HW8 - ENGR 19500 Ideas to Innovations Part II Spring 2010...

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ENGR 19500 Ideas to Innovations Part II Spring 2010 HOMEWORK #8 Due: Class 8b To be submitted in Class 8B: Individually: 1. Hard copy printout of your answers to problem 1a-c. (problem 1) 2. Hard copy printout of your answers to problem 2a-c. (problem 2) 3. Hard copy printout of your flowchart and fibonacci_yourlogin.m file. (problem 4) 4. Hard copy printout of your flowchart and piestimator_yourlogin.m file. (problem 5) Team: 5. Flowchart for your team’s MEA 1 solution. (problem 6) To be uploaded prior to coming to Class 8B: Individually: 1. fibonacci_yourlogin.m (problem 4) 2. piestimator_yourlogin.m (problem 5) 0. Reading Assignment Blackboard: Dcoumentation, Programming, and Coding Standards MATLAB Textbook: Chapter 8 – pp. 284 – 304 Class Notes: Pages 51 - 57 Mathworks Tutorials (Optional but Recommended): Much (but not all) of the content in the above reading is represented visually in the following Interactive MATLAB Tutorial materials available through the MathWorks website, www.mathworks.com/purduefirstyear/matlabtutorial . The recommended segments for this week are: Programming in MATLAB h Flow and Loop Control o Loop Control o Writing WHILE Loops
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ENGR 19500 Ideas to Innovations Part II Spring 2010 1. Defining Roughness This is to be completed individually. This problem is part of your MEA 2 grade. Answer the following questions in a Word document : a. What procedure might you use to measure the roughness of the pavement on a road? b. Give an example (other than road pavement) of something for which degree of roughness matters. o For your example, why does the degree of roughness matter? o How might you measure the roughness (or lack of roughness) of this object? c. How do you define roughness? Does the definition of roughness change when you think about different objects for which roughness might matter? Why or why not? Deliverables: A hard copy printout of your responses to 1a-c. 2. MEA 2 Preparation This problem is to be completed individually. This is part of your MEA 2 grade. 1. In preparation for MEA 2, please read the following description of Atomic Force Microscopy. At the end of this reading, answer the following questions in your own words in a Word document. a. What are the three modes of the AFM, and what are the advantages/disadvantages of each? b. What is the AFM resolution limit? c. What causes the resolution limit? Atomic Force Microscopy (AFM) 1 The primary purpose of Atomic Force Microscopy (AFM) is to quantitatively measure nano-scale surface features and forces with a nominal 0.1 nm lateral and 0.05 nm vertical resolution on all types of samples. AFM works essentially like an old-school record player - the kind used to play music recorded on vinyl. A high-tech version of the old- school record player stylus moves over a surface of interest and the behavior of the arm supporting the stylus is translated into measurements. In AFM, the stylus is called a cantilever tip. 1
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This note was uploaded on 02/20/2012 for the course ENGR 195 taught by Professor Staff during the Spring '08 term at Purdue University-West Lafayette.

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HW8 - ENGR 19500 Ideas to Innovations Part II Spring 2010...

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