Chapter 28-1

For a thinfilm of index n and thickness t sandwiched

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Unformatted text preview: not reflect at a boundary where there is no change in the index of refraction. 9. For a thin ­film of index n and thickness t sandwiched by a lower index material on both sides, the relationships for constructive and destructive interference are: Constructive: 2nt = (m + ½)λ0 where m = 0, 1, 2, … Destructive: 2nt = mλ0 where m = 0, 1, 2, … 10. For a thin ­film of index n and thickness t sandwiched by a lower index material and a higher index substrate, the relationships for constructive and destructive interference are: Constructive: 2nt = mλ0 where m = 1, 2, … Destructive: 2nt = (m – ½)λ0 where m = 1, 2, … 11. For a single slit of width W, the diffraction angle θ that describes the location of dark fringes (destructive interference) on a distance screen is given by: Wsinθ = mλ0 where m = ±1, ±2, … 12. For a single slit of width W, the width of the diffraction bright sp...
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