22-29, DF4 6.7.6.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. The B-UUT is assumed to be performing ADP probing. 2. Examine the next 11 ADP probes, as follows in steps 3-5, collecting data for validation. 3. Check VBUS goes to VADP_DSCHG (0.15V) or below. 4. Detect VBUS rising through 0.25V and then through 0.5V, record time in between, and also record point in time it passes 0.5V. This gives an estimate of the size of TADP_RISE. 5. Check that VBUS reaches at least VADP_PRB min (0.6V) and check that it does not exceed VADP_PRB max (0.75V). 6. Validate each of the 10 periods TB_ADP_PRB (1.9 2.6s) or (0.85 1.3s), and check that the cycle to cycle jitter TADP_PRB_JTR (5%) is within limits. 7. On first test pass, connect CADP_VBUS max (6.5F) across VBUS. On second test pass, connect CADP_THR max (900nF) across VBUS. Ensure that this is connected between probes. (This should cause PET to be detected by next ADP probe.) 8. Check that VBUS goes below VADP_DSCHG (0.15V) within 3s. 9. Detect VBUS rising through 0.25V and then through 0.5V, record time in between. 10. On the first test pass, from the previous and the new values of rise time we can estimate IADP_SRC (1.1 - 1.65mA). Check that the difference in ramp time lies between 885s and 1626s. On second test pass, just report times. 11. Connect pull-down resistor of ROTG_VBUS min (10k) to VBUS. 12. Check that D+ goes high within TB_ADP_PRB_SRP max (5s). This is the start of an SRP pulse. 13. Check that D+ stays high for at least TB_DATA_PLS min (5ms). 14. Check that D+ goes low within TB_DATA_PLS max (10ms) of start of pulse. 15. Turn on VBUS. 16. On connect, issue bus reset, and enumerate at Full Speed, checking: a. Valid response to GetDescriptor(Device). b. Valid response to GetDescriptor(Configuration). c. OTG descriptor in configuration descriptor has valid fields. d. OTG descriptor in configuration descriptor declares ADP and SRP capability. e. Valid response to GetDescriptor(String) for declared strings. f. Valid response to GetDescriptor(OTG). g. Separate OTG descriptor has valid fields. h. Separate OTG descriptor declares ADP and SRP capability. 65 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 i. Do not enable HNP. 17. SetConfiguration(1). 18. Suspend, then end session (VBUS off), and disconnect capacitance and pull-down resistance from VBUS. 19. Check that during the next 2.9s (TB_ADP_DETACH min minus 0.1s) the UUT does not perform any ADP probing. Note: The PET is behaving out of spec here in order to measure TB_ADP_DETACH. 20. Do ADP probe. 21. Check that during the next TB_ADP_DETACH min (3s) the UUT does not perform any ADP probing. 22. Check that the UUT does a probe within TB_ADP_DETACH max (3.4s) plus TB_SNSEND_PRB max (100ms), a total of 3.5s, of last probe from PET. Note: This demonstrated that the ADP sensing is working. 23. Disconnect. 24. Wait for 10s, ignoring any SRP pulses. 25. Repeat steps 2-24 using capacitance value of CADP_THR max (900nF) in step 7. 26. Connect (less than) CADP_THR min (150nF) across VBUS. Ensure that this is connected between probes. (This should not cause PET to be detected by next ADP probe). 27. Wait for 2 ADP probes, checking that D+ does not rise. 28. Disconnect capacitance. Ensure that this is disconnected between probes. 29. Wait for 2 ADP probes, checking that D+ does not rise. 30. Connect CADP_VBUS max (6.5F) across VBUS. 31. Monitor resulting SRP pulse. Do not respond. 32. Check that ADP probe occurs within TB_ADP_PRB max (2.6s). 33. Disconnect capacitor. 34. Wait 10s, ignoring any SRP pulses. End of Test. 66 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.7 B-UUT Leakage Purpose Applies to Description Test Setup This test will measure IVBUS_LKG_SRC max (70A) EH B-ports, OTG B-devices, Peripheral-only B-devices This test makes use of the ADP sense period to check the values of IVBUS_LKG_SRC and ROTG_VBUS. Test setup 1 or 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist E10, ADP18 6.7.7.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. The B-UUT may be performing ADP probing. 2. Check that UUT is not sourcing VBUS. 3. Turn VBUS on to VB_VBUS nom (5V) and simultaneously connect CRPB min (1F) across VBUS. 4. Check that D+ goes high within TB_SVLD_BCON (1s) of VBUS reaching VOTG_SESS_VLD max (4.0V). 5. Wait TB_BCON_LDB (100ms) then issue a bus reset to the UUT. 6. Enumerate UUT, and SetConfiguration(1). 7. Switch off VBUS and remove VBUS capacitance, and apply 2k pull-down resistance. We now have 3s before ADP is allowed from UUT. 8. Wait 1s. 9. Check that voltage on VBUS is below 140mV. This confirms that IVBUS_LKG_SRC is no more than 70A. 10. Disconnect 2k pull-down resistor. 11. Connect 2k2 pull-up resistor, sourced from 0.8V, to VBUS. 12. Wait 1s. 13. Check that voltage on VBUS is greater than or equal to 0.656V. This proves that ROTG_VBUS is greater than or equal to 10k. 14. Disconnect 2k2 pull-up resistor. 15. Wait 10s while ignoring any SRP pulse. End of Test. 67 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.8 ADP-Capable OTG B-device State Transition Test Purpose Applies to Description Test Setup This test verifies the UUT follows the correct transitions in the specified state diagrams. ADP-capable OTG B-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 1 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist ST4 6.7.8.1 Test Procedure START -> b_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. No capacitance or pull-down resistance connected to VBUS, ID pin not connected. 2. PET connects CADP_VBUS min (1F) capacitor, and a pull-down resistor of ROTG_VBUS min (10k) from VBUS to ground. 3. Wait 8s (ignoring SRP pulse resulting from capacitance change). b_idle -> b_peripheral resulting from b_sess_vld. 4. PET turns on VBUS. 5. Check that UUT connects using D+ within TB_SVLD_BCON (1s). b_peripheral -> b_idle resulting from b_sess_vld/. 6. PET turns off VBUS. 7. Check that UUT disconnects D+ within TSSEND_LKG max (1s). b_idle -> b_peripheral resulting from b_sess_vld. 8. PET turns on VBUS. 9. Check that UUT connects using D+ within TB_SVLD_BCON (1s). b_peripheral -> b_idle -> a_idle resulting from id/. 10. PET turns off VBUS (speeding up the fall time by the use of an additional 2k pull-down resistor which is then disconnected), and then connects ID pin to ground. 11. Check that UUT disconnects D+ within 100ms (D+ should not remain on after VBUS is off). 12. Check that UUT performs an ADP probe within 2s. 68 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 a_idle -> b_idle resulting from id. 13. PET disconnects ID pin from ground. 14. Check that an ADP probe is performed within 4s. Note: This allows the UUT to first perform ADP sensing if designed to do so under these conditions, or to continue with ADP probing but at the B-device rate. 15. Check that the next ADP probe is performed TB_ADP_PRB (1.9s to 2.6s OR 0.95s to 1.3s) later. b_idle -> b_peripheral resulting from b_sess_vld. 16. PET turns on VBUS. 17. Check that UUT connects using D+ within TB_SVLD_BCON (1s). 18. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend & b_bus_reqd & b_hnp_en. 19. PET performs SetFeature(otg_hnp_reqd). 20. PET checks that Host Request Flag is set. 21. PET performs SetFeature(b_hnp_enable). 22. PET suspends UUT. 23. Check that D+ goes low within 150ms. b_wait_acon -> b_host resulting from a_conn. 24. PET connects D+. 25. Check that UUT resets PET within TB_ACON_BSE0 (150ms). 26. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200). If HNP polled, it responds with Host Request Flag set. b_host ->b_peripheral resulting from b_bus_req/. 27. Check that PET is suspended within TTST_SUSP (100ms) of the SetConfiguration(0) request. 28. Wait TA_BIDL_ADIS min (155ms). 29. PET disconnects D+. 30. Wait TLDIS_DSCHG (25s) 31. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 32. PET issues a bus reset, and enumerates the UUT. (Repeating now with different TA_BIDL_ADIS). b_peripheral -> b_wait_acon resulting from a_bus_suspend. 33. PET performs SetFeature(otg_hnp_reqd). 34. PET checks that Host Request Flag is set. 35. PET performs SetFeature(b_hnp_enable). 36. PET suspends UUT. 69 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 37. Check that D+ goes low within 150ms. b_wait_acon -> b_host resulting from a_conn. 38. PET connects D+. 39. Check that UUT issues a bus reset within TB_ACON_BSE0 (150ms). 40. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200). If HNP polled, it responds with Host Request Flag set. b_host ->b_peripheral resulting from b_bus_req/. 41. Check that PET is suspended within TTST_SUSP (100ms) of the SetConfiguration(0) request. 42. Wait slightly less than TA_BIDL_ADIS max (i.e. 199ms). 43. PET disconnects D+. 44. Wait TLDIS_DSCHG (25s) 45. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 46. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend & b_bus_reqd & b_hnp_en. 47. PET performs SetFeature(otg_hnp_reqd). 48. PET checks that Host Request Flag is set. 49. PET performs SetFeature(b_hnp_enable). 50. PET suspends UUT. 51. Check that D+ goes low within 150ms. b_wait_acon -> b_host resulting from a_conn. 52. PET connects D+. 53. Check that UUT issues a bus reset within TB_ACON_BSE0 (150ms). b_host ->b_peripheral resulting from a_conn/. 54. PET disconnects D+. 55. Wait TLDIS_DSCHG (25s). 56. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 57. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend. 58. PET performs SetFeature(otg_hnp_reqd). 59. PET checks that Host Request Flag is set. 60. PET performs SetFeature(b_hnp_enable). 61. PET suspends UUT. 62. Check that D+ goes low within 150ms. 70 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 b_wait_acon -> b_idle resulting from b_sess_vld/. 63. PET turns off VBUS. 64. Check that UUT performs ADP probe within 4s. b_idle -> b_peripheral resulting from b_sess_vld. 65. PET turns on VBUS 66. Check that UUT connects using D+ within TB_SVLD_BCON (1s). 67. PET issues a bus reset, and enumerates the UUT. PET uses SetFeature(otg_srp_reqd). b_peripheral -> b_idle -> b_srp_init resulting from b_sess_vld/ and b_bus_reqd & b_ssend_srp & b_se0_srp. 68. PET turns off VBUS. 69. Check that UUT disconnects D+ within TSSEND_LKG max (1s). 70. Check that UUT performs SRP within TTST_SRP max (5s). b_srp_init -> b_idle resulting from b_srp_done. 71. Check that UUT performs ADP probe within TB_SRP_FAIL max (6s) plus TB_ADP_PRB max (2.6s) plus small margin (total 9s). b_idle -> b_srp_init resulting from adp_change & b_ssend_srp & b_se0_srp. 72. PET changes VBUS capacitance to CADP_VBUS max (6.5F). 73. Check that UUT performs ADP probe within 2s. 74. Check that UUT performs SRP pulse within TB_ADP_PRB_SRP max (5s). b_srp_init -> b_idle resulting from b_srp_done. 75. Check that UUT performs ADP probe within TB_SRP_FAIL max (6s) plus TB_ADP_PRB max (2.6s) plus small margin (total 9s). 76. PET disconnects capacitance and pull-down resistance from VBUS. 77. Wait 8s (ignoring SRP pulse). End of Test. Repeat test at High Speed. 6.7.8.1.1 Paths not tested: Paths resulting from id/ where VBUS is on, because b_sess_vld/ will automatically result in the same transition. Path from b_srp_init to b_idle resulting from id/, because not practical to distinguish from same transition resulting from b_srp_done. Path from b_wait_acon ->b_peripheral resulting from a_bus_resume or b_ase0_brst_tmout 71 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 because both these transitions involve time periods which are given no maximum value in [USBOTG&EHv2.0]. 72 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.9 Non ADP-Capable OTG B-device State Transition Test Purpose Applies to Description Test Setup This test verifies the UUT follows the correct transitions in the specified state diagrams. Non ADP-capable OTG B-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 1 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist ST4 6.7.9.1 Test Procedure START -> b_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. No capacitance or pull-down resistance connected to VBUS, ID pin not connected. b_idle -> b_peripheral resulting from b_sess_vld. 2. PET connects CADP_VBUS min (1F) capacitor, and a pull-down resistor of ROTG_VBUS min (10k) from VBUS to ground, and turns on VBUS 3. Check that UUT connects using D+ within TB_SVLD_BCON (1s). b_peripheral -> b_idle resulting from b_sess_vld/. 4. PET turns off VBUS. 5. Check that UUT disconnects D+ within TSSEND_LKG max (1s). b_idle -> b_peripheral resulting from b_sess_vld. 6. PET turns on VBUS 7. Check that UUT connects using D+ within TB_SVLD_BCON (1s). b_peripheral -> b_idle -> a_idle resulting from id/. 8. PET turns off VBUS, pulling it down using a 2k resistor, and connects ID pin to ground. 9. Check that UUT disconnects D+ within 100ms. 10. Wait 1s. a_idle -> b_idle resulting from id. 11. PET disconnects ID pin from ground. 73 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 12. Wait 1s. b_idle -> b_peripheral resulting from b_sess_vld. 13. PET turns on VBUS 14. Check that UUT connects using D+ within TB_SVLD_BCON (1s) 15. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend & b_bus_reqd & b_hnp_en. 16. PET performs SetFeature(otg_hnp_reqd). 17. PET checks that Host Request Flag is set. 18. PET performs SetFeature(b_hnp_enable). 19. PET suspends UUT. 20. Check that D+ goes low within TB_AIDL_BDIS (150ms). b_wait_acon -> b_host resulting from a_conn. 21. PET connects D+ 22. Check that UUT issues a bus reset to PET within TB_ACON_BSE0 (150ms). 23. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200). If HNP polled, it responds with Host Request Flag set. b_host ->b_peripheral resulting from b_bus_req/. 24. Check that PET is suspended within TTST_SUSP (100ms) of the SetConfiguration(0) request. 25. Wait TA_BIDL_ADIS min (155ms). 26. PET disconnects D+. 27. Wait TLDIS_DSCHG (25s) 28. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 29. PET issues a bus reset, and enumerates the UUT. (Repeating now with different TA_BIDL_ADIS). b_peripheral -> b_wait_acon resulting from a_bus_suspend 30. PET performs SetFeature(otg_hnp_reqd). 31. PET checks that Host Request Flag is set. 32. PET performs SetFeature(b_hnp_enable). 33. PET suspends UUT. 34. Check that D+ goes low within 150ms. b_wait_acon -> b_host resulting from a_conn. 35. PET connects D+ 36. Check that UUT issues a bus reset within TB_ACON_BSE0 (150ms). 74 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 37. Check that UUT enumerates PET (up to setting configuration 1) within TTST_CONFIG (30s). PET declares itself as test device (VID=0x1A0A, PID=0x0200). If HNP polled, it responds with Host Request Flag set. b_host ->b_peripheral resulting from b_bus_req/. 38. Check that PET is suspended within TTST_SUSP (100ms) of the SetConfiguration(0) request. 39. Wait slightly less than TA_BIDL_ADIS max (i.e. 199ms). 40. PET disconnects D+. 41. Wait TLDIS_DSCHG (25s). 42. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 43. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend & b_bus_reqd & b_hnp_en 44. PET performs SetFeature(otg_hnp_reqd). 45. PET checks that Host Request Flag is set. 46. PET performs SetFeature(b_hnp_enable). 47. PET suspends UUT. 48. Check that D+ goes low within TB_AIDL_BDIS (150ms). b_wait_acon -> b_host resulting from a_conn. 49. PET connects D+ 50. Check that UUT issues a bus reset within TB_ACON_BSE0 (150ms). b_host ->b_peripheral resulting from a_conn/. 51. PET disconnects D+. 52. Wait TLDIS_DSCHG (25s) 53. Check that D+ is pulled up by UUT within TTST_HNPEND (5s). 54. PET issues a bus reset, and enumerates the UUT. b_peripheral -> b_wait_acon resulting from a_bus_suspend. 55. PET performs SetFeature(otg_hnp_reqd). 56. PET checks that Host Request Flag is set. 57. PET performs SetFeature(b_hnp_enable). 58. PET suspends UUT. 59. Check that D+ goes low within 150ms. b_wait_acon -> b_idle resulting from b_sess_vld/. 60. PET turns off VBUS. 61. Wait 1s. b_idle -> b_peripheral resulting from b_sess_vld. 75 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 62. PET turns on VBUS. 63. Check that UUT connects using D+ within TB_SVLD_BCON (1s). 64. PET issues a bus reset, and enumerates the UUT. PET uses SetFeature(otg_srp_reqd). b_peripheral -> b_idle -> b_srp_init resulting from b_sess_vld/ and b_bus_reqd & b_ssend_srp & b_se0_srp. 65. PET turns off VBUS and disconnects capacitance and pull-down resistance from VBUS. 66. Check that UUT disconnects D+ within TSSEND_LKG max (1s). 67. Check that UUT performs SRP within TTST_SRP max (5s). b_srp_init -> b_idle resulting from b_srp_done. 68. Wait 6s. End of Test. Repeat test at High Speed. 6.7.9.1.1 Paths not tested: Paths resulting from id/ where VBUS is on, because b_sess_vld/ will automatically result in the same transition. Path from b_srp_init to b_idle resulting from id/, because not practical to distinguish from same transition resulting from b_srp_done. 76 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.10 ADP-Capable Peripheral Only B-device State Transition Test Purpose Applies to Description Test Setup This test verifies the UUT follows the correct transitions in the specified state diagrams. ADP-capable Peripheral Only B-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist ST1 6.7.10.1 Test Procedure START -> bp_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. No capacitance or pull-down resistance connected to VBUS, ID pin not connected. 2. PET connects CADP_VBUS min (1F) capacitor, and a pull-down resistor of ROTG_VBUS min (10k) from VBUS to ground. 3. Wait 8s (ignoring SRP pulse resulting from capacitance change). bp_idle -> bp_peripheral resulting from b_sess_vld. 4. PET turns on VBUS. 5. Check that UUT connects using D+ within TB_SVLD_BCON (1s) 6. PET issues a bus reset, and enumerates the UUT. PET uses SetFeature(otg_srp_reqd). bp_peripheral -> bp_idle -> bp_srp_init resulting from b_sess_vld/ and b_bus_reqd & b_ssend_srp & b_se0_srp. 7. PET turns off VBUS. 8. Check that UUT disconnects D+ within TSSEND_LKG max (1s). 9. Check that UUT performs SRP within TTST_SRP max (5s). bp_srp_init -> bp_idle resulting from b_srp_done. 10. Check that UUT performs ADP probe within TB_SRP_FAIL max (6s) plus TB_ADP_PRB max (2.6s) plus small margin (total 9s). bp_idle -> bp_srp_init resulting from adp_change & b_ssend_srp & b_se0_srp. 11. PET changes VBUS capacitance to CADP_VBUS max (6.5F), ensuring that this occurs inbetween probes. 12. Check that UUT performs ADP probe within 2s. 77 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 13. Check that UUT performs SRP pulse within TB_ADP_PRB_SRP max (5s). bp_srp_init -> bp_idle resulting from b_srp_done. 14. Check that UUT performs ADP probe within 2s. 15. PET disconnects capacitance and pull-down resistance from VBUS. 16. Wait 8s (ignoring SRP pulse). End of Test. Repeat test at High Speed. 6.7.10.1.1 Paths not tested: None. 78 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.11 SRP Only Capable Peripheral Only B-device State Transition Test Purpose Applies to Description Test Setup This test verifies the UUT follows the correct transitions in the specified state diagrams. SRP-capable Peripheral Only B-devices PET performs the necessary actions to force the UUT between each state transition, to ensure correct operation. Test setup 3 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist ST1 6.7.11.1 Test Procedure START -> bp_idle. (This was done in Power-Up Test). First perform following test at Full Speed. 1. No capacitance or pull-down resistance connected to VBUS. bp_idle -> bp_peripheral resulting from b_sess_vld. 2. PET connects CADP_VBUS max (6.5F) capacitor, and a pull-down resistor of ROTG_VBUS min (10k) from VBUS to ground., and turns on VBUS. 3. Check that UUT connects using D+ within TB_SVLD_BCON (1s). 4. PET issues a bus reset, and enumerates the UUT. PET uses SetFeature(otg_srp_reqd). bp_peripheral -> bp_idle -> bp_srp_init resulting from b_sess_vld/ and b_bus_reqd & b_ssend_srp & b_se0_srp 5. PET turns off VBUS. 6. Check that UUT disconnects D+ within TSSEND_LKG max (1s). 7. Check that UUT performs SRP within TTST_SRP max (5s). bp_srp_init -> bp_idle resulting from b_srp_done 8. PET disconnects capacitance and pull-down resistance from VBUS. 9. Wait 2s. End of Test Repeat test at High Speed. 6.7.11.1.1 Paths not tested: None. 79 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.12 B-UUT "Device no response" for SRP Purpose This test verifies that the B-UUT displays an error message when it is unable to start a session using SRP. The B-UUT is attached to a non-responsive A-PET for this test. SRP-Capable: EH B-ports, OTG B-devices, Peripheral-only B-devices Uses SetFeature(otg_srp_reqd) to cause the B-UUT to generate an SRP pulse, then fail to respond to the SRP. Check that a suitable error message is generated. Test setup 1 or 3 (see Section 0) Applies to Description Test Setup Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist Pass Criteria MSG1-4, SRP13, MSG11 The test fails if: The B-UUT does not display a "Device not responding" or similar type error message between the 5s and 6s messages. 6.7.12.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. Turn VBUS on (5V), and simultaneously connect CADP_VBUS max (6.5F), and a pull-down resistor of ROTG_VBUS min (10k) between VBUS and ground. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait 100ms then issue a bus reset to the B-UUT. 6. Enumerate, checking: a. Valid response to GetDescriptor(Device). b. Valid response to GetDescriptor(Configuration). c. OTG descriptor in configuration descriptor has valid fields. d. OTG descriptor in configuration descriptor declares SRP capability. e. Valid response to GetDescriptor(String) for declared strings. f. Valid response to GetDescriptor(OTG). g. Separate OTG descriptor has valid fields. h. Separate OTG descriptor declares SRP capability 7. SetConfiguration(1). 8. SetFeature(otg_srp_reqd). This test mode feature bit requires the UUT to perform an SRP request within 5s of VBUS going off. 9. Wait 1s. 10. Turn off VBUS. 11. Check that D+ is not asserted within TB_SE0_SRP (1s) of this time, or within TB_SSEND_SRP (1.5s) of VBUS having gone below VOTG_SESS_VLD max (4V). 12. Check that D+ is asserted within 5s of VBUS going below VOTG_SESS_VLD min (0.8V). 13. Check that D+ remains high for TB_DATA_PLS (5 to 10ms). 14. Do not turn on VBUS. 80 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 15. Wait TB_SRP_FAIL max (6s). 16. Display Message "Click OK if 'Device No Response' indication displayed on UUT". 17. If operator clicks OK before 30s elapses since VBUS went on, then UUT passes test. 18. If 30s elapses first, then UUT fails test. 19. Disconnect VBUS capacitance and VBUS pull-down resistor. 20. Wait 2s. to allow disconnection to be recognized. End of Test. 81 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.13 B-UUT "Unsupported Device" Purpose This test verifies that the B-UUT displays an unsupported device error message when it becomes host and enumerates the A-PET which is programmed to have an unsupported Vendor and Device ID. OTG B-devices capable of HNP in the B-device position Uses SetFeature(otg_hnp_reqd) to force B-UUT to become host. Get enumerated and respond as an unknown device, not supporting HNP. Check that a suitable error message is generated. Test setup 1 (see Section 0) Applies to Description Test Setup Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist Pass Criteria TPL4, TPL5, MSG1-3, T3 The test fails if: The B-UUT does not display an "Unsupported device" or similar error message before 30s. 6.7.13.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. Turn VBUS on (5V), and simultaneously connect CADP_VBUS max (6.5F), and a pull-down resistor of ROTG_VBUS min (10k) between VBUS and ground. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait 100ms then issue a bus reset to the B-UUT. 6. Enumerate at Full Speed, checking valid responses. 7. SetConfiguration(1). 8. GetStatus(OTG) Check valid response. 9. SetFeature(otg_hnp_reqd). Check valid response. This test mode feature bit requires the UUT to perform an HNP request within 5s of VBUS going off. 10. Wait 1s. 11. GetStatus(OTG). Check valid response. Check that Host Request Flag is set. 12. SetFeature(b_hnp_enable). Check valid response. 13. Wait 1s. 14. Stop sending SOFs. 15. Check that B-device under test turns off D+ pull-up within TB_AIDL_BDIS max (150ms) of start of suspend, but more than TB_FS_BDIS min (1ms). 16. Wait 140ms, i.e. TA_BDIS_ACON (150ms) minus a small amount. 17. Connect D+ pull-up. 18. Check that we see start of a bus reset (SE0) within TB_ACON_BSE0 (150ms) of D+ pull-up. 19. Allow PET to be enumerated by B-device under test. The PET responds with a VID / PID combination not on the TPL of the UUT (by default 0x1A0A / 0x0201, but the test operator may select other combinations), and also with the OTG descriptor stating that it does not support HNP. Check that enumeration was successful. If HNP polled, respond with Host Request Flag cleared. 82 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 20. Start 30s timer when Device Descriptor is read. 21. Display Message "Click OK if 'Unsupported Device indication displayed on UUT". 22. If operator clicks OK before 30s timer expires, then UUT passes test. 23. If 30s elapses first, then UUT fails test. 24. Wait for 10s. 25. PET disconnects (no capacitance or pull-down resistor on VBUS and no pullup on D+). 26. Wait 2s. to allow disconnection to be recognized. End of Test. 83 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 6.7.14 B-UUT "Device No Response" for HNP Purpose Applies to Description Test Setup This test verifies that the B-UUT displays an error message when it starts a session and HNP fails. OTG B-devices capable of HNP in the B-device position Uses SetFeature(otg_hnp_reqd) to force B-UUT to become host. Fail to respond as a peripheral. Check that a suitable error message is generated. Test setup 1 (see Section 0) Preconditions ,,B-UUT Initial Power-up Test has previously been run to establish the initial conditions for this test. Checklist Pass Criteria MSG1-4 The test fails if: The B-UUT does not display a "Device no response" or similar type error message before 30s. 6.7.14.1 Test Procedure 1. Cable is already attached with the B-device powered up. The PET is not applying VBUS, and not applying capacitance or pull-down resistance between VBUS and ground. 2. Check that UUT is not sourcing VBUS. 3. Turn VBUS on (5V), and simultaneously connect CADP_VBUS max (6.5F), and a pull-down resistor of ROTG_VBUS min (10k) between VBUS and ground. 4. Check that D+ goes high within 5s. We expect it to connect within TB_SVLD_BCON (1s). 5. Wait 100ms then issues a bus reset to the B-UUT. 6. Enumerate at Full Speed, checking valid responses. 7. SetConfiguration(1). 8. GetStatus(OTG) Check valid response. 9. SetFeature(otg_hnp_reqd). Check valid response. This test mode feature bit requires the UUT to perform an HNP request within 5s of VBUS going off. 10. Wait 1s. 11. GetStatus(OTG). Check valid response. Check that Host Request Flag is set. 12. SetFeature(b_hnp_enable). Check valid response. 13. Wait 1s. 14. Stop sending SOFs and start timer. 15. Display Message "Click OK if 'Unsupported Device indication displayed on UUT". 16. If operator clicks OK before 30s timer expires, then UUT passes test. 17. If 30s elapses first, then UUT fails test. 18. PET disconnects (no capacitance or pull-down resistor on VBUS). 19. Wait 2s. to allow disconnection to be recognized. End of test. 84 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7 Manual Interoperability Tests 7.1 Introduction Targeted Hosts are tested for interoperability with peripherals from the devices own Targeted Peripheral List plus other retail USB products which could be attached to the Targeted Host. 7.1.1 What does "Category" mean? This is the general type of a specific Targeted Peripheral that an A-UUT has listed on its TPL. Examples of categories are: memory sticks, CDROMs, MTP peripherals, audio headsets, mice, keyboards, etc. The category storage includes USB floppy, USB CDROM, Flash card readers etc. An A-UUT can limit its output the power, based on which Targeted Peripheral is connected. For example if the A-UUT limits its output power to 100mA, based on the power requirements of a particular Targeted Peripheral, it can only additionally support memory sticks that consume no more than 100mA. 7.1.2 What does "Prove Functionality" mean? Does the A-UUT function in the way that has been defined by the A-UUT vendor which can be functionally less than the user may expect. Proving the functionality of a device can be limited to some very basic operations e.g. A device of the memory stick category can have a single function to read out specific file types and provide no other function. There should however be some operation which provides value to the end user; it is not sufficient to enumerate the device and show the device as available to the user without providing any further functionality. Where multiple, selected USB modes are provided the AUUT is expected to follow these requirements in all modes of operation. 7.2 Interoperability Requirements Any OTG device, acting as a host, must work with all the peripherals listed on the devices Targeted Peripheral List. The manufacturer of an OTG device is expected to provide a subset of the peripheral(s) from the devices Targeted Peripheral List for testing. It is required that the OTG device, acting as a host, proves functionality with the peripheral(s) supplied from the devices Targeted Peripheral List. The manufacturer is responsible for verifying that the OTG device supports all the peripherals listed on the devices Target Peripheral List. If an OTG device is found NOT to work with a peripheral on the devices Targeted Peripheral List, all of the OTG devices on the shelves could be recalled. 7.2.1 Targeted Peripheral List 7.2.2 Error messages Silent failures are not allowed and therefore a clear message shall be generated when any sort of error situation occurs. Where hubs are non-supported a clear "Hub not supported" or similar error message appears and not a generic "not supported" or similar error message. 85 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.2.3 Hub support If an A-UUT supports hubs following items shall be taken into account: Simultaneous operation of multiple peripherals shall be supported Full speed hubs shall be supported Where bus powered hubs are supported the potential limitation of 100mA for each port shall be considered 7.3 Interoperability test definitions 7.3.1 A-UUT Functionality B-device Purpose Applies to Description Test setup Preconditions Prove the functionality of an OTG A-device or EH OTG A-devices and EHs that perform VID/PID detection of TPL peripherals Test the functionality of the TPL peripherals At least one TPL device corresponding to each supported category The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. TPL2-4, TPL7 Prove the functionality of all TPL B-devices in combination with the A-UUT Checklist Pass Criteria 7.3.1.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a B-device taken from the TPL and prove functionality. 3. Detach the B-device and see if the device is disconnected correctly. 4. Attach the B-device and prove functionality. End of test. Repeat the above steps for each of the different supported category e.g. if A-UUT supports two mice, four keyboards, two MSC device than the above test should be performed with these 3 peripherals. 86 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.2 A-UUT Category Functionality B-device Purpose Applies to Description Test setup Prove the category functionality of an OTG A-device or EH OTG A-devices and EHs that support a certain category of device Test the functionality of each of the supported categories One B-device of each supported category with 500mA in their descriptor, if not available use a device with highest max power descriptor value. If available one B-device of each supported category with an additional interface(s) (composite device). If not available use a device with one interface. Three different B-devices of each supported category The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. MSG2, MSG3, TPL2-4, TPL7 Prove the functionality of the B-devices in combination with A-UUT For the composite device it is not mandatory to prove functionality however if the device does not operate a clear message shall be generated by the AUUT. If a device does not work a clear error message shall be shown to the user. Preconditions Checklist Pass Criteria 7.3.2.1 Test procedure 1. Power ON A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. 2. 3. b. If the B-device requires external power, power on the B-device. Attach a B-device and prove functionality. Detach B-device and see if device is disconnected properly. 4. Attach the B-device and prove functionality. End of test. Repeat the above steps for each of the different supported category with the five different peripherals as defined in the Test setup. 87 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.3 A-UUT Boot test Purpose Applies to Description Test setup Preconditions Prove the functionality of an OTG A-device or EH after boot OTG A-devices and EHs Observe boot behavior while a B-device is attached One B-device of each supported category. The A-UUT is powered OFF Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C3 Prove the functionality of the B-devices in combination with A-UUT after a boot Checklist Pass Criteria 7.3.3.1 Test procedure 1. Power OFF A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a B-device. 3. Power ON the A-UUT. 4. Prove the functionality of the B-device. End of test. Repeat the above steps for each of the different supported categories. 7.3.4 A-UUT Legacy Speed test Purpose Applies to Prove the functionality of the OTG A-device or EH in Full or Low Speed High Speed OTG A-devices and EHs that have a Full or Low Speed device on their TPL. Perform this test only if it not has been performed in one of the previous tests. Test the functionality of the Full or Low Speed TPL device One supported Full Speed (Full Speed support is mandatory) or Low speed device The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. E15, E18 The functionality of the full or low speed device is proven. If a device does not work a clear error message shall be shown to the user. Description Test setup Preconditions Checklist Pass Criteria 7.3.4.1 Test procedure 1. Power ON the A-UUT. 88 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 a. If the product is an OTG device with a Micro-AB receptacle then attach Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. Attach a Full Speed B-device and prove functionality. 2. End of test. 7.3.5 A-UUT Concurrent and Independently test Purpose Applies to Description Test setup Prove the functionality of all downstream ports EH with multiple ports Test the concurrent and independent functioning of the TPL peripherals on each downstream port. For each downstream port a similar device from the TPL. If detection is made using VID/PID and/or for category support the number of B-devices is equal to the number of ports. This test shall be performed on each supported category. The A-UUT is powered ON E17 The A-UUT can operate the device concurrently and independently or a selection method is available for the end-user to select a device. Note that a A-UUT is allowed to handle a limited number of concurrent peripherals. Preconditions Checklist Pass Criteria 7.3.5.1 Test procedure 1. Power on the A-UUT. a. If the B-device requires external power, power on the B-device. 2. Attach a B-device to port 1. 3. Attach another B-device of the same category to an available downstream port. 4. Continue attaching B-devices of the same category until all ports are full. 5. Prove functionality of each attached B-device. a. Do they operate concurrently and independently. b. Or is a selection method available such that the user can select the active B-device. 6. Remove one device and replace it with a device of another category if multiple categories are supported. 7. Remove all peripherals. End of test. Repeat the above steps for each of the different supported category. 89 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.6 A-UUT Unsupported device Message test Purpose Applies to Description Test setup Preconditions Prove that the OTG A-device or EH generates the correct error message when attaching an unsupported device OTG A-devices and EHs Observe error messages when attaching unsupported peripherals One unsupported Low speed device One unsupported Full speed device One unsupported High speed device One unsupported Super speed device One broken supported device (e.g. if storage category is supported you may use an unformatted device) One unsupported composite device with more than 8 interfaces The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. MSG2, MSG3, TPL2, TPL5 A clear message is generated by the A-UUT when attaching an unsupported device. Checklist Pass Criteria 7.3.6.1 Test procedure 1. Power on the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach one of the peripherals listed above. 3. Observe if a clear message is generated to the end-user. End of test. Repeat the above steps for each of the peripherals listed in the Test setup. Note that an error message SHALL be generated when attaching a device in a device class which is not already covered by a product on the TPL. It is not permitted to support device classes without listing corresponding products on your TPL. 90 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.7 A-UUT Hub Error message test Purpose Applies to Description Test setup Preconditions Prove that an OTG A-device or EH generates a hub error message OTG A-devices and EHs that dont support hubs Test that a hub error message is displayed One 4 port High Speed Self Powered Hub (If hub support is provided by VID/PID in TPL use this Hub) At least one TPL device The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. MSG2, MSG3, MSG5 A clear message is displayed that hubs are not supported and the device is not enumerated on the downstream ports of the hub. Checklist Pass Criteria 7.3.7.1 Test procedure 1. Power on the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. Connect external power to the hub. 2. Attach the hub. 3. A clear hub not supported message should appear. 4. Attach a TPL device downstream from the hub. 5. Check that the device does not enumerate downstream from the hub. End of test. 7.3.8 A-UUT Hub Functionality test Purpose Applies to Description Test setup Preconditions Prove that a hub attached to an OTG A-device or EH hub either functions or causes a hub error message OTG A-devices and EHs which support hub(s) Test the hub functionality with TPL peripherals One 4 port High Speed Self Powered Hub (If hub support is performed by VID/PID in TPL use this Hub) At least one TPL device from each category FS device if listed on TPL (for TT stress) The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. TPL4, MSG2, MSG3, MSG5 Prove the functionality of the all device categories listed in TPL attached downstream from one hub Checklist Pass Criteria 91 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.8.1 Test procedure 1. Power on the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach the Hub. 3. Attach one supported High speed device downstream from the hub and prove its functionality. 4. Prove the functionality of each supported category downstream from one hub. 5. Detach the high speed device. 6. Attach one supported Full speed device (if supported) downstream from the hub and prove its functionality. 7. Detach the full speed device. End of test. 7.3.9 A-UUT Hub maximum tier test Purpose Applies to Description Prove the maximum tier hub functionality of an OTG A-device or EH OTG A-devices and EHs which support hubs Test the functionality of the TPL peripherals after the maximum defined tier of hubs and see that an appropriate error message is generated when exceeding the max tier. The number of hubs plus one that is defined as maximum tier of hubs. One TPL device The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. MSG2, MSG3, MSG6 One TPL device to prove to work downstream from the maximum defined tier of hubs. When exceeding the maximum tier of hubs the appropriate error message was generated. Test setup Preconditions Checklist Pass Criteria 7.3.9.1 Test procedure 1. Power on A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. 2. 3. 4. 5. Attach hubs up to the maximum tier. Attach one TPL device downstream from the last hub and prove functionality. Attach another hub downstream from the max tier of hubs. Check that an appropriate error message is generated. End of test. 92 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.10 A-UUT Hub Concurrent and Independent test Purpose Applies to Description Test setup Prove the functionality of multiple TPL peripherals attached downstream from a hub OTG A-devices and EHs which support hubs Test the functionality of the TPL peripherals in several configurations and ensure that each device is able to operate concurrently and independently. One 4 port High Speed Self Powered Hub (If hub support is performed by VID/PID in TPL use this Hub) Four similar peripherals from TPL if detection is made using VID/PID and/or for category support a number of B-devices equal to the number of ports. This test shall be performed on each supported category. The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C4 The A-UUT can operate the peripherals concurrently and independently or a selection method is available for the end-user to select a device. If a device does not work a clear error message should be shown to the user. Preconditions Checklist Pass Criteria 7.3.10.1 Test procedure 1. Power on the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a B-device to the hub's downstream port 1. 3. Attach similar peripherals to available downstream hub ports. 4. Prove the functionality of each attached device. a. do they operate concurrently and independently b. or is a selection method available such that the user can select the active device? 5. Detach one device and replace it with a device of another category if multiple categories are supported. 6. Detach all peripherals. End of test. Repeat the above steps for each of the different supported category. 93 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.11 A-UUT Bus powered hub power exceeded test Purpose Applies to Description Test setup Prove that the host generates an appropriate error message when connecting a high power device downstream from a bus powered hub. OTG A-device and EHs which support bus powered hubs. Check that the A-UUT is able to detect and prevent an over current event on a bus powered hub. A bus powered hub. High power device from the TPL (Max power descriptor >100mA). If no high power device is available on TPL use other high power device. The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C5 An appropriate error message was generated. Preconditions Checklist Pass Criteria 7.3.11.1 Test procedure 1. Power on the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. 2. Attach a bus powered Hub. 3. Attach a high power device downstream from a bus powered hub. 4. Check that an appropriate error message is generated by the A-UUT. End of test. 94 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.12 A-UUT Maximum concurrently device exceed message test Purpose Prove that the OTG A-device or EH generates an appropriate error message when exceeding the maximum allowed number of concurrent peripherals OTG A-devices and EHs which support a limited number of peripherals concurrently Test the A-UUT for appropriate behavior when exceeding the maximum number of supported concurrent peripherals. May require hubs to be attached in order to exceed maximum number of peripherals. The number of similar peripherals that the A-UUT is able to handle concurrently plus one. The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. MSG1, MSG2, MSG7 Prove that the specified maximum number of concurrent peripherals function correctly, and that an error message is given when exceeding this number. Applies to Description Test setup Preconditions Checklist Pass Criteria 7.3.12.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a B-device and prove its functionality. 3. Keep increasing the number of similar peripherals attached until the maximum number is reached, proving their functionality each time. 4. Attach an additional similar peripherals. 5. Check that an appropriate error message is generated by the A-UUT. End of test. 95 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.13 A-UUT Suspend/Resume test Purpose Applies to Description Test setup Preconditions Prove that the host can handle suspend/resume correctly OTG A-devices and EH products which support suspend With a B-device connected verify suspend and resume operation of the AUUT. At least one TPL device from each category The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C2 Compliant suspend/resume behavior is observed. Checklist Pass Criteria 7.3.13.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a B-device and prove its functionality. 3. Place the A-UUT in suspend (follow the A-UUT vendor guidelines to force the host in suspend mode). 4. Resume the A-UUT. 5. Prove the functionality of the B-device. End of test. Perform this test for each supported category. If different type of suspend are supported repeat the test till all modes are covered. 7.3.14 A-UUT Suspend Disconnect test Purpose Applies to Description Test setup Preconditions Prove the suspend functionality of the OTG A-device or EH when a peripheral is detached during suspend OTG A-devices and EHs which support suspend Detach TPL peripheral while A-UUT is suspended. Verify that the A-UUT operates correctly on resume. At least one TPL peripheral The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C2 Compliant suspend/resume behavior is observed. Checklist Pass Criteria 96 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.14.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a peripheral and prove its functionality. 3. Place A-UUT in suspend (follow A-UUT vendor guidelines to force the host in suspend mode). 4. Detach Peripheral. 5. Resume A-UUT. 6. Verify that A-UUT operates correctly. End of test. If different types of suspend are supported repeat the test until all modes have been tested. 7.3.15 A-UUT Suspend Attach test Purpose Applies to Description Test setup Preconditions Prove the suspend functionality of the OTG A-device or EH when a peripheral is attached during suspend OTG A-devices and EHs which support suspend Attach a TPL peripheral while the A-UUT is suspended. Verify A-UUT does operates correctly on resume At least one TPL peripheral The A-UUT is powered ON. Use a Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C2 Compliant suspend/resume behavior is observed. Checklist Pass Criteria 7.3.15.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Place the A-UUT in suspend (follow A-UUT vendor guidelines to force the host in suspend mode). 3. Attach Peripheral. 4. Resume the A-UUT. 5. Verify that A-UUT behaves normally. 6. Prove the functionality of the peripheral. End of test. If different types of suspend are supported repeat the test until all modes have been tested. 97 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.16 A-UUT Suspend Topology Change test Purpose Applies to Description Test setup Preconditions Prove the suspend functionality of the OTG A-device or EH when the topology changes during suspend. An OTG device or EH which supports both hubs and suspend. An EH with multiple ports which supports suspend. Switch the topology of TPL peripherals while the A-UUT is suspended, verify that the A-UUT does not behave abnormally on resume. At least one TPL peripheral. May require a hub. The A-UUT is powered ON Use a Micro-A plug to Standard-A Receptacle adapter if product is an OTG device. C2 Compliant suspend/resume behavior is observed. Checklist Pass Criteria 7.3.16.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, power on the B-device. 2. Attach a hub (if required) 3. Attach the B-device and prove functionality. 4. Place the A-UUT in suspend (follow A-UUT vendor guidelines to force the host in suspend mode). 5. Detach the B-device and attach it to another EH port or another downstream hub port. 6. Resume A-UUT. 7. Verify that A-UUT behaves normally. 8. Prove functionality of the B-device. End of test. If different types of suspend are supported repeat the test until all modes have been tested. 98 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.17 A-UUT Suspend Remote Wakeup test Purpose Applies to Description Test setup Preconditions Prove the remote wakeup functionality of an OTG A-device or EH. OTG A-devices or EHs which support suspend and remote wakeup. Perform a USB remote wakeup event and verify that the A-UUT does not operates correctly on resume. At least one TPL peripheral which supports remote wakeup. The A-UUT is powered ON. Use Micro-A plug to Standard-A Receptacle adapter if the product is an OTG device. C2 Compliant suspend/resume behavior is observed when a remote wakeup event is performed during suspend. Checklist Pass Criteria 7.3.17.1 Test procedure 1. Power ON the A-UUT. a. If the product is an OTG device with a Micro-AB receptacle then attach a Micro-A plug to Standard-A Receptacle adapter. b. If the B-device requires external power, provide power to the B-device. 2. Attach the B-device. 3. Prove the functionality of the A-UUT with the B-device. 4. Put the A-UUT in suspend (follow A-UUT vendor guidelines to force the host in suspend mode). 5. Perform a USB remote wakeup event from the B-device. 6. Prove the functionality of the A-UUT with the B-device. End of test. 7.3.18 OTG to OTG test Purpose Applies to Description Test setup Preconditions Checklist Pass Criteria Prove the functionality of two attached OTG devices OTG devices that have OTG devices on their TPL Prove the functionality when connecting two OTG devices One OTG device taken from the TPL Micro-A plug to Micro-B plug cable The UUT is powered ON The supported OTG device powered ON TPL13, M6, MSG12 The functionality between two products is proved and is the same regardless of the cable direction. When the OTG device does not work a clear error message shall be shown to the user on the OTG device they are currently using. 99 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 7.3.18.1 Test procedure 1. Power ON the UUT. 2. Attach the Micro-A plug to the UUT. 3. Attach the Micro-B plug to the supported OTG device. 4. Prove the functionality of the UUT with the OTG B-device. 5. Detach cable on both sides. 6. Attach the Micro-B plug to the UUT. 7. Attach the Micro-A plug to the supported OTG device. 8. Prove that the functionality is the same functionality as seen in step 1. End of test. 100 USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 8 USB-IF Required Tests Devices which support features of [USBOTG&EHv2.0] shall undergo additional testing beyond the tests described in this document. This additional testing is a subset of existing tests for USB peripherals and USB host controllers. Table 8-1, Table 8-2 and Table 8-3 describe exactly what tests are required for full USB-IF certification by an EH, OTG device and peripheral-only B-device respectively. The following symbols are used in these tables: * ** Always required Required if feature is supported Required if there are multiple downstream ports Automated Test Ch6 Manual Test Ch7 EH High Speed Host Full Speed Host Low Speed Host DS HS Electrical * * A/B Automated Test Ch6 101 * * * * Manual Test Ch7 DS LS SQT ** ** * * ** Table 8-1: Embedded Host test requirements B US HS Electrical DS HS Electrical Back-Voltage IOP Goldtree Avg Current US FS SQT OTG FS B/ FS A HS B/ FS A FS B/ HS A HS B/HS A Table 8-2: OTG device test requirements DS FS SQT USBCV Inrush DS FS SQT A DS LS SQT Droop USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 Automated Test Ch6 Peripheralonly Bdevice Back-Voltage IOP Goldtree Avg Current US HS Electrical US FS SQT USBCV FS B HS B Table 8-3: Peripheral-only B-device test requirements 8.1 Description of required tests The following sections briefly describe each of the required tests. For a full description of the tests please refer to the links given in Section 8.2. 8.1.1 IOP Goldtree The interoperability Goldtree is the interoperability functionality test of the B-device. 8.1.2 Avg Current Measure the average current when the device is in worst case power consumption during Unconfigured, Configured, Active and Suspend modes. For HS devices this shall be done in HS and FS mode. For battery charging devices please also check the Battery Charging compliance program. 8.1.3 USBCV The USB20CV and USB30CV Chapter 9 tests shall be performed. If supported device class specific tests should such as MSC, HID, OTG, UVC, PHDC, HUB should also be performed. For HS device these tests shall be done in both HS and FS mode. 8.1.4 Back-Voltage Check that no voltage is driven back from the device to the host when not connected. 8.1.5 US HS Electrical Upstream high speed electrical. 8.1.6 US FS SQT Upstream Full Speed signal quality. Measure using a 2m cable. 8.1.7 Inrush The inrush current event. 102 Inrush USB On-The-Go and Embedded Host Automated Compliance Plan Revision 1.0 r0.8 8.1.8 DS HS Electrical Downstream High Speed Electrical tests. Note: it is mandatory for the Host to enter the required HS electrical test modes via PID/VID detection (See [USBOTG&EHv2.0]). 8.1.9 DS FS SQT Downstream Full Speed Signal Quality. Measure using a 5m cable. 8.1.10 DS LS SQT Downstream Low Speed Signal Quality. A LS device must have a captive cable and therefore its only possible to measure at the end of the cable with the A-Plug. 8.1.11 Droop If EH has multiple downstream ports the droop effect on the other port may not exceed 330mV. 8.1.12 Automated Test Ch6 See Section 6 of this document. 8.1.13 Manual Test Ch7 See Section 7 of this document. 8.2 Test procedures and tools The test procedures can be found at : http://www.usb.org/developers/docs/ Updates on these procedures can be found at : http://compliance.usb.org/http://compliance.usb.org/ The tools used can be found at: http://www.usb.org/developers/tools/ Technical questions relating to compliance should be sent to techadmin@usb.org. 103 ...
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