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# hw6 - a ↑ transition in i causes ↑ transition in j a...

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ECE 553: Testing and Testable Design of Digital Systems Department of Electrical and Computer Engineering University of Wisconsin–Madison ECE 553 : Testing and Testable Design of Digital Systems Fall 2011 Assignment #6 Date: Tuesday, Nov. 22, 2011 Due date: Thursday, Dec. 8, 2011 1. (Bushnell and Agrawal) Problem 9.11 2. Consider the following RAM test algorithm. ( W 0) ( R 0 ,W 1 ,R 1) ( R 1 ,W 0 ,R 0) (a) Which of the following two-coupling faults will be detected or not-detected by this test assuming that RAM contains 1M cells. Note we are interested in generalized two-coupling faults and if a coupling fault is not activated, that fault will clearly not be detected. A change in the contents of cell 600 causes cell 10005 to change A change in the cell content 30018 causes cell 0 to change (b) Identify all two-coupling faults from six different cases shown below that will not be detected by the above test algorithm.

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Unformatted text preview: - a ↑ transition in i causes ↑ transition in j- a ↑ transition in i causes ↓ transition in j- a ↓ transition in i causes ↑ transition in j- a ↓ transition in i causes ↓ transition in j- a ↑ transition in i causes a transition in j- a ↓ transition in i causes a transition in j 1 Fall 2011 (Lec: Saluja, TA: Millican) ECE 553: Testing and Testable Design of Digital Systems 3. (Bushnell and Agrawal) Problem 9.22 4. (Bushnell and Agrawal) Problem 13.1 5. (Bushnell and Agrawal) Prolblem 14.4 6. Consider the Fgure 14.16 in the the textbook. Draw the S-graph for the circuit and identify the ±ip-±op to be scanned so that all cycles are broken. Redraw the circuit with the scan circuitry and also draw the circuit that will be used by a test generator for the ciruit with scan. 2 ²all 2011 (Lec: Saluja, TA: Millican)...
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