CODES FOR COMPUTER SYSTEMS
Test response compactors
Test Compression is a technique used to reduce the time and cost of testing integrated circuits.
An automatic test pattern generation (ATPG) tool generates a test for a fault,
Optimal Unidirectional Error Detecting/Correcting Codes
B.BOSE and D.K.PRADHAN
Goal presenting codes for correcting t symmetric errors and detecting any number
of unidirectional errors that are significantly more efficient then earlier codes.
IEEE TRANSACTIONS ON COMPUTERS, VOL.
C-31, NO. 6, JUNE 1982
 W. Hilberg, "Effects of failures on yield, integration, cost and reliability
of large scale semiconductor memories: A tutorial review," in Digital
Memory and Storage, W. E. Proebster, Ed.
prepared and Instructed by
Eng. Faculty, Bar-Ilan University
Speedup: How much faster a task will run on the
computer with an enhancement, compared to the
Amdahls Law: The performance improvement