Unit 16: Analysis of Repairable
System and Other Recurrence Data
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
11/16/2004
Unit 16 - Stat 567 - Ramn Len
1
Unit 20: Planning Accelerated
Life Tests
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
11/13/2004
Unit 20 - Stat 567 - Ramn Len
1
Unit 20 Objectives
Out
Unit 10: Planning Life Tests
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
11/2/2004
Unit 10 - Stat 567 - Ramn Len
1
Unit 10 Objectives
Explain the basi
Bayesian Modeling of
Accelerated Life Tests with
Random Effects
Ramn V. Len
Avery J. Ashby
Jayanth Thyagarajan
Joint Statistical Meeting
August 8, 2004
Toronto, Canada
Abstract
We show how to use Bayesian modeling to make inference on the basis of
data fr
Unit 19: Analyzing Accelerated
Life Test Data
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
10/23/2004
Unit 19 - Stat 567 - Ramn Len
1
Unit 19 Objectives
Unit 18: Accelerated Test Models
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
10/19/2004
Unit 18 - Stat 567 - Ramn Len
1
Review: Log Location-Scale Mode
Unit 17: Failure-Time
Regression Analysis
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
11/14/2010
Stat 567: Unit 17 - Ramn Len
1
Unit 17 Objectives
Des
Unit 14: Introduction to the Use of
Bayesian Methods for Reliability
Data
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
9/26/2004
Stat 567: Unit 14 - Ram
Unit 9: Bootstrap Confidence
Intervals
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
9/22/2004
Unit 9 - Stat 567 - Ramn Len
1
Unit 9 Objectives
Explain
Unit 8: Maximum Likelihood for
Location-Scale Distributions
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
9/24/2004
Stat 567: Unit 8 - Ramn V. Len
1
Unit
Unit 7: Parametric Likelihood Fitting
Concepts: Exponential Distribution
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
9/14/2004
Stat 567: Unit 7 - Ramn
Unit 6: Probability Plotting
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
9/12/2004
Stat 567: Unit 6 - Ramn V. Len
1
Unit 6 Objectives
Describe applicat
Unit 4: Location-Scale-Based
Parametric Distributions
Ramn V. Len
Notes largely based on
Statistical Methods for Reliability Data
by W.Q. Meeker and L. A. Escobar,
Wiley, 1998 and on their class notes.
8/31/2004
Stat 567: Unit 4 - Ramn V. Len
1
Unit 4 Obj
Unit 3: Nonparametric Estimation
Notes largely based on
Statistical Methods for Reliability Data by W.Q.
Meeker and L. A. Escobar, Wiley, 1998 and on their
class notes.
Ramn V. Len
9/3/2009
Stat 567: Unit 3 - Ramn V. Len
1
Unit 3 Objectives
Show the use o
Unit 2: Models, Censoring, and
Likelihood for Failure-Time Data
FailureNotes largely based on
Statistical Methods for Reliability Data by W.Q.
Meeker and L. A. Escobar, Wiley, 1998 and on their
class
class notes.
Ramn V. Len
8/21/2010
Stat 567: Unit 2 - R
Statistics 567
Analysis of Lifetime Data
Ramn V. Len
University of Tennessee, Knoxville
8/22/2005
Stat 567 - Ramn V. Len
1
Class Objectives
By the end of this class you will be able:
To use the main statistical methods designed for
extracting information