CTAL TTA 001 Defects are discovered through test analysis and design because 1

Ctal tta 001 defects are discovered through test

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CTAL-TTA-001 Defects are discovered through test analysis and design because… 1 credit [K2] A. the tasks involve extracting information from the test basis B. developers are involved in writing test cases C. the cost of fixing a defect will increase if found later on D. the author of the test basis will have made errors Answer: A QUESTION: 64 Part 7 "Test Process & Incident Management" The development manager asks you to identify suitable test coverage entry criteria for a component test. Which TWO of the following would you recommend as appropriate for entry criteria to a component testing phase? 2 credits [K3] 34
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CTAL-TTA-001 A. 100% statement coverage B. No critical outstanding defects C. Test log available D. Code review completed E. Static analysis shows no major violations Answer: D, E QUESTION: 65 Identify the most significant risk introduced by this approach to incident management. 3 credits [K4] A. Excel list may not be insynchronizationwith Word documents B. Low level of usability C. Spreadsheet/text files may not be complete D. Does not map to IEEE 1044 Answer: A 35
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  • Fall '20
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