Design develop an understanding for the advanced

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Unformatted text preview: or the advanced design Develop concepts in modern VLSI technologies. concepts Evaluation: Project Homeworks Final exam, Apr 30, 2014, B306, 4-6:30PM Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 35% 30% 35% 8 Course Outline Design Project Advanced Topics Economics of VLSI systems Logic synthesis and technology mapping Retiming and timing optimization Soft errors and fault tolerance Signal integrity Verification RF testing, alternate test, defect level, optimization Technologies of the future (reading assignments) Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 9 Reference Books J. M. Rabaey, A. Chandrakasan, and B. Nikolić, ć, Digital Integrated Circuits, A Design Perspective, Second Edition, Prentice-Hall, 2003. Second M. J. S. Smith, Application-Specific Integrated M. Circuits, Addison-Wesley, 1997. Circuits N. H. E. Weste and D. Harris, CMOS VLSI N. Design, A Circuits and Systems Perspective, Third Edition, Addison-Wesley, 2005. Third W. Wolf, Modern VLSI Design, System-on-Chip W. Design, Third Edition, Prentice-Hall, 2002. Design, Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 10 VLSI Realization Process Customer’s need Design Determine requirements Write specifications Design synthesis and Verification Test development Fabrication Manufacture Manufacturing test Chips to customer Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 11 Defining Terms Design synthesis: Given an I/O function, develop a Design procedure to manufacture a device using known materials and processes. materials Verification: Predictive analysis to ensure that the Verification: synthesized design, when manufactured, will perform the given I/O function. perform Test: Characterization: A test that debugs test program by fault Characterization: diagnosis. diagnosis. Manufacturing test: A step that ensures that the physical Manufacturing device, manufactured from the synthesized design, has no manufacturing defect. no Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 12 VLSI Design & Test Seminar Series Must attend Every Wednesday, Broun 235, 4PM Spring 2014, Jan 13 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 13...
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