ELEC31301 Experiment 2

ELEC31301 Experiment 2 - ELEC313-01 Technical Report for...

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ELEC313-01 Technical Report for Lab Experiment #2 Diode Characterization Submitted by: D. Bunn E. Muniz M. Schmick Date of Submission September 18 th , 2007
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Pre-lab Part 1: D 1 1 N 4 0 0 2 R 1 V 1 1 0 V d c 0 Resistance ( ) 200 500 1K 2K 5K 10K 20K 50K 100K Diode Voltage (mV) 730. 8 680. 4 648.2 618. 2 580. 2 552.1 524. 1 487. 7 452.4 Part 2: D 1 1 N 4 0 0 2 V 1 1 0 V d c 0 R 2 6 8 0 R 3 3 3 0 Voltage (mV) 742.8 Current (mA) 26.96 Purpose of experiment To measure the effect of both reverse bias and forward bias on a diode’s voltage, as well as the effect of resistance on the output voltage. Model numbers of equipment used Hewlett-Packard HPE3631A Power Supply Hewlett-Packard HP34401A Multimeter Fluke 8010A Multimeter Jameco JE24 Breadboard Block diagram of test set up
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Circuit schematic Parts A and B: D 1 1 N 4 0 0 2 R 1 4 7 0 V 1 Part C: D 1 1 N 4 0 0 2 R 1 3 3 0 V 1 R 2 6 8 0 Test Procedure Part A: A test circuit, as shown above, was created on the breadboard, with the power supply being set as the input. Resistor values were measured and compared against the nominal value. A negative voltage was applied to the circuit, and voltage across the diode (HP multimeter) and current through the circuit (Fluke multimeter) was recorded in half-volt steps from 0V to -5V. Power output was switched to positive and then the same data recorded from 0V to 5V in .25V increments, and from 5V to 10V in half-volt increments. Part B:
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This lab report was uploaded on 04/08/2008 for the course ELEC 313 taught by Professor Barsanti during the Fall '07 term at Citadel.

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ELEC31301 Experiment 2 - ELEC313-01 Technical Report for...

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