[B._Beckhoff,_et_al.]_Handbook_of_Practical_X-Ray_(b-ok.org).pdf

The explanations for the fields shown in this figure

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template. The explanations for the fields shown in this figure are used to point to basic properties and features of the software program. Feature 1 Thickness mode ”. Alternatively, “Mass per unit area mode relative,” “Mass per unit area mode absolute,” “Solution analysis,” and “Component mode” are available. “Thickness mode” is the most common setting. For layers, the result is presented in thickness units, e.g., in “ µ m”. As described in Sect. 7.4.2 The Layer Model (p. 555), a density is determined that is then used to convert the initially determined partial mass per unit area X ij into the thickness units desired in practical applications. This is skipped in the “Mass per unit area modes.” A layer is characterized by its mass per unit area, e.g., in “mg/cm 2 ”. The difference between “relative” and “absolute” refers simply to the readout of the concentration for alloy
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Methodological Developments and Applications 569 layers: either in % or each portion is displayed as a mass per unit area value. Bulk concentrations (sub-layers with thicknesses = infinite) are depicted in %, in general. The mode “Solution analysis” is a special version of the “Mass per unit area mode absolute.” Here, we deal with the concentration readout of a liquid layer with a fixed thickness which is given through the measurement cell [239] that is being used. The display is in units of mass per volume, e.g., in “g/l 1 ”. With the “Component mode,” the analysis is not carried out according to elements but according to pre-defined components. These are, for example, chemical compounds such as oxides. Feature 2 Here, the measurement mode is displayed. It is derived from the actual defini- tion of the sample structure (Feature 14). A series of letters, d for thickness, g for mass per unit area and C or c for the concentration (mass portion) informs the user about the determined parameter and the units of measurement. Features 3 and 4 Setting of the operating voltage of the X-ray tube and primary filter. They are dependent on the actual instrument type. Feature 5 Ratio method ”. This toggle activates an internal spectra normalization. Dur- ing evaluation, only the relative plot profile of the spectrum is taken into account. Cf. also [238]. Feature 6 Drift compensation .” This feature is used to correct a potential drift of the peak position in the spectrum. This prevents a misrepresentation of the result, especially when critical peak overlap is present. Feature 7 Measure elements .” Because internally all spectral components are based on the intensity of the respective pure element, cf. Sect. 7.4.2 The Equipment seq., the knowledge of the pure element spectrum is of fundamental impor- tance. If the respective toggle is activated, all elements that occur in the sample must be measured as solid samples. Otherwise, one can resort to an element library that is calibrated during installation. It contains the spectra of 12 or 14 pre-defined elements, depending on the type of detector. Based
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570 V. R¨oßiger and B. Nensel
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