Solutions to HW 1 IEOR 130 Prof. Leachman 1. Line yield (LY) is the fraction of wafers started that become wafer outs from the wafer fabrication (wafer fab) factory. Die yield (DY) is the fraction of chips (dice) printed on wafers coming out of wafer
Solutions to HW 2 IEOR 130 Prof. Leachman 1. First, consider the case of on-time delivery in a single time period. Let D(i) denote the scheduled output quantity of product i. Let P(i) denote the actual output quantity of product i. The fraction of pr
Solutions to HW 4 IEOR 130 Prof. Leachman
1. Computing die yield DY according to Poisson, Murphy and Seeds yield models. Given a die area A and a defect density D per unit area, the models are as follows: Poisson Model: DY = exp { -AD } Murphy Model:
Changing questions to answersone problem at a time.TM
HW 4 Solutions Spring 2009
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< <
ta RUN ENTER
CAR = CAR +1
CAR>0
S>0
SERVE GREASE
td
FIN
S= R=RND, S+1 INCAR= 1+4*RND, STIME=(INCAR=1)(25+10*RND)+ ta= 1+2*RND
Homework #2 Solutions
Verbal Event Graphs 131 - Spring08
Problem 1
Ta Initialize Run Customer enters Any server idle? Start Service
Customers Waiting?
Ts
Customer Leaves
1. Three identical servers working on the same queue.
2. Two different kin
IEOR 131: Discrete Event Simulation
Fall 2012
Description: The primary objective is to introduce students to modern techniques for developing computer
simulations of stochastic discrete-event models and experimenting with such models to better design and