#2. Suppose that 3 balls are chosen without replacement from an urn consisting of 5white and 8 red balls. Let Xi equal 1 if the ith ball selected is white, and let it equal 0 otherwise. Give the joint probability mass function of

(a) X1, X2; (b) X1, X2, X3.

#6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N1 the number of tests made until the first defective is identified and by N2 the number of additional tests until the second defective is identified; find the joint probability mass function of N1 and N2.

(see attachment)

#2. Suppose that 3 balls are chosen without replacement from an urn

consisting of 5white and 8 red balls. Let Xi equal 1 if the ith ball

selected is white, and let it equal 0 otherwise. Give the joint

probability mass function of

(a) X1, X2; (b)

X1, X2, X3.

#6. A bin of 5 transistors is known to contain 2 that are defective. The

transistors are to be tested, one at a time, until the defective ones

are identified. Denote by N1 the number of tests made until the first

defective is identified and by N2 the number of additional tests until

the second defective is identified; find the joint probability mass

function of N1 and N2.

(a) X1, X2; (b) X1, X2, X3.

#6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N1 the number of tests made until the first defective is identified and by N2 the number of additional tests until the second defective is identified; find the joint probability mass function of N1 and N2.

(see attachment)

#2. Suppose that 3 balls are chosen without replacement from an urn

consisting of 5white and 8 red balls. Let Xi equal 1 if the ith ball

selected is white, and let it equal 0 otherwise. Give the joint

probability mass function of

(a) X1, X2; (b)

X1, X2, X3.

#6. A bin of 5 transistors is known to contain 2 that are defective. The

transistors are to be tested, one at a time, until the defective ones

are identified. Denote by N1 the number of tests made until the first

defective is identified and by N2 the number of additional tests until

the second defective is identified; find the joint probability mass

function of N1 and N2.

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