19. Scanning and sampling - 2011

19. Scanning and sampling - 2011 - EE 638: Principles of...

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EE 638: Principles of Digital Color Imaging Systems Lecture 21: Sampling and Scanning
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Synopsis Scanning Technologies Development of a general model Analysis sampling Sampling on arbitrary lattices Analysis of scanning Terminology: Sampling -- mapping from continuous-parameter to discrete-parameter Scanning – mapping from 2-D or 3-D to 1-D
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1. Scanning Technologies 1) Flying Spot Mechanisms: Electron beam Analog TV camera Electromechanical Drum scanner Diffractive Supermarket scanner Phased array Radar Aperture effects: illuminating spot read spot dwell time
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2) Focal Plane Arrays Mechanisms: 1D array with electromechanical scan 2D staring mosaic CCD, CID and CMOS Aperture effects: size of photosensitive cells dwell time
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2. Line-Continuous Flying Spot Process Line-continuous Flying Spot Process Combine illuminating and real spot profiles as one function: - Illuminating spot profile - Read spot profile - Scan trajectory - Continuous-space still image - Scan signal
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1) Integration over Aperture define then
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2) Sampling define then let This signal embodies all the effects due to the fact that we only see along the locus of points With regard to these sampling effects, it is unimportant how we map the signal information into a 1-D function of time.
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3. Focal Plane Array Scan Process Integral within the window s mN + n = g ( ε , η ) d d nY nY + mX mX +
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1) Integration over Aperture let define then s mN + n = g ( mX , nY )
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This note was uploaded on 02/19/2012 for the course ECE 638 taught by Professor Staff during the Fall '08 term at Purdue.

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19. Scanning and sampling - 2011 - EE 638: Principles of...

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