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Unformatted text preview: or the advanced design
concepts in modern VLSI technologies.
concepts Evaluation: Project
Final exam, Apr 30, 2014, B306, 4-6:30PM Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 35%
8 Course Outline Design Project Advanced Topics Economics of VLSI systems
Logic synthesis and technology mapping
Retiming and timing optimization
Soft errors and fault tolerance
RF testing, alternate test, defect level, optimization
Technologies of the future (reading assignments) Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 9 Reference Books J. M. Rabaey, A. Chandrakasan, and B. Nikolić,
ć, Digital Integrated Circuits, A Design Perspective,
Second Edition, Prentice-Hall, 2003.
M. J. S. Smith, Application-Specific Integrated
Circuits, Addison-Wesley, 1997.
N. H. E. Weste and D. Harris, CMOS VLSI
Design, A Circuits and Systems Perspective,
Third Edition, Addison-Wesley, 2005.
W. Wolf, Modern VLSI Design, System-on-Chip
Design, Third Edition, Prentice-Hall, 2002.
Design, Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 10 VLSI Realization Process
Design Determine requirements
Design synthesis and Verification
Manufacture Manufacturing test
Chips to customer Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 11 Defining Terms Design synthesis: Given an I/O function, develop a
Design procedure to manufacture a device using known
materials and processes.
Verification: Predictive analysis to ensure that the
synthesized design, when manufactured, will
perform the given I/O function.
Test: Characterization: A test that debugs test program by fault
Manufacturing test: A step that ensures that the physical
device, manufactured from the synthesized design, has
no manufacturing defect.
no Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 12 VLSI Design & Test Seminar Series Must attend Every Wednesday, Broun 235, 4PM Spring 2014, Jan 13
Spring ELEC 7770: Advanced VLSI Design (Agrawal) 13...
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- Spring '14