hw6sol - ECE 553: Testing and Testable Design of Digital...

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Unformatted text preview: ECE 553: Testing and Testable Design of Digital Systems Department of Electrical and Computer Engineering University of WisconsinMadison ECE 553 : Testing and Testable Design of Digital Systems Fall 2008 Assignment #6 Solution 1. (Bushnell and Agrawal) Problem 9.11 We rigorously prove that the MARCH C test detects all inversion coupling faults (CFin). The MARCH C test is, { M 0 : arrowdblbothv ( w 0); M 1 : ( r ,w 1); M 2 : ( r 1 ,w 0); M 3 : ( r ,w 1); M 4 : ( r 1 ,w 0); M 5 : arrowdblbothv ( r 0) } and the inversion coupling faults are < ; arrowbothv > and < ; arrowbothv > . Necessary condition: For all cells that are coupled, each should be read after series of possible CFins may have occurred, and the number of coupled cell transitions must be odd. Fault < ; arrowbothv > : Address of coupled cell i > address of coupling cell j . Cell j initialized to 0 by M 0, j is made to by M 1, coupled cell i set to 0 by M 0, unexpected inversion detected by M 1, number of coupled cell inversions = 1. Address of coupled cell i < address of coupling cell j . Cell j initialized to 0 by M 2, j made to by M 3, coupled cell i set to 0 by M 2, unexpected inversion detected by M 3, number of coupled cell inversions = 1. Fault < ; arrowbothv > : Address of coupled cell i > address of coupling cell j . Cell j initialized to 1 by M 1, j is made to by M 2, coupled cell i set to 1 by M 1, unexpected inversion detected by M 2, number of coupled cell inversions = 1. Address of coupled cell i < address of coupling cell j . Cell j initialized to 1 by M 3, j is made to by M 4, coupled cell i set to 1 by M 3, unexpected inversion detected by M 4, number of coupled cell inversions = 1....
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hw6sol - ECE 553: Testing and Testable Design of Digital...

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