Of course some of us said this about the one micron

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Unformatted text preview: about the one micron level. This time, however, I think there are fundamental materials issues that will force a different direction. The people at this conference are going to have to come up with something new to keep us on the long term trend. Spring 2014, Jan 15 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 16 Source: Wikipedia Moore’s Law Spring 2014, Jan 15 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 17 2012 Problems with technology advances: High power consumption Power density Leakage Process variation – larger as a fraction of feature size Increased noise sensitivity Problems with design: Verification of correctness – logic and timing Ensuring reliable operation Testing Spring 2014, Jan 15 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 18...
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