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A manufacturer produces a batch of memory chips (RAM) and measures the mean-time-between failures (MTBF).

A manufacturer produces a batch of memory chips (RAM) and measures the mean-time-between failures (MTBF). the manufacturer then changes a manufacturing process and produces another batch and again measures the MTBF. did the change to the process improve the MTBF?
How do I determine if this is parametric or nonparametric?

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