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%% 
%% EE650: Reliability Physics of Nanoelectronic Devices
%%
%% A MATLAB CODE TO STUDY THE STATICIS OF NBTI
%%
%% Written by M. Alam and E. Islam (Oct. 10, 2006)
%% 
% NoDev: Total number of SiH bonds per transistor
% m: Minimum number of broken SiH bonds in a transistor that cause IC failure
%
% We will be using one of the three distributions (Normal, Poisson, and Bionomial)
% to calculate the Cumulative failure distribution during NBTI degradation.
%
% 1) NoDev>>50 and m>>15: Normal and Binomial produce similar results.
% MATLAB can not handle very large NoDev, however. Fortunately, the
% distribution is so strongly peaked in this case that the average lifetime
% does not differ much from 100 ppm lifetime.
%
%
% 2) NoDev>>50 and m<=15: Poisson and Binomial give similar results. Here, we
should
% not compare with Normal, as this is only valid for very large m.
%
% 3) NoDev <=50 and m<=15: It is best to use Binomial distribution.
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This note was uploaded on 02/19/2012 for the course ECE 695a taught by Professor Staff during the Spring '08 term at Purdue University.
 Spring '08
 Staff
 Transistor

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