Lect07_notes

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X-Ray Diffraction, Scanning Electron Microscopy and Microanalysis Lecture 07 Prof. Daniel R. Mumm Chemical Engineering and Materials Science Henry Samueli School of Engineering University of California, Irvine [email protected] University of California, Irvine CBEMS164, Fall 2013 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 2 SEM Layout and Function
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 3 SEM Line Scan Display Scanning Action, Signal Collection and Display CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 4 The Principle of Image Display – Correlation of Locations What is magnification?
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 5 The Principle of Intensity Modulation What do the various levels of black and white represent? CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 6 Electron Ray Tracing
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 7 Working Distance CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 8 Effect of Working Distance
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 9 Effect of Condenser Lens Strength CBEMS 164 – XRD, SEM & Microanalysis: Lecture 07 10 Imperfections: Lens Aberrations – Spherical and Aperture Diffraction
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