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Unformatted text preview: 9/2/2011 4 Test Coverage from Fault Simulator Stuck-at fault coverage Vector number 9/2/2011 5 Measured Chip Fallout Vector number Measured chip fallout 9/2/2011 6 Model Fitting Y ( T ) for Af = 2.1 and b = 0.083 Measured chip fallout (1) = 0.7623 Chip fallout and computed 1-( ) Stuck-at fault coverage, Chip fallout vs. fault coverage 9/2/2011 2 9/2/2011 7 Computed DL Stuck-at fault coverage (%) Defect level in ppm 237,700 ppm ( Y = 76.23%)...
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- Winter '08
- Electronic design automation, Automatic test pattern generation, chip fallout