Hartmann r struder l electron emission channeling

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Hartmann R, Str¨uder L, Electron emission channeling spectroscopy using X-ray CCD detectors, Nucl Instrum Meth A 512 (1,2), 378–385 (2003) 89. Lutz G, Br¨auninger H, Englhauser J, Hartmann R, Kang D, Kotthaus R, Kuster M, Serber W, Str¨uder L, An application of space technology to the terrestrial search for axions: the X-ray mirror telescope at CAST, Nucl Instrum Meth A 518 (1,2), 201–206 (2004) 90. Hagenbuck F, Backe H, Clawitter N, Euteneuer H, G¨orgen F, Holl P, Johann K, Kaiser K-H, Kemmer J, Kerschner T, Kettig O, Koch H, Kube G, Lauth W, Matt¨ay H, Sch¨utrumpf M, St¨otter R, Str¨uder L, Walcher T, Wilms A, von Zanthier C, Zemter M, Novel digital K-edge imaging system with transition radiation from an 855 MeV electron beam, IEEE–Trans Nucl Sci 48 (3), 843–848 (2001) 91. Spiller E, Soft X-ray Optics, SPIE press, Bellingham, USA (1994) 92. Yamamoto M, Namioka T, Layer-by-layer design method for soft-X-ray multi- layers Appl Opt 31 , 1622–1630 (1992) 93. Henke BL, Gullikson EM, Davis J, X-ray interactions: photoabsorption, scat- tering, transmission, and reflection at E = 50-30000 eV, Z = 1-92. Atomic Data and Nucl Data Tables 54 , 181–342 (1993) 94. 95. 96. Kato M, X-sen Bunko Bunseki (X-ray spectrochemical analysis), Uchida Rokakuho Publishing, Tokyo, 152 (1998) 97. Ohashi K, Iida A, Gohshi Y, Kishimoto S, Takahashi M, Synchrotron radiation X-ray fluorescence analysis with a crystal spectrometer Adv X-ray Anal 35 , 1027–1033 (1992) 98. Soller W, A new precision X-ray spectrometer Phys Rev 24 , 158–167 (1924) 99. DuMond JWM, Theory of the use of more than two successive X-ray crystal reflections to obtain increased resolving power Phys Rev 52 , 872–883 (1937) 100. Barraud J, Monochromateur-focalisateur donnant un faisceau d’ouverture no- table. C R Acad Sci Paris 214 , 795–797 (1942); de Wolff PM, An adjustable curved crystal monochromator for X-ray diffraction analysis Appl Sci Res B1 , 119–126 (1950) 101. Johansson T, Selektive Fokussierung der R¨oentgenstrahlen Naturwiss 20 , 758– 759 (1932) 102. Johann HH, Die Erzeugung lichtstarker R¨oentgenspektren mit Hilfe von Konkavkristallen Z Phys 69 , 185–206 (1931) 103. Gohshi Y, Kamada H, Kohra K, Utaka T, Arai T, Wide range two-crystal vacuum X-ray spectrometer for chemical state analysis Appl Spectroscopy 36 , 171–174 (1982)
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308 References 104. Gohshi Y, Hirao O, Suzuki I, Chemical state analysis of sulfur, chromium and tin by high resolution X-ray spectrometry Adv X-ray Anal 18 , 406–414 (1975) 105. Yamashita M, Motoyama M, Fukushima S, Vlaicu AM, Nisawa A, Ozaki S, Ito Y, Shigeoka N, Ohashi K, X-ray emission spectrum analysis of CO in Li-ion battery using a high-resolution XRF Adv X-ray Chem Anal Japan 35 , (2004) [to be published] 106. Kohno H, Arai T, Araki Y, Wilson R, High accuracy analysis of BPSG thin films on silicon wafers by X-ray wafer analyzer Adv X-ray Anal 37 , 229–234 (1993) 107. Lee FS, Campbell WJ, Variation of X-ray spectral line position with ambient- temperature change: a source of error in X-ray spectrography Adv X-ray Anal 8 , 431–442 (1964) 108. CRC Handbook of chemistry and physics, 75th edition, CRC Press, Boca Raton, USA, 12-87–12-96 (1995) 109. International tables for X-ray crystallography, volume III, Kynoch press, Birm- ingham, 125–129 (1962) 110. Measured data taken at Rigaku Industrial Corp, Unpublished
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