Unformatted text preview: Semiconductor
Conduction Process inin n-Type Semiconductor EE 332 Spring 2013 Conductivity and Resistivity
Conductivity and Resistivity EE 332 Spring 2013 E Resistance
Electrical lectrical Resistance EE 332 Spring 2013 Measurement of Resistivity
Measurement of resistivity using a Four-point probe
Measurement of Resistivity
or four terminal (4T) sensing. 4T sensing measures resistance
between voltage sense
connections when current is
supplied via force connections.
No current flow in sense wires.
More accurate than a 2-point
measurement. EE 332 Spring 2013 Drift Velocity in Silicon Drift Velocity in Silicon EE 332 Spring 2013 Drift Velocity E E field G GaAs
Drift Velocity vs. vs.Field in inaAs EE 332 Spring 2013 Low-Field and High-Field Effect
Low-Field and High-Field Effect vth EE 332 Spring 2013 Drift Velocity vs. Electric
Drift Velocity vs. Electric Field Field EE 332 Spring 2013 Mutual Effects of Field and Temperature on Mobility
Mutual Effects of Field and Temperature on Mobility EE 332 Spring 2013 Example: Drift Velocity Calculation
Example: Drift Velocity Calculation EE 332 Spring 2013...
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This document was uploaded on 02/18/2014.
- Spring '09