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Lect12_notes

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X-Ray Diffraction, Scanning Electron Microscopy and Microanalysis Lecture 12 Prof. Daniel R. Mumm Chemical Engineering and Materials Science Henry Samueli School of Engineering University of California, Irvine [email protected] University of California, Irvine CBEMS164, Fall 2013 CBEMS 164 – XRD, SEM & Microanalysis: Lecture 12 2 Inelastic Scattering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± B ;"& B 2 4 ² B
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 12 3 EDS Energy dispersive x-ray spectroscopy (spectrometry?) Microchemical analysis of extremely small volumes of material Almost every SEM now equipped with EDS CBEMS 164 – XRD, SEM & Microanalysis: Lecture 12 4 EDS X-Ray Detectors EDS detectors now ubiquitous Liquid nitrogen cryogenic cooling required
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CBEMS 164 – XRD, SEM & Microanalysis: Lecture 12 5 New Technology Silicon Drift Detector – SDD Faster acquisition rate No LN 2 required Li-drifted Si detector – Si(Li) Needs LN 2 cooling CBEMS 164 – XRD, SEM & Microanalysis: Lecture 12 6 White (Bremsstrahlung) Radiation – Stochastic Deceleration
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