Lect13_notes

Lect13_notes

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Unformatted text preview: e single peaks •  AL –  Some elements have multiple peaks •  Ti, V –  Some peaks overlap •  V-Ti, V-Cr CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13 ! 21 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13 ! 22 Acquire Spectrum! Confirm Elements! CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13 ! 23 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13 ! 24 Quantitation! The Basics of Quantitative Analysis! In the previous lecture, we discussed how X-Rays emitted from the specimen can be used to identify the elements that are present in the sampling volume (Qualitative Analysis). With proper setup, calibration and data-reduction techniques, the measured X-ray signal can also be used to quantitatively analyze the chemical composition – with an overall accuracy and precision approaching 1%. Many of the data-reduction techniques are 'black box' features in the computer systems employed for EDS and WDS analysis. However, it is extremely important to understa...
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This note was uploaded on 01/16/2014 for the course CBEMS 164 taught by Professor Porter,j during the Fall '08 term at UC Irvine.

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