Global positioning system gpsc gas proportional

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global positioning system GPSC gas proportional scintillation counter HCA hierarchical cluster analysis HDAC hydrothermal diamond anvil cell HPGe high purity germanium HOPG highly oriented pyrolytic graphite ICP-AES inductively coupled plasma - Auger electron spectroscopy ICP-MS inductively coupled plasma - mass spectroscopy IEF isoelectric focusing ID insertion device (synchrotron, e.g. wiggler, bending magnet) IDX 4’-iodo-4’-deoxydoxorubicin (anticancer drug) LA-ICP-MS Laser Ablation – Inductively Coupled Plasma – Mass Spectrometry LOD limit of detection LLD lower level of detection MDL minimum detection limit MIBK methylisobutylketone micro-PIXE see PIXE micro-XRF ( µ -XRF) micro-X-ray fluorescence (analysis) micro-SRXRF (also SXRF) micro-synchrotron X-ray fluorescence ML grating multilayer grating NDXRF non-dispersive X-ray fluorescence NaDDTC sodium diethyldithiocarbamate NDXRF nondispersive X-ray fluorescence NEXAFS near edge extended X-ray absorption fine structure PHA pulse height analyzer poly-CCC polycapillary conical collimator PCA principle component analysis PCs principal components PD Parkinson’s disease PIN-diode p ositive / i ntrinsic/ n egative detector PIXE proton induced X-ray emission pn-CCD pn-charge coupled device
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List of selected abbreviations used in the handbook XXIII PSD position sensitive detector PSPC position sensitive proportional counter PTFE polytetrafluorethylene P-Z pole-zero compensator QXAS quantitative X-ray analysis system (spectroscopy) RDA regularized discriminant analysis REE rare earth element RI refraction (refractive) index RM reference material ROI region of interest ROSITA, XEUS, XMM, ABRIXAS space missions of ESA RTM rhenium-tungsten-molybdenum composite material SAXS small angle X-ray scattering SDD silicon drift detector SDS-PAGE sodium dodecyl sulphate polyacrylamide gel electrophoresis SEM scanning electron microscopy SEM/WDX scanning electron microscopy/wavelength-dispersive X-ray analysis SEM/EDX scanning electron microscopy/energy-dispersive X-ray analysis SIMS secondary ion mass spectrometry SHA shaping amplifier SMIF standard mechanical interface (plastic box used for wafers) SML synthetic multilayer S-PC sealed proportional counter SPC statistical process control SPE solid phase extraction SR synchrotron radiation SRXRF (SR-XRF) synchrotron radiation X-ray fluorescence SRXRFA synchrotron radiation X-ray fluorescence analysis SR-TXRF, (SRTXRF) synchrotron radiation total reflection X-ray fluorescence SRW software package for synchrotrons ‘SRW’ developed by ESRF STJ superconducting tunnel junction TIC theoretical influence coefficient TXRF total reflection X-ray fluorescence TXRFA total reflection X-ray fluorescence analysis TZM-anode Mo + W anode with admixtures of Ti and Zr VLS grating variable line spacing grating VPD vapour phase decomposition VPD-SR-TXRF vapour phase decomposition - synchrotron radiation - total reflection X-ray fluorescence WDXRF wavelength dispersive X-ray fluorescence WDS
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  • Spring '14
  • MichaelDudley

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