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• AL – Some elements have
• Ti, V – Some peaks overlap
• V-Ti, V-Cr CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13
! 21 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13
! 22 Acquire Spectrum! Conﬁrm Elements! CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13
! 23 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 13
! 24 Quantitation! The Basics of Quantitative Analysis!
In the previous lecture, we discussed how X-Rays emitted from the specimen
can be used to identify the elements that are present in the sampling volume
With proper setup, calibration and data-reduction techniques, the measured X-ray
signal can also be used to quantitatively analyze the chemical composition – with
an overall accuracy and precision approaching 1%.
Many of the data-reduction techniques are 'black box' features in the computer
systems employed for EDS and WDS analysis. However, it is extremely important
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This note was uploaded on 01/16/2014 for the course CBEMS 164 taught by Professor Porter,j during the Fall '08 term at UC Irvine.
- Fall '08